{"id":"https://openalex.org/W4396949040","doi":"https://doi.org/10.1109/irps48228.2024.10529418","title":"Missing Trigger Circuit Action and Device Engineering for Conventional Nanoscale SCR","display_name":"Missing Trigger Circuit Action and Device Engineering for Conventional Nanoscale SCR","publication_year":2024,"publication_date":"2024-04-14","ids":{"openalex":"https://openalex.org/W4396949040","doi":"https://doi.org/10.1109/irps48228.2024.10529418"},"language":"en","primary_location":{"id":"doi:10.1109/irps48228.2024.10529418","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48228.2024.10529418","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042829591","display_name":"Mitesh Goyal","orcid":null},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Mitesh Goyal","raw_affiliation_strings":["Indian Institute of Science,Department of ESE,Bangalore,India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science,Department of ESE,Bangalore,India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043842356","display_name":"Mukesh Chaturvedi","orcid":null},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Mukesh Chaturvedi","raw_affiliation_strings":["Indian Institute of Science,Department of ESE,Bangalore,India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science,Department of ESE,Bangalore,India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066865002","display_name":"Raju Suresh Kumar","orcid":"https://orcid.org/0000-0003-3754-4223"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Raju Kumar","raw_affiliation_strings":["Indian Institute of Science,Department of ESE,Bangalore,India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science,Department of ESE,Bangalore,India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072977226","display_name":"Mahesh Vaidya","orcid":"https://orcid.org/0000-0001-9422-415X"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Mahesh Vaidya","raw_affiliation_strings":["Indian Institute of Science,Department of ESE,Bangalore,India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science,Department of ESE,Bangalore,India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031450949","display_name":"Mayank Shrivastava","orcid":"https://orcid.org/0000-0003-1005-040X"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Mayank Shrivastava","raw_affiliation_strings":["Indian Institute of Science,Department of ESE,Bangalore,India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science,Department of ESE,Bangalore,India","institution_ids":["https://openalex.org/I59270414"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5042829591"],"corresponding_institution_ids":["https://openalex.org/I59270414"],"apc_list":null,"apc_paid":null,"fwci":0.6209,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.66477465,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9876999855041504,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nanoscopic-scale","display_name":"Nanoscopic scale","score":0.6951276659965515},{"id":"https://openalex.org/keywords/action","display_name":"Action (physics)","score":0.4614144563674927},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.36696696281433105},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3384673595428467},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3332616090774536},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31027358770370483},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2258957028388977},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13386252522468567}],"concepts":[{"id":"https://openalex.org/C45206210","wikidata":"https://www.wikidata.org/wiki/Q2415817","display_name":"Nanoscopic scale","level":2,"score":0.6951276659965515},{"id":"https://openalex.org/C2780791683","wikidata":"https://www.wikidata.org/wiki/Q846785","display_name":"Action (physics)","level":2,"score":0.4614144563674927},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.36696696281433105},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3384673595428467},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3332616090774536},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31027358770370483},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2258957028388977},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13386252522468567},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps48228.2024.10529418","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48228.2024.10529418","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai::85291","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306402641","display_name":"LA Referencia (Red Federada de Repositorios Institucionales de Publicaciones Cient\u00edficas)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4383465926","host_organization_name":"LA Referencia","host_organization_lineage":["https://openalex.org/I4383465926"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Conference Paper"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6000000238418579}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1525247915","https://openalex.org/W1548365674","https://openalex.org/W2003795093","https://openalex.org/W2007850381","https://openalex.org/W2024042308","https://openalex.org/W2032664910","https://openalex.org/W2133795466","https://openalex.org/W2135190827","https://openalex.org/W2135978993","https://openalex.org/W2168133025","https://openalex.org/W2307652771","https://openalex.org/W2524892090","https://openalex.org/W2539267842","https://openalex.org/W2545398723","https://openalex.org/W2946778896","https://openalex.org/W4298033106","https://openalex.org/W4376606733"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W4402299999","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W2898370298","https://openalex.org/W2137437058","https://openalex.org/W4390401159","https://openalex.org/W2744391499","https://openalex.org/W2800070131","https://openalex.org/W4230250635"],"abstract_inverted_index":{"In":[0,51],"this":[1],"work":[2,68],"co-optimization":[3],"of":[4,58],"silicon-controlled":[5],"rectifier":[6],"(SCR)":[7],"ESD":[8],"characteristics":[9],"with":[10],"its":[11],"low":[12,43],"voltage":[13],"trigger":[14,44,49,60],"circuit":[15,79],"is":[16,38],"presented.":[17],"Resistance":[18],"and":[19,26,33,40,89],"Capacitance":[20],"(RC)":[21],"controlled":[22],"thick":[23],"gate":[24],"NMOS":[25],"PMOS":[27],"based":[28],"circuits":[29,61],"have":[30],"been":[31],"explored":[32,82],"compared.":[34],"The":[35,78],"design":[36],"approach":[37],"discussed":[39],"presented":[41],"for":[42,46],"SCR":[45],"two":[47],"different":[48],"circuits.":[50],"the":[52,59],"process":[53,88],"we":[54],"find":[55],"that":[56],"some":[57],"previously":[62],"reported":[63],"in":[64],"literature":[65],"do":[66],"not":[67],"as":[69],"desired":[70],"until":[71],"co-optimized":[72],"device":[73,90],"engineering":[74],"techniques":[75],"are":[76,81],"used.":[77],"insights":[80],"using":[83],"well":[84],"calibrated":[85],"electrothermal":[86],"3D":[87],"TCAD":[91],"mixed":[92],"mode":[93],"simulations.":[94]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}