{"id":"https://openalex.org/W4225310534","doi":"https://doi.org/10.1109/irps48227.2022.9764588","title":"Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics","display_name":"Modelling ultra-fast threshold voltage instabilities in Hf-based ferroelectrics","publication_year":2022,"publication_date":"2022-03-01","ids":{"openalex":"https://openalex.org/W4225310534","doi":"https://doi.org/10.1109/irps48227.2022.9764588"},"language":"en","primary_location":{"id":"doi:10.1109/irps48227.2022.9764588","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764588","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082855147","display_name":"Barry O\u2019Sullivan","orcid":"https://orcid.org/0000-0002-9036-8241"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"B. J. O'Sullivan","raw_affiliation_strings":["Imec,Leuven,Belgium","Imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024954052","display_name":"B. Truijen","orcid":"https://orcid.org/0000-0002-2288-1414"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"B. Truijen","raw_affiliation_strings":["Imec,Leuven,Belgium","Imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040851808","display_name":"V. Putcha","orcid":"https://orcid.org/0000-0003-1907-5486"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"V. Putcha","raw_affiliation_strings":["Imec,Leuven,Belgium","Imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051359840","display_name":"Alexander Grill","orcid":"https://orcid.org/0000-0003-1615-1033"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"A. Grill","raw_affiliation_strings":["Imec,Leuven,Belgium","Imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040074138","display_name":"Adrian Chasin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"A Chasin","raw_affiliation_strings":["Imec,Leuven,Belgium","Imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035325463","display_name":"G. Van den bosch","orcid":"https://orcid.org/0000-0001-9971-6954"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"G. Van Den Bosch","raw_affiliation_strings":["Imec,Leuven,Belgium","Imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068508796","display_name":"Ben Kaczer","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"B. Kaczer","raw_affiliation_strings":["Imec,Leuven,Belgium","Imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088726830","display_name":"M. N. K. Alam","orcid":null},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"M. N. K. Alam","raw_affiliation_strings":["KU Leuven,Leuven,Belgium","KU Leuven, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"KU Leuven,Leuven,Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"KU Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102819274","display_name":"Jeroen Van Houdt","orcid":"https://orcid.org/0000-0003-4818-2328"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"J. Van Houdt","raw_affiliation_strings":["Imec,Leuven,Belgium","Imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.4781,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.88663566,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"449","issue":null,"first_page":"4A.4","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12046","display_name":"MXene and MAX Phase Materials","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ferroelectricity","display_name":"Ferroelectricity","score":0.7412068843841553},{"id":"https://openalex.org/keywords/atmospheric-temperature-range","display_name":"Atmospheric temperature range","score":0.5976700186729431},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.49735167622566223},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.4820293188095093},{"id":"https://openalex.org/keywords/arrhenius-equation","display_name":"Arrhenius equation","score":0.48132383823394775},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.46236470341682434},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4407252371311188},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4182093143463135},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.41794317960739136},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.393682062625885},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38979148864746094},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.17016541957855225},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15141913294792175},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.14093142747879028},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.12798291444778442},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.12119358777999878},{"id":"https://openalex.org/keywords/kinetics","display_name":"Kinetics","score":0.09711098670959473}],"concepts":[{"id":"https://openalex.org/C79090758","wikidata":"https://www.wikidata.org/wiki/Q1045739","display_name":"Ferroelectricity","level":3,"score":0.7412068843841553},{"id":"https://openalex.org/C39353612","wikidata":"https://www.wikidata.org/wiki/Q5283759","display_name":"Atmospheric temperature range","level":2,"score":0.5976700186729431},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.49735167622566223},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.4820293188095093},{"id":"https://openalex.org/C86183883","wikidata":"https://www.wikidata.org/wiki/Q507505","display_name":"Arrhenius equation","level":3,"score":0.48132383823394775},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.46236470341682434},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4407252371311188},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4182093143463135},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.41794317960739136},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.393682062625885},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38979148864746094},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.17016541957855225},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15141913294792175},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.14093142747879028},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.12798291444778442},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.12119358777999878},{"id":"https://openalex.org/C148898269","wikidata":"https://www.wikidata.org/wiki/Q1108792","display_name":"Kinetics","level":2,"score":0.09711098670959473},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps48227.2022.9764588","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764588","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:20.500.12942/720698","is_oa":false,"landing_page_url":"https://lirias.kuleuven.be/handle/20.500.12942/720698","pdf_url":null,"source":{"id":"https://openalex.org/S7407055369","display_name":"Lirias","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"IEEE International Reliability Physics Symposium (IRPS), TX, Dallas, 27-31 March 2022","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5899999737739563}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1987850127","https://openalex.org/W2003645630","https://openalex.org/W2039011822","https://openalex.org/W2086126257","https://openalex.org/W2110256278","https://openalex.org/W2129733471","https://openalex.org/W2482978312","https://openalex.org/W2800070060","https://openalex.org/W2884978068","https://openalex.org/W3038236592","https://openalex.org/W3089211191","https://openalex.org/W3100491686","https://openalex.org/W3138469564","https://openalex.org/W3138961625","https://openalex.org/W3139411171","https://openalex.org/W3204638218","https://openalex.org/W3210130470","https://openalex.org/W4225329321","https://openalex.org/W6672141146","https://openalex.org/W6783156655"],"related_works":["https://openalex.org/W2073434799","https://openalex.org/W1997518279","https://openalex.org/W2077114707","https://openalex.org/W2517426415","https://openalex.org/W2066425191","https://openalex.org/W2067590351","https://openalex.org/W1963945711","https://openalex.org/W1989682787","https://openalex.org/W2118387428","https://openalex.org/W2093922573"],"abstract_inverted_index":{"Temperature":[0],"dependence":[1],"of":[2,31,52],"charge":[3],"capture":[4,63],"and":[5,64,76],"emission":[6,65],"in":[7,68,83],"HfO2and":[8],"ferroelectric":[9,59,73],"doped":[10],"HfO2are":[11],"examined":[12],"over":[13],"a":[14],"wide":[15],"temperature":[16,57],"range.":[17],"Sizeable":[18],"threshold":[19],"voltage":[20],"(Vth)":[21],"instabilities":[22],"are":[23],"observed":[24,36],"under":[25],"cryogenic":[26],"conditions,":[27],"contrary":[28],"to":[29,46],"expectation":[30],"Arrhenius-based":[32],"defect":[33,42],"freeze-out.":[34],"The":[35,50],"data":[37],"is":[38,61],"modelled":[39],"with":[40],"ultra-fast":[41],"levels,":[43],"located":[44],"close":[45],"the":[47,69,79],"silicon":[48],"channel.":[49],"impact":[51],"these":[53],"traps":[54],"at":[55],"room":[56],"on":[58],"devices":[60],"significant:":[62],"times":[66],"lie":[67],"range":[70],"applied":[71],"for":[72],"device":[74],"operation,":[75],"can":[77],"explain":[78],"read-after-write":[80],"delay":[81],"incorporated":[82],"Si-based":[84],"ferro":[85],"(FE-)FET":[86],"operation.":[87]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}