{"id":"https://openalex.org/W4396949275","doi":"https://doi.org/10.1109/irps48228.2024.10529313","title":"Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm CMOS","display_name":"Measurement of Aging Effect on an Analog Computing-In-Memory Macro in 28nm CMOS","publication_year":2024,"publication_date":"2024-04-14","ids":{"openalex":"https://openalex.org/W4396949275","doi":"https://doi.org/10.1109/irps48228.2024.10529313"},"language":"en","primary_location":{"id":"doi:10.1109/irps48228.2024.10529313","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48228.2024.10529313","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020265951","display_name":"Wei\u2010Chun Wang","orcid":"https://orcid.org/0000-0003-1788-2727"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Wei-Chun Wang","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology,Atlanta,USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology,Atlanta,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103053826","display_name":"Shida Zhang","orcid":"https://orcid.org/0000-0003-4187-4428"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shida Zhang","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology,Atlanta,USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology,Atlanta,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024010303","display_name":"Sudarshan Sharma","orcid":"https://orcid.org/0009-0004-0949-4577"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sudarshan Sharma","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology,Atlanta,USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology,Atlanta,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101557260","display_name":"Minah Lee","orcid":"https://orcid.org/0000-0002-3800-802X"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Minah Lee","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology,Atlanta,USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology,Atlanta,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009591041","display_name":"Saibal Mukhopadhyay","orcid":"https://orcid.org/0000-0002-8894-3390"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saibal Mukhopadhyay","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology,Atlanta,USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology,Atlanta,USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5020265951"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":0.6674,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.67798341,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.8050440549850464},{"id":"https://openalex.org/keywords/macro","display_name":"Macro","score":0.6957865357398987},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6518229246139526},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.35558104515075684},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3518587350845337},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.34418272972106934},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3349069654941559},{"id":"https://openalex.org/keywords/arithmetic","display_name":"Arithmetic","score":0.33023005723953247},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17143800854682922},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.08170837163925171}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.8050440549850464},{"id":"https://openalex.org/C166955791","wikidata":"https://www.wikidata.org/wiki/Q629579","display_name":"Macro","level":2,"score":0.6957865357398987},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6518229246139526},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.35558104515075684},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3518587350845337},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.34418272972106934},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3349069654941559},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.33023005723953247},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17143800854682922},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.08170837163925171},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48228.2024.10529313","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48228.2024.10529313","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6700000166893005,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W3038803137","https://openalex.org/W4286571722","https://openalex.org/W4387411136","https://openalex.org/W4388674568","https://openalex.org/W4391992741","https://openalex.org/W4393217857"],"related_works":["https://openalex.org/W2030816003","https://openalex.org/W4239992647","https://openalex.org/W2150013480","https://openalex.org/W1554458299","https://openalex.org/W81423522","https://openalex.org/W1509860481","https://openalex.org/W2488264085","https://openalex.org/W2076325756","https://openalex.org/W4386206750","https://openalex.org/W4238700786"],"abstract_inverted_index":{"This":[0],"paper":[1],"characterizes":[2],"the":[3,29,39,60],"aging":[4,69],"effect":[5],"in":[6,28,38,45],"an":[7],"8T-SRAM-based":[8],"Analog":[9],"Computing-In-Memory":[10],"(ACIM)":[11],"circuit.":[12],"The":[13],"measurement":[14],"results":[15],"from":[16],"a":[17,54],"28nm":[18],"CMOS":[19],"test":[20],"chip":[21],"show":[22],"that":[23],"Hot":[24],"Carrier":[25],"Injection":[26],"(HCI)":[27],"2T":[30],"path":[31],"and":[32,47,62],"Negative":[33],"Bias":[34],"Temperature":[35],"Instability":[36],"(NBTI)":[37],"current":[40],"mirrors":[41],"increase":[42],"computation":[43],"errors":[44],"ACIM":[46],"reduce":[48],"its":[49],"power":[50],"efficiency.":[51],"In":[52],"addition,":[53],"lower":[55],"Hamming":[56],"Weight":[57],"(HW)":[58],"of":[59],"columns":[61],"higher":[63],"analog":[64],"input":[65],"lead":[66],"to":[67],"stronger":[68],"degradation.":[70]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2025-12-26T23:08:49.675405","created_date":"2025-10-10T00:00:00"}