{"id":"https://openalex.org/W4396949801","doi":"https://doi.org/10.1109/irps48228.2024.10529304","title":"Measurement of Aging Effect in a Digitally Controlled Inductive Voltage Regulator in 65nm","display_name":"Measurement of Aging Effect in a Digitally Controlled Inductive Voltage Regulator in 65nm","publication_year":2024,"publication_date":"2024-04-14","ids":{"openalex":"https://openalex.org/W4396949801","doi":"https://doi.org/10.1109/irps48228.2024.10529304"},"language":"en","primary_location":{"id":"doi:10.1109/irps48228.2024.10529304","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/irps48228.2024.10529304","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5103053826","display_name":"Shida Zhang","orcid":"https://orcid.org/0000-0003-4187-4428"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Shida Zhang","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology,Atlanta,USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology,Atlanta,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083457390","display_name":"Nael Mizanur Rahman","orcid":"https://orcid.org/0000-0002-3556-838X"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nael Mizanur Rahman","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology,Atlanta,USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology,Atlanta,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020265951","display_name":"Wei\u2010Chun Wang","orcid":"https://orcid.org/0000-0003-1788-2727"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wei-Chun Wang","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology,Atlanta,USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology,Atlanta,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093018933","display_name":"Narasimha Vasishta Kidambi","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Narasimha Vasishta Kidambi","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology,Atlanta,USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology,Atlanta,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112838079","display_name":"Carlos Tokunaga","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Carlos Tokunaga","raw_affiliation_strings":["Circuit Research Lab, Intel Corporation,Hillsboro,USA"],"affiliations":[{"raw_affiliation_string":"Circuit Research Lab, Intel Corporation,Hillsboro,USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009591041","display_name":"Saibal Mukhopadhyay","orcid":"https://orcid.org/0000-0002-8894-3390"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saibal Mukhopadhyay","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology,Atlanta,USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology,Atlanta,USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5103053826"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":0.222,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.48784818,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/regulator","display_name":"Regulator","score":0.7140093445777893},{"id":"https://openalex.org/keywords/voltage-regulator","display_name":"Voltage regulator","score":0.6894446611404419},{"id":"https://openalex.org/keywords/low-dropout-regulator","display_name":"Low-dropout regulator","score":0.6888700127601624},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.5449501276016235},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5262172222137451},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4034801125526428},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3622167408466339},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3208281993865967},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3084774315357208},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.08252274990081787}],"concepts":[{"id":"https://openalex.org/C6929976","wikidata":"https://www.wikidata.org/wiki/Q3771881","display_name":"Regulator","level":3,"score":0.7140093445777893},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.6894446611404419},{"id":"https://openalex.org/C140501009","wikidata":"https://www.wikidata.org/wiki/Q6692746","display_name":"Low-dropout regulator","level":5,"score":0.6888700127601624},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.5449501276016235},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5262172222137451},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4034801125526428},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3622167408466339},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3208281993865967},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3084774315357208},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.08252274990081787},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48228.2024.10529304","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/irps48228.2024.10529304","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6899999976158142}],"awards":[{"id":"https://openalex.org/G7663111001","display_name":null,"funder_award_id":"2810.064","funder_id":"https://openalex.org/F4320306087","funder_display_name":"Semiconductor Research Corporation"}],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2066698193","https://openalex.org/W2134869654","https://openalex.org/W2625793319","https://openalex.org/W3018614597","https://openalex.org/W3039211648","https://openalex.org/W6839578921"],"related_works":["https://openalex.org/W1982997428","https://openalex.org/W2044172536","https://openalex.org/W2371498377","https://openalex.org/W2991752277","https://openalex.org/W2476208285","https://openalex.org/W2371267182","https://openalex.org/W2083807160","https://openalex.org/W2736802678","https://openalex.org/W2380852726","https://openalex.org/W2549277932"],"abstract_inverted_index":{"This":[0],"paper":[1],"characterizes":[2],"the":[3,58,61],"aging":[4,40,49,59],"of":[5,44,60],"a":[6,30],"digitally":[7],"controlled":[8],"inductive":[9],"voltage":[10],"regulator":[11],"(IVR)":[12],"in":[13],"65nm":[14],"CMOS":[15],"due":[16],"to":[17,38],"Negative":[18],"Bias":[19],"Temperature":[20],"Instability":[21],"(NBTI)":[22],"and":[23,35,55,57],"Hot":[24],"Carrier":[25],"Injection":[26],"(HCI).":[27],"It":[28],"presents":[29],"framework":[31],"which":[32],"includes":[33],"stress":[34],"measurement":[36],"circuits":[37],"analyze":[39],"effects":[41],"on":[42],"components":[43],"IVR.":[45],"Measurements":[46],"show":[47],"that":[48],"degrades":[50],"transition":[51],"speed,":[52],"regulation":[53],"quality,":[54],"efficiency":[56],"feedback":[62],"loop":[63],"dominates":[64],"performance":[65],"degradation.":[66]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-12-22T23:10:17.713674","created_date":"2025-10-10T00:00:00"}