{"id":"https://openalex.org/W2126110726","doi":"https://doi.org/10.1109/iscas.2000.857364","title":"A Zener-diode-activated ESD protection circuit for sub-micron CMOS processes","display_name":"A Zener-diode-activated ESD protection circuit for sub-micron CMOS processes","publication_year":2002,"publication_date":"2002-11-07","ids":{"openalex":"https://openalex.org/W2126110726","doi":"https://doi.org/10.1109/iscas.2000.857364","mag":"2126110726"},"language":"en","primary_location":{"id":"doi:10.1109/iscas.2000.857364","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2000.857364","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings (IEEE Cat No.00CH36353)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111925432","display_name":"L. Luh","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. Luh","raw_affiliation_strings":["University of Southern California, Los Angeles, CA, USA","[University of Southern California Los, Angeles, CA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Southern California, Los Angeles, CA, USA","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"[University of Southern California Los, Angeles, CA, USA]","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108417439","display_name":"J. Choma","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Choma","raw_affiliation_strings":["University of Southern California, Los Angeles, CA, USA","[University of Southern California Los, Angeles, CA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Southern California, Los Angeles, CA, USA","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"[University of Southern California Los, Angeles, CA, USA]","institution_ids":["https://openalex.org/I1174212"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110567690","display_name":"Jeffrey Draper","orcid":null},"institutions":[{"id":"https://openalex.org/I1174212","display_name":"University of Southern California","ror":"https://ror.org/03taz7m60","country_code":"US","type":"education","lineage":["https://openalex.org/I1174212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Draper","raw_affiliation_strings":["University of Southern California, Los Angeles, CA, USA","[University of Southern California Los, Angeles, CA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Southern California, Los Angeles, CA, USA","institution_ids":["https://openalex.org/I1174212"]},{"raw_affiliation_string":"[University of Southern California Los, Angeles, CA, USA]","institution_ids":["https://openalex.org/I1174212"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1174212"],"apc_list":null,"apc_paid":null,"fwci":0.355,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.55153977,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":"5","issue":null,"first_page":"65","last_page":"68"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/zener-diode","display_name":"Zener diode","score":0.9036445617675781},{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.7504075765609741},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6084797382354736},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5836259126663208},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.5114928483963013},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4907868802547455},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.47353431582450867},{"id":"https://openalex.org/keywords/clamper","display_name":"Clamper","score":0.451920747756958},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4249190092086792},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.42210423946380615},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3784368634223938},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.370363712310791},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.336905837059021}],"concepts":[{"id":"https://openalex.org/C50566616","wikidata":"https://www.wikidata.org/wiki/Q180586","display_name":"Zener diode","level":4,"score":0.9036445617675781},{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.7504075765609741},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6084797382354736},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5836259126663208},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.5114928483963013},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4907868802547455},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.47353431582450867},{"id":"https://openalex.org/C64881904","wikidata":"https://www.wikidata.org/wiki/Q825778","display_name":"Clamper","level":3,"score":0.451920747756958},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4249190092086792},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.42210423946380615},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3784368634223938},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.370363712310791},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.336905837059021}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iscas.2000.857364","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iscas.2000.857364","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2000 IEEE International Symposium on Circuits and Systems. Emerging Technologies for the 21st Century. Proceedings (IEEE Cat No.00CH36353)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8899999856948853,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2017705993","https://openalex.org/W2063234928","https://openalex.org/W2098851721","https://openalex.org/W2120215666","https://openalex.org/W2128717870","https://openalex.org/W2142946638","https://openalex.org/W2150381899","https://openalex.org/W2541545423","https://openalex.org/W6729079200"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2122613745","https://openalex.org/W3084598117","https://openalex.org/W2151082990","https://openalex.org/W1496466303","https://openalex.org/W2112301210","https://openalex.org/W2312150664","https://openalex.org/W2114894573","https://openalex.org/W2023733445","https://openalex.org/W2592558961"],"abstract_inverted_index":{"A":[0],"Zener-diode-activated":[1],"electrostatic":[2,35],"discharge":[3,33],"(ESD)":[4],"protection":[5,79],"circuit":[6,18,76],"is":[7],"implemented":[8],"in":[9,50],"a":[10,20,29,42,65],"0.5":[11],"/spl":[12],"mu/m":[13],"CMOS":[14],"process.":[15],"This":[16],"ESD":[17,67,78,83],"uses":[19],"substrate":[21],"p-n-p":[22],"transistor":[23],"with":[24],"its":[25],"base":[26],"connected":[27],"to":[28,32,46],"Zener":[30,38],"diode":[31,39],"the":[34,51,60],"energy.":[36],"The":[37],"implementation":[40],"utilizes":[41],"silicide":[43],"block":[44],"capability":[45],"avoid":[47],"short":[48],"circuits":[49],"active":[52],"area.":[53],"Its":[54,69],"performance":[55],"has":[56],"been":[57],"tested":[58],"by":[59],"human":[61],"body":[62],"model":[63],"and":[64,91],"high-speed":[66],"test.":[68],"latchup-free":[70],"characteristic":[71],"makes":[72],"it":[73],"an":[74],"ideal":[75],"for":[77],"of":[80],"I/O":[81],"pads,":[82],"clamping":[84],"between":[85],"power":[86],"rails,":[87],"poly-antenna":[88],"effect":[89],"protection,":[90],"overshoot":[92],"attenuation.":[93]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}