{"id":"https://openalex.org/W4396949112","doi":"https://doi.org/10.1109/irps48228.2024.10529492","title":"Impact of Edge and Basal Plane Oxidation on the Stability of Oxygen Doped MoS<sub>2</sub>- RRAM","display_name":"Impact of Edge and Basal Plane Oxidation on the Stability of Oxygen Doped MoS<sub>2</sub>- RRAM","publication_year":2024,"publication_date":"2024-04-14","ids":{"openalex":"https://openalex.org/W4396949112","doi":"https://doi.org/10.1109/irps48228.2024.10529492"},"language":"en","primary_location":{"id":"doi:10.1109/irps48228.2024.10529492","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/irps48228.2024.10529492","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083230462","display_name":"Suman Gora","orcid":null},"institutions":[{"id":"https://openalex.org/I154851008","display_name":"Indian Institute of Technology Roorkee","ror":"https://ror.org/00582g326","country_code":"IN","type":"education","lineage":["https://openalex.org/I154851008"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Suman Gora","raw_affiliation_strings":["Indian Institute of Technology (IIT) Roorkee,Department of Electronics &#x0026; Communication Engineering,Roorkee,Uttarakhand,India,247667"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology (IIT) Roorkee,Department of Electronics &#x0026; Communication Engineering,Roorkee,Uttarakhand,India,247667","institution_ids":["https://openalex.org/I154851008"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031725646","display_name":"Jay Singh","orcid":"https://orcid.org/0000-0002-3793-0450"},"institutions":[{"id":"https://openalex.org/I154851008","display_name":"Indian Institute of Technology Roorkee","ror":"https://ror.org/00582g326","country_code":"IN","type":"education","lineage":["https://openalex.org/I154851008"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Jay Singh","raw_affiliation_strings":["Indian Institute of Technology (IIT) Roorkee,Department of Electronics &#x0026; Communication Engineering,Roorkee,Uttarakhand,India,247667"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology (IIT) Roorkee,Department of Electronics &#x0026; Communication Engineering,Roorkee,Uttarakhand,India,247667","institution_ids":["https://openalex.org/I154851008"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035853640","display_name":"Mandeep Jangra","orcid":"https://orcid.org/0000-0001-5834-7566"},"institutions":[{"id":"https://openalex.org/I154851008","display_name":"Indian Institute of Technology Roorkee","ror":"https://ror.org/00582g326","country_code":"IN","type":"education","lineage":["https://openalex.org/I154851008"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Mandeep Jangra","raw_affiliation_strings":["Indian Institute of Technology (IIT) Roorkee,Department of Electronics &#x0026; Communication Engineering,Roorkee,Uttarakhand,India,247667"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology (IIT) Roorkee,Department of Electronics &#x0026; Communication Engineering,Roorkee,Uttarakhand,India,247667","institution_ids":["https://openalex.org/I154851008"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060521608","display_name":"Arnab Datta","orcid":"https://orcid.org/0000-0002-2931-1991"},"institutions":[{"id":"https://openalex.org/I154851008","display_name":"Indian Institute of Technology Roorkee","ror":"https://ror.org/00582g326","country_code":"IN","type":"education","lineage":["https://openalex.org/I154851008"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Arnab Datta","raw_affiliation_strings":["Indian Institute of Technology (IIT) Roorkee,Department of Electronics &#x0026; Communication Engineering,Roorkee,Uttarakhand,India,247667"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology (IIT) Roorkee,Department of Electronics &#x0026; Communication Engineering,Roorkee,Uttarakhand,India,247667","institution_ids":["https://openalex.org/I154851008"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5083230462"],"corresponding_institution_ids":["https://openalex.org/I154851008"],"apc_list":null,"apc_paid":null,"fwci":0.4449,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.60562743,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"P5.EM","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10247","display_name":"Perovskite Materials and Applications","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/doping","display_name":"Doping","score":0.49738696217536926},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.41316497325897217},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.36782586574554443},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.3259992003440857},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.2770875096321106},{"id":"https://openalex.org/keywords/organic-chemistry","display_name":"Organic