{"id":"https://openalex.org/W4225303553","doi":"https://doi.org/10.1109/irps48227.2022.9764547","title":"Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery","display_name":"Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery","publication_year":2022,"publication_date":"2022-03-01","ids":{"openalex":"https://openalex.org/W4225303553","doi":"https://doi.org/10.1109/irps48227.2022.9764547"},"language":"en","primary_location":{"id":"doi:10.1109/irps48227.2022.9764547","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764547","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016436621","display_name":"Jo\u00e3o P. A. Bastos","orcid":"https://orcid.org/0000-0002-8877-9850"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"J. P. Bastos","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082855147","display_name":"Barry O\u2019Sullivan","orcid":"https://orcid.org/0000-0002-9036-8241"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"B. J. O'Sullivan","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068577719","display_name":"J. Franco","orcid":"https://orcid.org/0000-0002-7382-8605"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"J. Franco","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028115879","display_name":"Stanislav Tyaginov","orcid":"https://orcid.org/0000-0002-5348-2096"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"S. Tyaginov","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024954052","display_name":"B. Truijen","orcid":"https://orcid.org/0000-0002-2288-1414"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"B. Truijen","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069528357","display_name":"Adrian Chasin","orcid":"https://orcid.org/0000-0002-9940-0260"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"A. Chasin","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061087611","display_name":"R. Degraeve","orcid":"https://orcid.org/0000-0002-4609-5573"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"R. Degraeve","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068508796","display_name":"Ben Kaczer","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"B. Kaczer","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090570441","display_name":"R. Ritzenthaler","orcid":"https://orcid.org/0000-0002-8615-3272"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"R. Ritzenthaler","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044005800","display_name":"E. Capogreco","orcid":"https://orcid.org/0000-0003-3610-3629"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"E. Capogreco","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039544876","display_name":"E. Dentoni Litta","orcid":"https://orcid.org/0000-0003-0333-376X"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"E. D. Litta","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019510660","display_name":"A. Spessot","orcid":"https://orcid.org/0000-0003-2381-0121"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"A. Spessot","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045911784","display_name":"Y. Higashi","orcid":null},"institutions":[{"id":"https://openalex.org/I196972281","display_name":"Imec the Netherlands","ror":"https://ror.org/01ezq2j76","country_code":"NL","type":"facility","lineage":["https://openalex.org/I196972281"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Y. Higashi","raw_affiliation_strings":["Assignees at imec for Kioxia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Assignees at imec for Kioxia","institution_ids":["https://openalex.org/I196972281"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041249504","display_name":"Y. Yoon","orcid":null},"institutions":[{"id":"https://openalex.org/I4210112278","display_name":"SK Group (Japan)","ror":"https://ror.org/02axkyn34","country_code":"JP","type":"company","lineage":["https://openalex.org/I134353371","https://openalex.org/I4210112278"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Y. Yoon","raw_affiliation_strings":["Assignees at imec for SK Hynix"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Assignees at imec for SK Hynix","institution_ids":["https://openalex.org/I4210112278"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000659788","display_name":"Vladimir Machkaoutsan","orcid":null},"institutions":[{"id":"https://openalex.org/I11912373","display_name":"Micron (United States)","ror":"https://ror.org/02fv52296","country_code":"US","type":"company","lineage":["https://openalex.org/I11912373"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. