{"id":"https://openalex.org/W4396949355","doi":"https://doi.org/10.1109/irps48228.2024.10529362","title":"New Insights into the Random Telegraph Noise (RTN) in FinFETs at Cryogenic Temperature","display_name":"New Insights into the Random Telegraph Noise (RTN) in FinFETs at Cryogenic Temperature","publication_year":2024,"publication_date":"2024-04-14","ids":{"openalex":"https://openalex.org/W4396949355","doi":"https://doi.org/10.1109/irps48228.2024.10529362"},"language":"en","primary_location":{"id":"doi:10.1109/irps48228.2024.10529362","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48228.2024.10529362","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100687840","display_name":"Zirui Wang","orcid":"https://orcid.org/0000-0001-8199-1931"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zirui Wang","raw_affiliation_strings":["School of Integrated Circuits, Peking University,Beijing,China","School of Integrated Circuits, Peking University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University,Beijing,China","institution_ids":["https://openalex.org/I20231570"]},{"raw_affiliation_string":"School of Integrated Circuits, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100324823","display_name":"Haoran Wang","orcid":"https://orcid.org/0000-0002-3626-2286"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haoran Wang","raw_affiliation_strings":["Fert Beijing Institute, School of Integrated Circuit Science and Engineering, Beihang University,MIIT Key Laboratory of Spintronics,Beijing,China,100191"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fert Beijing Institute, School of Integrated Circuit Science and Engineering, Beihang University,MIIT Key Laboratory of Spintronics,Beijing,China,100191","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100721975","display_name":"Yuxiao Wang","orcid":"https://orcid.org/0000-0002-6640-6076"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuxiao Wang","raw_affiliation_strings":["Fert Beijing Institute, School of Integrated Circuit Science and Engineering, Beihang University,MIIT Key Laboratory of Spintronics,Beijing,China,100191"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fert Beijing Institute, School of Integrated Circuit Science and Engineering, Beihang University,MIIT Key Laboratory of Spintronics,Beijing,China,100191","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022461285","display_name":"Zixuan Sun","orcid":"https://orcid.org/0000-0002-8257-5531"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zixuan Sun","raw_affiliation_strings":["School of Integrated Circuits, Peking University,Beijing,China","School of Integrated Circuits, Peking University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University,Beijing,China","institution_ids":["https://openalex.org/I20231570"]},{"raw_affiliation_string":"School of Integrated Circuits, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004861658","display_name":"Lang Zeng","orcid":"https://orcid.org/0000-0003-3157-1087"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lang Zeng","raw_affiliation_strings":["Fert Beijing Institute, School of Integrated Circuit Science and Engineering, Beihang University,MIIT Key Laboratory of Spintronics,Beijing,China,100191"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fert Beijing Institute, School of Integrated Circuit Science and Engineering, Beihang University,MIIT Key Laboratory of Spintronics,Beijing,China,100191","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002760019","display_name":"Runsheng Wang","orcid":"https://orcid.org/0000-0002-7514-0767"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]},{"id":"https://openalex.org/I4210165198","display_name":"Beijing Advanced Sciences and Innovation Center","ror":"https://ror.org/05qm21180","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Runsheng Wang","raw_affiliation_strings":["School of Integrated Circuits, Peking University,Beijing,China","Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China","School of Integrated Circuits, Peking University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University,Beijing,China","institution_ids":["https://openalex.org/I20231570"]},{"raw_affiliation_string":"Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China","institution_ids":["https://openalex.org/I4210165198"]},{"raw_affiliation_string":"School of Integrated Circuits, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108552326","display_name":"Ru Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]},{"id":"https://openalex.org/I4210165198","display_name":"Beijing Advanced Sciences and Innovation Center","ror":"https://ror.org/05qm21180","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ru Huang","raw_affiliation_strings":["School of Integrated Circuits, Peking University,Beijing,China","Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China","School of Integrated Circuits, Peking University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University,Beijing,China","institution_ids":["https://openalex.org/I20231570"]},{"raw_affiliation_string":"Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China","institution_ids":["https://openalex.org/I4210165198"]},{"raw_affiliation_string":"School