{"id":"https://openalex.org/W4396980781","doi":"https://doi.org/10.1109/irps48228.2024.10529352","title":"Fundamental understanding of NBTI degradation mechanism in IGZO channel devices","display_name":"Fundamental understanding of NBTI degradation mechanism in IGZO channel devices","publication_year":2024,"publication_date":"2024-04-14","ids":{"openalex":"https://openalex.org/W4396980781","doi":"https://doi.org/10.1109/irps48228.2024.10529352"},"language":"en","primary_location":{"id":"doi:10.1109/irps48228.2024.10529352","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48228.2024.10529352","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059271916","display_name":"Ying Zhao","orcid":"https://orcid.org/0000-0002-7758-5655"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ying Zhao","raw_affiliation_strings":["KU,Leuven,Belgium","KU, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KU,Leuven,Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"KU, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065992397","display_name":"Pietro Rinaudo","orcid":"https://orcid.org/0000-0001-7676-1306"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Pietro Rinaudo","raw_affiliation_strings":["KU,Leuven,Belgium","KU, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KU,Leuven,Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"KU, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069528357","display_name":"Adrian Chasin","orcid":"https://orcid.org/0000-0002-9940-0260"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Adrian Chasin","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024954052","display_name":"B. Truijen","orcid":"https://orcid.org/0000-0002-2288-1414"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Brecht Truijen","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058263075","display_name":"B. Kaczer","orcid":"https://orcid.org/0000-0002-1484-4007"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ben Kaczer","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074709658","display_name":"Nouredine Rassoul","orcid":"https://orcid.org/0000-0001-9489-3396"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Nouredine Rassoul","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075407624","display_name":"Harold Dekkers","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Harold Dekkers","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055437400","display_name":"Attilio Belmonte","orcid":"https://orcid.org/0000-0002-3947-1948"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Attilio Belmonte","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073310038","display_name":"Ingrid De Wolf","orcid":"https://orcid.org/0000-0003-3822-5953"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ingrid De Wolf","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080181961","display_name":"Gouri Sankar Kar","orcid":"https://orcid.org/0000-0003-3122-4237"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Gouri Kar","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5076998157","display_name":"J. Franco","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jacopo Franco","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":16.5076,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.99634662,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":97,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.6333717107772827},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6184141039848328},{"id":"https://openalex.org/keywords/exponent","display_name":"Exponent","score":0.605109453201294},{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.5890015363693237},{"id":"https://openalex.org/keywords/activation-energy","display_name":"Activation energy","score":0.5839535593986511},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.5451199412345886},{"id":"https://openalex.org/keywords/relaxation","display_name":"Relaxation (psychology)","score":0.5329872965812683},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5209328532218933},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.5001142024993896},{"id":"https://openalex.org/keywords/gate-dielectric","display_name":"Gate dielectric","score":0.47314608097076416},{"id":"https://openalex.org/keywords/gate-oxide","display_name":"Gate oxide","score":0.4703388810157776},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4517856538295746},{"id":"https://openalex.org/keywords/doping","display_name":"Doping","score":0.4218895435333252},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4072912931442261},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38828182220458984},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3690859079360962},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.3652932643890381},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.24039426445960999},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.20632514357566833},{"id":"https://openalex.org/keywords/physical-chemistry","display_name":"Physical chemistry","score":0.11446136236190796},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07943084836006165}],"concepts":[{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.6333717107772827},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6184141039848328},{"id":"https://openalex.org/C2780388253","wikidata":"https://www.wikidata.org/wiki/Q5421508","display_name":"Exponent","level":2,"score":0.605109453201294},{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.5890015363693237},{"id":"https://openalex.org/C95121573","wikidata":"https://www.wikidata.org/wiki/Q190474","display_name":"Activation energy","level":2,"score":0.5839535593986511},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.5451199412345886},{"id":"https://openalex.org/C2776029896","wikidata":"https://www.wikidata.org/wiki/Q3935810","display_name":"Relaxation (psychology)","level":2,"score":0.5329872965812683},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5209328532218933},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.5001142024993896},{"id":"https://openalex.org/C166972891","wikidata":"https://www.wikidata.org/wiki/Q5527011","display_name":"Gate dielectric","level":4,"score":0.47314608097076416},{"id":"https://openalex.org/C2361726","wikidata":"https://www.wikidata.org/wiki/Q5527031","display_name":"Gate oxide","level":4,"score":0.4703388810157776},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4517856538295746},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.4218895435333252},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4072912931442261},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38828182220458984},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3690859079360962},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.3652932643890381},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.24039426445960999},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.20632514357566833},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.11446136236190796},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07943084836006165},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C77805123","wikidata":"https://www.wikidata.org/wiki/Q161272","display_name":"Social psychology","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48228.2024.10529352","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48228.2024.10529352","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7699999809265137,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1976396661","https://openalex.org/W1983529601","https://openalex.org/W2043362834","https://openalex.org/W2114540290","https://openalex.org/W2122520074","https://openalex.org/W2288350806","https://openalex.org/W2754059510","https://openalex.org/W2786998211","https://openalex.org/W3138864966","https://openalex.org/W4226094073","https://openalex.org/W4241254990","https://openalex.org/W4286571707","https://openalex.org/W4313240740","https://openalex.org/W4317792979","https://openalex.org/W4317793497","https://openalex.org/W4317793586","https://openalex.org/W4319430675","https://openalex.org/W6800934724"],"related_works":["https://openalex.org/W2944990515","https://openalex.org/W2942040471","https://openalex.org/W2028220610","https://openalex.org/W2573726612","https://openalex.org/W2088008649","https://openalex.org/W2166033074","https://openalex.org/W2036808971","https://openalex.org/W2571059022","https://openalex.org/W1968460025","https://openalex.org/W1927997555"],"abstract_inverted_index":{"Negative":[0],"bias":[1],"temperature":[2,60,135],"instability":[3],"(NBTI)":[4],"of":[5,36],"IGZO":[6,111,137],"thin":[7],"film":[8],"transistors":[9],"(TFTs)":[10],"with":[11,91],"different":[12],"channel":[13],"thicknesses(tIGZO)":[14],"and":[15,50,62,114],"gate":[16,38],"lengths":[17],"is":[18,80,121],"studied.":[19],"Four":[20],"main":[21],"NBTI":[22,77],"characteristics":[23],"are":[24],"observed:":[25],"(1)":[26],"the":[27,37,48,76,107,127],"threshold":[28],"voltage":[29,40,45],"shift":[30],"appears":[31],"to":[32,123,126],"be":[33,99,124],"almost":[34],"independent":[35],"stress":[39,44,132],"(above":[41],"a":[42,53,58,64,69,115],"given":[43],"determined":[46],"by":[47,101],"tIGZO),":[49],"shows":[51],"(2)":[52],"large":[54,70],"activation":[55],"energy":[56],"(i.e.,":[57,68],"strong":[59],"dependence)":[61],"(3)":[63],"steep":[65],"time":[66,72],"kinetics":[67],"power-law":[71],"exponent),":[73],"while":[74],"(4)":[75],"relaxation":[78],"rate":[79],"reduced":[81],"for":[82],"increasing":[83],"temperatures":[84],"below":[85],"200\u00b0C.":[86],"By":[87],"combining":[88],"TCAD":[89],"simulations":[90],"experimental":[92],"data":[93],"modelling,":[94],"these":[95],"peculiar":[96],"features":[97],"can":[98],"explained":[100],"an":[102],"oxide-field-driven":[103],"hydrogen":[104],"release":[105],"from":[106],"gate-dielectric,":[108],"inducing":[109],"additional":[110],"donor":[112],"doping":[113],"subsequent":[116],"negative$V_{\\text{th}}$shift.":[117],"The":[118],"latter":[119],"mechanism":[120],"observed":[122],"analogous":[125],"negative$V_{th}$shift":[128],"reported":[129],"during":[130],"PBTI":[131],"at":[133],"elevated":[134],"in":[136],"devices":[138],"[1].":[139]},"counts_by_year":[{"year":2026,"cited_by_count":8},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":4}],"updated_date":"2026-08-12T21:12:35.861297","created_date":"2025-10-10T00:00:00"}