{"id":"https://openalex.org/W2096468355","doi":"https://doi.org/10.1109/isbi.2002.1029211","title":"Contrast improvement with Diffraction Enhanced Imaging for scattering materials","display_name":"Contrast improvement with Diffraction Enhanced Imaging for scattering materials","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2096468355","doi":"https://doi.org/10.1109/isbi.2002.1029211","mag":"2096468355"},"language":"en","primary_location":{"id":"doi:10.1109/isbi.2002.1029211","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isbi.2002.1029211","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings IEEE International Symposium on Biomedical Imaging","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066727425","display_name":"F. Arfelli","orcid":"https://orcid.org/0000-0001-9687-7859"},"institutions":[{"id":"https://openalex.org/I142444530","display_name":"University of Trieste","ror":"https://ror.org/02n742c10","country_code":"IT","type":"education","lineage":["https://openalex.org/I142444530"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"F. Arfelli","raw_affiliation_strings":["Department of Physics, University of Trieste, Italy","Dept. of Phys., Trieste Univ., Italy"],"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Trieste, Italy","institution_ids":["https://openalex.org/I142444530"]},{"raw_affiliation_string":"Dept. of Phys., Trieste Univ., Italy","institution_ids":["https://openalex.org/I142444530"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050248827","display_name":"R.H. Menk","orcid":"https://orcid.org/0000-0003-2676-8336"},"institutions":[{"id":"https://openalex.org/I2802561039","display_name":"Elettra-Sincrotrone Trieste S.C.p.A.","ror":"https://ror.org/01c3rrh15","country_code":"IT","type":"facility","lineage":["https://openalex.org/I2801626668","https://openalex.org/I2802561039"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"R.H. Menk","raw_affiliation_strings":["Sincrotrone Trieste S.p.A., Italy","[Sincrotrone Trieste S.p.A., Italy]"],"affiliations":[{"raw_affiliation_string":"Sincrotrone Trieste S.p.A., Italy","institution_ids":["https://openalex.org/I2802561039"]},{"raw_affiliation_string":"[Sincrotrone Trieste S.p.A., Italy]","institution_ids":["https://openalex.org/I2802561039"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109997621","display_name":"H.J. Besch","orcid":null},"institutions":[{"id":"https://openalex.org/I206895457","display_name":"University of Siegen","ror":"https://ror.org/02azyry73","country_code":"DE","type":"education","lineage":["https://openalex.org/I206895457"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H.J. Besch","raw_affiliation_strings":["Department of Physics, University of Siegen, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Siegen, Germany","institution_ids":["https://openalex.org/I206895457"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024181605","display_name":"Luigi Rigon","orcid":"https://orcid.org/0000-0001-5051-1851"},"institutions":[{"id":"https://openalex.org/I142444530","display_name":"University of Trieste","ror":"https://ror.org/02n742c10","country_code":"IT","type":"education","lineage":["https://openalex.org/I142444530"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Rigon","raw_affiliation_strings":["Department of Physics, University of Trieste, Italy","[Department of Physics, University of Trieste, Italy]"],"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Trieste, Italy","institution_ids":["https://openalex.org/I142444530"]},{"raw_affiliation_string":"[Department of Physics, University of Trieste, Italy]","institution_ids":["https://openalex.org/I142444530"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109197857","display_name":"H. Plothow-Besch","orcid":null},"institutions":[{"id":"https://openalex.org/I206895457","display_name":"University of Siegen","ror":"https://ror.org/02azyry73","country_code":"DE","type":"education","lineage":["https://openalex.org/I206895457"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"H. Plothow-Besch","raw_affiliation_strings":["Department of Physics, University of Siegen, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Physics, University of Siegen, Germany","institution_ids":["https://openalex.org/I206895457"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5066727425"],"corresponding_institution_ids":["https://openalex.org/I142444530"],"apc_list":null,"apc_paid":null,"fwci":0.3786,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.68272927,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"133","last_page":"136"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11183","display_name":"Advanced X-ray Imaging Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3108","display_name":"Radiation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12386","display_name":"Advanced X-ray and CT Imaging","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12762","display_name":"Crystallography and Radiation Phenomena","score":0.995199978351593,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.7967990636825562},{"id":"https://openalex.org/keywords/phase-contrast-imaging","display_name":"Phase-contrast imaging","score":0.6196585297584534},{"id":"https://openalex.org/keywords/synchrotron-radiation","display_name":"Synchrotron radiation","score":0.6176959276199341},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5860180854797363},{"id":"https://openalex.org/keywords/diffraction","display_name":"Diffraction","score":0.5716885924339294},{"id":"https://openalex.org/keywords/refraction","display_name":"Refraction","score":0.537594735622406},{"id":"https://openalex.org/keywords/contrast","display_name":"Contrast (vision)","score":0.5357102155685425},{"id":"https://openalex.org/keywords/spectrum-analyzer","display_name":"Spectrum analyzer","score":0.5350306034088135},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.5054411888122559},{"id":"https://openalex.org/keywords/medical-imaging","display_name":"Medical imaging","score":0.4981386661529541},{"id":"https://openalex.org/keywords/refractive-index","display_name":"Refractive