of Integrated Circuits, Peking University, Beijing, China","institution_ids":["https://openalex.org/I20231570"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"6A.3","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6507558226585388},{"id":"https://openalex.org/keywords/trap","display_name":"Trap (plumbing)","score":0.6113112568855286},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4926777482032776},{"id":"https://openalex.org/keywords/cryogenics","display_name":"Cryogenics","score":0.4661508798599243},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.44633376598358154},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.41209524869918823},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3945613205432892},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3827996253967285},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.27304157614707947},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.2358614206314087},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16021326184272766},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.0996367335319519}],"concepts":[{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6507558226585388},{"id":"https://openalex.org/C121099081","wikidata":"https://www.wikidata.org/wiki/Q665580","display_name":"Trap (plumbing)","level":2,"score":0.6113112568855286},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4926777482032776},{"id":"https://openalex.org/C179725390","wikidata":"https://www.wikidata.org/wiki/Q192116","display_name":"Cryogenics","level":2,"score":0.4661508798599243},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.44633376598358154},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.41209524869918823},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3945613205432892},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3827996253967285},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.27304157614707947},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.2358614206314087},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16021326184272766},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0996367335319519},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48228.2024.10529362","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48228.2024.10529362","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5099999904632568,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G6847781164","display_name":null,"funder_award_id":"B18001","funder_id":"https://openalex.org/F4320327912","funder_display_name":"Higher Education Discipline Innovation Project"},{"id":"https://openalex.org/G8918310293","display_name":null,"funder_award_id":"T2293703,T2293700,62171009,62125401,61927901","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320327912","display_name":"Higher Education Discipline Innovation Project","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2134777311","https://openalex.org/W2996946661","https://openalex.org/W3003773751","https://openalex.org/W3208657846","https://openalex.org/W3210130470","https://openalex.org/W4225540121","https://openalex.org/W4247189428","https://openalex.org/W4317793303","https://openalex.org/W6634921147"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2199813689","https://openalex.org/W4252447916","https://openalex.org/W2369033613","https://openalex.org/W2511880725","https://openalex.org/W2390226751","https://openalex.org/W2904116937","https://openalex.org/W2592098988","https://openalex.org/W1849638103","https://openalex.org/W284217049"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"characterize":[4],"the":[5,17,61,65],"Random":[6],"Telegraph":[7],"Noise":[8],"(RTN)":[9],"in":[10],"FinFETs":[11],"at":[12,21,47,107],"cryogenic":[13,22,108],"temperature.":[14],"Owning":[15],"to":[16,51,94],"steep":[18],"subthreshold":[19],"swing":[20],"temperature,":[23],"RTN":[24],"caused":[25],"by":[26,44],"traps":[27,106],"near":[28],"Metal/HfO":[29],"<inf":[30],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[31,54],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</inf>":[32],"interface":[33,89],"interacting":[34],"with":[35,58],"gate":[36],"can":[37,67],"be":[38,68],"observed,":[39],"which":[40],"is":[41],"often":[42],"overwhelmed":[43],"background":[45],"noise":[46],"room":[48],"temperature":[49],"due":[50],"subtle":[52],"<tex":[53],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\mathbf{V}_{\\mathbf{th}}$</tex>":[55],"shift.":[56],"Combining":[57],"TCAD":[59],"analysis,":[60],"trap":[62,90,97],"location":[63],"around":[64],"fin":[66],"determined.":[69],"Furthermore,":[70],"full":[71],"quantum":[72],"vibrational":[73],"wave":[74],"functions":[75],"integral":[76],"calculations":[77],"and":[78,88],"surface":[79],"potential":[80],"based":[81],"compact":[82],"modeling":[83],"considering":[84],"band":[85],"tail":[86],"states":[87,91],"are":[92],"conducted":[93],"obtain":[95],"accurate":[96],"parameters.":[98],"The":[99],"results":[100],"reveal":[101],"a":[102],"remarkable":[103],"variety":[104],"of":[105],"temperatures.":[109]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}