{"id":"https://openalex.org/W4225318341","doi":"https://doi.org/10.1109/irps48227.2022.9764568","title":"On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors","display_name":"On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors","publication_year":2022,"publication_date":"2022-03-01","ids":{"openalex":"https://openalex.org/W4225318341","doi":"https://doi.org/10.1109/irps48227.2022.9764568"},"language":"en","primary_location":{"id":"doi:10.1109/irps48227.2022.9764568","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764568","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://lirias.kuleuven.be/handle/20.500.12942/719278","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028115879","display_name":"Stanislav Tyaginov","orcid":"https://orcid.org/0000-0002-5348-2096"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I95568926","display_name":"Ioffe Institute","ror":"https://ror.org/05dkdaa55","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I95568926"]}],"countries":["BE","RU"],"is_corresponding":false,"raw_author_name":"Stanislav Tyaginov","raw_affiliation_strings":["imec,Leuven,Belgium,3001","Russian Academy of Sciences, A.F. Ioffe Physical-Technical Institute, Saint-Petersburg, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Russian Academy of Sciences, A.F. Ioffe Physical-Technical Institute, Saint-Petersburg, Russia","institution_ids":["https://openalex.org/I95568926"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043132234","display_name":"Aryan Afzalian","orcid":"https://orcid.org/0000-0002-5260-0281"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Aryan Afzalian","raw_affiliation_strings":["imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102991736","display_name":"Alexander Makarov","orcid":"https://orcid.org/0000-0002-9927-6511"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Alexander Makarov","raw_affiliation_strings":["imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051359840","display_name":"Alexander Grill","orcid":"https://orcid.org/0000-0003-1615-1033"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Alexander Grill","raw_affiliation_strings":["imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025571890","display_name":"Michiel Vandemaele","orcid":"https://orcid.org/0000-0003-0740-4115"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]},{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Michiel Vandemaele","raw_affiliation_strings":["MICAS,KU Leuven,Department of Electrical Engineering (ESAT),Leuven,Belgium,3000","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MICAS,KU Leuven,Department of Electrical Engineering (ESAT),Leuven,Belgium,3000","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019652137","display_name":"Maksim N. Cherenev","orcid":"https://orcid.org/0000-0002-5273-4925"},"institutions":[{"id":"https://openalex.org/I95568926","display_name":"Ioffe Institute","ror":"https://ror.org/05dkdaa55","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I95568926"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Maksim Cherenev","raw_affiliation_strings":["A.F. Ioffe Physical-Technical Institute,Russian Academy of Sciences,Saint-Petersburg,Russia,194021"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"A.F. Ioffe Physical-Technical Institute,Russian Academy of Sciences,Saint-Petersburg,Russia,194021","institution_ids":["https://openalex.org/I95568926"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008733416","display_name":"M. I. Vexler","orcid":"https://orcid.org/0000-0002-9966-520X"},"institutions":[{"id":"https://openalex.org/I95568926","display_name":"Ioffe Institute","ror":"https://ror.org/05dkdaa55","country_code":"RU","type":"facility","lineage":["https://openalex.org/I1313323035","https://openalex.org/I4210096333","https://openalex.org/I95568926"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Mikhail Vexler","raw_affiliation_strings":["A.F. Ioffe Physical-Technical Institute,Russian Academy of Sciences,Saint-Petersburg,Russia,194021"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"A.F. Ioffe Physical-Technical Institute,Russian Academy of Sciences,Saint-Petersburg,Russia,194021","institution_ids":["https://openalex.org/I95568926"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064166800","display_name":"Geert Hellings","orcid":"https://orcid.org/0000-0002-5376-2119"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Geert Hellings","raw_affiliation_strings":["imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068508796","display_name":"Ben Kaczer","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ben Kaczer","raw_affiliation_strings":["imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.6379,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.52982078,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"100","issue":null,"first_page":"11A.2","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6206797361373901},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.49877119064331055},{"id":"https://openalex.org/keywords/doping","display_name":"Doping","score":0.49676328897476196},{"id":"https://openalex.org/keywords/field-effect-transistor","display_name":"Field-effect transistor","score":0.49617013335227966},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.45817989110946655},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.43743717670440674},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36582475900650024},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3393694758415222},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.33519741892814636},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3044256269931793},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2869425117969513},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.23938319087028503},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1259480118751526}],"concepts":[{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6206797361373901},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.49877119064331055},{"id":"https://openalex.org/C57863236","wikidata":"https://www.wikidata.org/wiki/Q1130571","display_name":"Doping","level":2,"score":0.49676328897476196},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.49617013335227966},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.45817989110946655},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.43743717670440674},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36582475900650024},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3393694758415222},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.33519741892814636},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3044256269931793},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2869425117969513},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.23938319087028503},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1259480118751526},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps48227.2022.9764568","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764568","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:20.500.12942/719278","is_oa":true,"landing_page_url":"https://lirias.kuleuven.be/handle/20.500.12942/719278","pdf_url":null,"source":{"id":"https://openalex.org/S4306401954","display_name":"Lirias (KU Leuven)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I99464096","host_organization_name":"KU Leuven","host_organization_lineage":["https://openalex.org/I99464096"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE International Reliability Physics Symposium (IRPS), TX, Dallas, 27-31 March 2022","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":{"id":"pmh:oai:lirias2repo.kuleuven.be:20.500.12942/719278","is_oa":true,"landing_page_url":"https://lirias.kuleuven.be/handle/20.500.12942/719278","pdf_url":null,"source":{"id":"https://openalex.org/S4306401954","display_name":"Lirias (KU Leuven)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I99464096","host_organization_name":"KU Leuven","host_organization_lineage":["https://openalex.org/I99464096"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE International Reliability Physics Symposium (IRPS), TX, Dallas, 27-31 March 2022","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320327494","display_name":"Ministry of Science and Higher Education of the Russian Federation","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":52,"referenced_works":["https://openalex.org/W75795129","https://openalex.org/W1968565334","https://openalex.org/W1974384738","https://openalex.org/W1988760266","https://openalex.org/W1993299361","https://openalex.org/W1993317329","https://openalex.org/W1998465818","https://openalex.org/W1999169264","https://openalex.org/W2002346198","https://openalex.org/W2005494397","https://openalex.org/W2031618766","https://openalex.org/W2041148080","https://openalex.org/W2052508807","https://openalex.org/W2068172948","https://openalex.org/W2070171417","https://openalex.org/W2092997828","https://openalex.org/W2095601935","https://openalex.org/W2100766508","https://openalex.org/W2102352834","https://openalex.org/W2104728298","https://openalex.org/W2106480230","https://openalex.org/W2113863023","https://openalex.org/W2115418270","https://openalex.org/W2123927600","https://openalex.org/W2130916786","https://openalex.org/W2153865451","https://openalex.org/W2171581609","https://openalex.org/W2216662081","https://openalex.org/W2352236975","https://openalex.org/W2503794878","https://openalex.org/W2532378537","https://openalex.org/W2621373109","https://openalex.org/W2785433663","https://openalex.org/W2785613960","https://openalex.org/W2799677856","https://openalex.org/W2886373788","https://openalex.org/W2894824026","https://openalex.org/W2898241664","https://openalex.org/W2941465967","https://openalex.org/W2944771804","https://openalex.org/W2947575343","https://openalex.org/W2989387189","https://openalex.org/W3005893159","https://openalex.org/W3006106254","https://openalex.org/W3032174739","https://openalex.org/W3040079691","https://openalex.org/W3040682238","https://openalex.org/W3092779866","https://openalex.org/W3122263309","https://openalex.org/W4200523813","https://openalex.org/W6675726429","https://openalex.org/W6763430013"],"related_works":["https://openalex.org/W3014521742","https://openalex.org/W2617868873","https://openalex.org/W3204141294","https://openalex.org/W4386230336","https://openalex.org/W4306968100","https://openalex.org/W2171986175","https://openalex.org/W2072424359","https://openalex.org/W2061674058","https://openalex.org/W2750055590","https://openalex.org/W1990516236"],"abstract_inverted_index":{"We":[0],"simulate":[1],"relative":[2],"changes":[3],"of":[4,28,53,76,146],"the":[5,86,112,125,143,151,189,192],"saturation":[6],"drain":[7],"current":[8],"during":[9],"hot-carrier":[10,201],"degradation":[11],"(HCD)":[12],"in":[13,165,180],"dynamically-doped":[14],"(D":[15],"<inf":[16,78,90,106,127,161,167,194],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[17,79,91,107,128,162,168,195],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</inf>":[18,92,129,169,196],")":[19],"and":[20,31,65,170,185],"\"traditional\"":[21],"planar":[22],"complementary":[23],"metal-oxide-semiconductor":[24],"(CMOS)":[25],"field-effect-transistors":[26],"(FETs)":[27],"gate":[29,74],"lengths":[30],"doping":[32],"profiles.":[33],"To":[34],"achieve":[35],"this":[36],"goal,":[37],"we":[38,177],"use":[39],"our":[40],"physics-based":[41],"model":[42],"for":[43],"HCD":[44,139],"validated":[45],"against":[46],"experimental":[47],"data":[48],"from":[49],"a":[50],"broad":[51],"range":[52],"transistor":[54],"architectures":[55],"(which":[56],"include":[57],"but":[58],"are":[59],"not":[60],"limited":[61],"to":[62,99,116,182,188],"planar,":[63],"fin,":[64],"nanowire":[66],"FETs).":[67],"These":[68],"simulations":[69],"show":[70],"that":[71],"at":[72,104],"lower":[73],"voltages":[75],"V":[77,83,105,111,160],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">gs</inf>":[80,108,163],"\u2264":[81],"0.9":[82],"(i.e.":[84],"covering":[85],"operating":[87],"regime)":[88],"D":[89,126,166,193],"FETs":[93],"have":[94],"superior":[95,200],"HC":[96],"reliability":[97],"compared":[98,187],"their":[100],"CMOS":[101,113,171,190],"counterparts,":[102],"while":[103],">":[109],"1.0":[110],"FET":[114,197],"begins":[115],"be":[117],"more":[118],"reliable":[119],"(at":[120],"shorter":[121],"stress":[122,137],"times,":[123],"however,":[124],"device":[130],"is":[131,140],"still":[132],"superior).":[133],"Under":[134],"these":[135],"low":[136],"voltages,":[138],"governed":[141],"by":[142,150],"multiple-carrier":[144],"process":[145],"bond":[147],"dissociation":[148],"controlled":[149],"carrier":[152],"concentration":[153],"(rather":[154],"than":[155],"energy),":[156],"which":[157],"has":[158,198],"different":[159],"dependences":[164],"FETs.":[172],"Based":[173],"on":[174],"conducted":[175],"calculations,":[176],"suggest":[178],"that,":[179],"addition":[181],"better":[183],"performance":[184],"scalability":[186],"counterpart,":[191],"also":[199],"reliability.":[202]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}