index","score":0.45903658866882324},{"id":"https://openalex.org/keywords/beamline","display_name":"Beamline","score":0.4460330605506897},{"id":"https://openalex.org/keywords/collimated-light","display_name":"Collimated light","score":0.4415558874607086},{"id":"https://openalex.org/keywords/visibility","display_name":"Visibility","score":0.42182835936546326},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2936924397945404},{"id":"https://openalex.org/keywords/phase-contrast-microscopy","display_name":"Phase contrast microscopy","score":0.22140362858772278},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2132459282875061},{"id":"https://openalex.org/keywords/beam","display_name":"Beam (structure)","score":0.1287108063697815},{"id":"https://openalex.org/keywords/laser","display_name":"Laser","score":0.12354922294616699},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07916232943534851}],"concepts":[{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.7967990636825562},{"id":"https://openalex.org/C58640550","wikidata":"https://www.wikidata.org/wiki/Q7180908","display_name":"Phase-contrast imaging","level":3,"score":0.6196585297584534},{"id":"https://openalex.org/C16332341","wikidata":"https://www.wikidata.org/wiki/Q212871","display_name":"Synchrotron radiation","level":2,"score":0.6176959276199341},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5860180854797363},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.5716885924339294},{"id":"https://openalex.org/C205318122","wikidata":"https://www.wikidata.org/wiki/Q72277","display_name":"Refraction","level":2,"score":0.537594735622406},{"id":"https://openalex.org/C2776502983","wikidata":"https://www.wikidata.org/wiki/Q690182","display_name":"Contrast (vision)","level":2,"score":0.5357102155685425},{"id":"https://openalex.org/C158007255","wikidata":"https://www.wikidata.org/wiki/Q1055222","display_name":"Spectrum analyzer","level":2,"score":0.5350306034088135},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.5054411888122559},{"id":"https://openalex.org/C31601959","wikidata":"https://www.wikidata.org/wiki/Q931309","display_name":"Medical imaging","level":2,"score":0.4981386661529541},{"id":"https://openalex.org/C42067758","wikidata":"https://www.wikidata.org/wiki/Q174102","display_name":"Refractive index","level":2,"score":0.45903658866882324},{"id":"https://openalex.org/C136959337","wikidata":"https://www.wikidata.org/wiki/Q3300772","display_name":"Beamline","level":3,"score":0.4460330605506897},{"id":"https://openalex.org/C34445779","wikidata":"https://www.wikidata.org/wiki/Q1571347","display_name":"Collimated light","level":3,"score":0.4415558874607086},{"id":"https://openalex.org/C123403432","wikidata":"https://www.wikidata.org/wiki/Q654068","display_name":"Visibility","level":2,"score":0.42182835936546326},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2936924397945404},{"id":"https://openalex.org/C151193507","wikidata":"https://www.wikidata.org/wiki/Q898815","display_name":"Phase contrast microscopy","level":2,"score":0.22140362858772278},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2132459282875061},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.1287108063697815},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.12354922294616699},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07916232943534851}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/isbi.2002.1029211","is_oa":false,"landing_page_url":"https://doi.org/10.1109/isbi.2002.1029211","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings IEEE International Symposium on Biomedical Imaging","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1969593383","https://openalex.org/W1989466790","https://openalex.org/W2039387997","https://openalex.org/W2048284433","https://openalex.org/W2049224600","https://openalex.org/W2053331261","https://openalex.org/W2100515332","https://openalex.org/W2151853055"],"related_works":["https://openalex.org/W2151870896","https://openalex.org/W1988897595","https://openalex.org/W2042382484","https://openalex.org/W2036859123","https://openalex.org/W2059694290","https://openalex.org/W2466206048","https://openalex.org/W2529671056","https://openalex.org/W1509006334","https://openalex.org/W1972308728","https://openalex.org/W2016057864"],"abstract_inverted_index":{"Diffraction":[0],"Enhanced":[1],"Imaging":[2],"is":[3,44,51,79],"a":[4,16,41,66,69,107,111],"phase":[5],"sensitive":[6],"imaging":[7,31,84],"modality,":[8],"which":[9],"recently":[10],"has":[11],"been":[12],"demonstrated":[13],"to":[14,34,56,97,104,122,151],"be":[15],"powerful":[17],"tool":[18],"for":[19],"improving":[20],"the":[21,32,72,76,82,87,99,130,137,140,152],"visibility":[22],"of":[23,45,71,75,86,101,114,126,139],"tiny":[24],"low":[25],"absorbing":[26],"structures.":[27],"Especially":[28],"in":[29,40,133,149],"medical":[30,83],"capability":[33],"detect":[35],"small":[36,115],"details,":[37],"not":[38,117],"visible":[39],"conventional":[42,153],"radiograph":[43],"relevant":[46],"importance.":[47],"An":[48],"analyzer":[49,131],"crystal":[50,132],"used":[52],"as":[53],"angular":[54,135],"filter":[55],"select":[57],"or":[58],"reject":[59],"X-rays":[60],"that":[61],"are":[62],"deviated":[63],"when":[64],"traversing":[65],"sample":[67],"if":[68],"gradient":[70],"real":[73],"part":[74],"refractive":[77],"index":[78],"encountered.":[80],"At":[81],"beamline":[85],"synchrotron":[88],"radiation":[89],"facility":[90],"Elettra":[91],"(Trieste)":[92],"experiments":[93],"were":[94],"carried":[95],"out":[96],"assess":[98],"applicability":[100],"this":[102],"technique":[103],"materials":[105],"where":[106],"combined":[108],"refraction":[109],"from":[110],"large":[112],"amount":[113],"structures,":[116],"detectable":[118],"separately,":[119],"gives":[120],"rise":[121],"an":[123],"overall":[124],"effect":[125],"multiple":[127],"scattering.":[128],"Tuning":[129],"different":[134],"positions":[136],"variation":[138],"contrast":[141,145],"was":[142,147],"studied.":[143],"Strong":[144],"enhancement":[146],"measured":[148],"comparison":[150],"absorption":[154],"image.":[155]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}