chemistry","score":0.16027536988258362},{"id":"https://openalex.org/keywords/physical-chemistry","display_name":"Physical chemistry","score":0.15956339240074158},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.15693575143814087},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.091043621301651}],"concepts":[{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.49738696217536926},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.41316497325897217},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.36782586574554443},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3259992003440857},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2770875096321106},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.16027536988258362},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.15956339240074158},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.15693575143814087},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.091043621301651}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48228.2024.10529492","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/irps48228.2024.10529492","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4744263885","display_name":null,"funder_award_id":"CRG/2020/004037","funder_id":"https://openalex.org/F4320334771","funder_display_name":"Science and Engineering Research Board"}],"funders":[{"id":"https://openalex.org/F4320334771","display_name":"Science and Engineering Research Board","ror":"https://ror.org/03ffdsr55"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1971906019","https://openalex.org/W1978566690","https://openalex.org/W1993916317","https://openalex.org/W2432524701","https://openalex.org/W2612018831","https://openalex.org/W2742847429","https://openalex.org/W2884743909","https://openalex.org/W2891562717","https://openalex.org/W3046343366","https://openalex.org/W3169681048","https://openalex.org/W4200213010","https://openalex.org/W4229371941","https://openalex.org/W6800730477"],"related_works":["https://openalex.org/W2545245183","https://openalex.org/W2054635671","https://openalex.org/W2017425642","https://openalex.org/W2350916061","https://openalex.org/W1970117475","https://openalex.org/W3161624601","https://openalex.org/W2611512961","https://openalex.org/W2078381924","https://openalex.org/W4206468571","https://openalex.org/W4381388454"],"abstract_inverted_index":{"Temporal":[0],"stability":[1],"of":[2,33,41,108,124],"Ru/MoS<inf":[3],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[4,14,21,37,43,74,93,111],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</inf>:O/Pt":[5],"resistive":[6],"random-access":[7],"memory":[8],"(RRAM)":[9],"due":[10],"to":[11,17,63,69,117,121],"oxygen":[12],"(O<inf":[13],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</inf>)":[15],"doping":[16],"its":[18,54,125],"Mos2storage":[19],"(MoS<inf":[20],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</inf>:":[22],"O)":[23],"is":[24],"investigated":[25],"here.":[26],"We":[27],"observed":[28],"that,":[29],"basal":[30],"plane":[31],"oxidation":[32],"sputter":[34],"deposited":[35],"MoS<inf":[36,73,110],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</inf>film":[38,112],"in":[39,91,105],"presence":[40],"O<inf":[42,92],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</inf>":[44,94],"substitutional":[45],"dopant":[46],"can":[47],"protect":[48],"RRAM":[49,70],"from":[50,81],"environmental":[51,118],"degradation,":[52],"although":[53],"resistance":[55],"margin":[56],"between":[57],"HRS":[58],"and":[59],"LRS":[60],"was":[61,115],"found":[62],"be":[64],"diminished":[65],"yet":[66],"stable":[67],"compared":[68],"having":[71],"undoped":[72,109],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</inf>film.":[75],"XPS":[76],"measured":[77],"Mo":[78],"3d":[79],"peaks":[80],"three":[82],"months":[83],"degraded":[84],"films":[85,96],"revealed":[86],"lesser":[87],"Mo+6(moo3)to":[88],"Mo+4(Mo-O)":[89],"ratio":[90],"doped":[95],"than":[97],"their":[98],"un-doped":[99],"counterpart,":[100],"which":[101],"substantiates":[102],"higher":[103],"Moo3formation":[104],"the":[106],"edges":[107],"as":[113],"it":[114],"subjected":[116],"exposure":[119],"leading":[120],"significant":[122],"degradation":[123],"monthly":[126],"retention.":[127]},"counts_by_year":[{"year":2024,"cited_by_count":2}],"updated_date":"2025-12-26T23:08:49.675405","created_date":"2025-10-10T00:00:00"}