{"id":"https://openalex.org/W4318002247","doi":"https://doi.org/10.1109/is57118.2022.10019667","title":"Automatic characterization of MEMS electronic filters","display_name":"Automatic characterization of MEMS electronic filters","publication_year":2022,"publication_date":"2022-10-12","ids":{"openalex":"https://openalex.org/W4318002247","doi":"https://doi.org/10.1109/is57118.2022.10019667"},"language":"en","primary_location":{"id":"doi:10.1109/is57118.2022.10019667","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/is57118.2022.10019667","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 11th International Conference on Intelligent Systems (IS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005436972","display_name":"Natalia Wasilewska","orcid":"https://orcid.org/0000-0001-8638-4735"},"institutions":[{"id":"https://openalex.org/I146400125","display_name":"Instytut Kolejnictwa","ror":"https://ror.org/02h8ckc21","country_code":"PL","type":"other","lineage":["https://openalex.org/I146400125"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Natalia Wasilewska","raw_affiliation_strings":["Laboratory of Metrology,Railway Research Institute,Warsaw,Poland","Railway Research Institute, Laboratory of Metrology, Warsaw, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Metrology,Railway Research Institute,Warsaw,Poland","institution_ids":["https://openalex.org/I146400125"]},{"raw_affiliation_string":"Railway Research Institute, Laboratory of Metrology, Warsaw, Poland","institution_ids":["https://openalex.org/I146400125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011274414","display_name":"Micha\u0142 Nowicki","orcid":"https://orcid.org/0000-0003-2513-952X"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Michal Nowicki","raw_affiliation_strings":["Warsaw University of Technology,Institute of Metrology and Biomedical Engineering,Warsaw,Poland","Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, Warsaw, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Warsaw University of Technology,Institute of Metrology and Biomedical Engineering,Warsaw,Poland","institution_ids":["https://openalex.org/I108403487"]},{"raw_affiliation_string":"Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, Warsaw, Poland","institution_ids":["https://openalex.org/I108403487"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078429180","display_name":"Roman Szewczyk","orcid":"https://orcid.org/0000-0002-1214-1009"},"institutions":[{"id":"https://openalex.org/I4210159392","display_name":"\u0141ukasiewicz Research Network - Industrial Research Institute for Automation and Measurements","ror":"https://ror.org/04b9a1925","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210159392"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Roman Szewczyk","raw_affiliation_strings":["ŁUKASIEWICZ Research Network - Industrial Research Institute for Automation and Measurements PIAP,Warsaw,Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ŁUKASIEWICZ Research Network - Industrial Research Institute for Automation and Measurements PIAP,Warsaw,Poland","institution_ids":["https://openalex.org/I4210159392"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026462994","display_name":"Pawe\u0142 Nowak","orcid":"https://orcid.org/0000-0003-4156-5473"},"institutions":[{"id":"https://openalex.org/I108403487","display_name":"Warsaw University of Technology","ror":"https://ror.org/00y0xnp53","country_code":"PL","type":"education","lineage":["https://openalex.org/I108403487"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Pawel Nowak","raw_affiliation_strings":["Warsaw University of Technology,Institute of Metrology and Biomedical Engineering,Warsaw,Poland","Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, Warsaw, Poland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Warsaw University of Technology,Institute of Metrology and Biomedical Engineering,Warsaw,Poland","institution_ids":["https://openalex.org/I108403487"]},{"raw_affiliation_string":"Institute of Metrology and Biomedical Engineering, Warsaw University of Technology, Warsaw, Poland","institution_ids":["https://openalex.org/I108403487"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1426,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.5255281,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"10","issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.989799976348877,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14096","display_name":"Advancements in Materials Engineering","score":0.9642999768257141,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13312","display_name":"Mechanical and Thermal Properties Analysis","score":0.9179999828338623,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/correctness","display_name":"Correctness","score":0.7206384539604187},{"id":"https://openalex.org/keywords/microelectromechanical-systems","display_name":"Microelectromechanical systems","score":0.6768203973770142},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.6631410121917725},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5788141489028931},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.550062894821167},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5420466661453247},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.5269480347633362},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.5212574601173401},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.507457435131073},{"id":"https://openalex.org/keywords/observational-error","display_name":"Observational error","score":0.47156378626823425},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20810189843177795},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.1708213984966278},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.14109405875205994},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07468476891517639}],"concepts":[{"id":"https://openalex.org/C55439883","wikidata":"https://www.wikidata.org/wiki/Q360812","display_name":"Correctness","level":2,"score":0.7206384539604187},{"id":"https://openalex.org/C37977207","wikidata":"https://www.wikidata.org/wiki/Q175561","display_name":"Microelectromechanical systems","level":2,"score":0.6768203973770142},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.6631410121917725},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5788141489028931},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.550062894821167},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5420466661453247},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.5269480347633362},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.5212574601173401},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.507457435131073},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.47156378626823425},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20810189843177795},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.1708213984966278},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.14109405875205994},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07468476891517639},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/is57118.2022.10019667","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/is57118.2022.10019667","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE 11th International Conference on Intelligent Systems (IS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2053172747","https://openalex.org/W2342409237","https://openalex.org/W4238847598","https://openalex.org/W4249789100"],"related_works":["https://openalex.org/W2220451197","https://openalex.org/W2370122455","https://openalex.org/W3049121420","https://openalex.org/W1600397729","https://openalex.org/W2326770010","https://openalex.org/W2360832559","https://openalex.org/W4284698423","https://openalex.org/W1989588780","https://openalex.org/W2386418312","https://openalex.org/W3128781877"],"abstract_inverted_index":{"Experimental":[0],"electronic":[1],"MEMS":[2,101],"filters":[3],"require":[4,13],"testing":[5],"of":[6,16,33,48,62,73,78,95,98,108],"amplitude":[7],"and":[8,112],"phase":[9],"characteristics.":[10],"Reliable":[11],"measurements":[12],"the":[14,25,30,34,43,46,58,64,68,71,93,96,99,106,109],"development":[15],"a":[17],"measurement":[18,35,47,53,65,72],"method":[19],"that":[20],"will":[21],"not":[22],"only":[23],"measure":[24],"characteristics,":[26],"but":[27],"also":[28],"enable":[29],"simultaneous":[31],"estimation":[32],"uncertainty.":[36,66],"The":[37,88],"computer-controlled":[38],"measuring":[39],"system":[40,69],"described":[41],"in":[42,85,115],"article":[44],"enables":[45,70],"filter":[49,103],"characteristics":[50,74,97],"while":[51],"maintaining":[52],"coherence,":[54],"taking":[55],"into":[56],"account":[57],"fully":[59],"automated":[60],"process":[61],"estimating":[63],"Additionally,":[67],"at":[75],"different":[76],"levels":[77],"input":[79],"signals,":[80],"which":[81],"is":[82],"particularly":[83],"important":[84],"magnetomechanical":[86],"systems.":[87],"tests":[89],"carried":[90],"out":[91],"during":[92],"study":[94],"exemplary":[100],"magnetostrictive":[102],"confirmed":[104],"both":[105],"correctness":[107],"proposed":[110],"solution":[111],"its":[113],"applicability":[114],"practice.":[116]},"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}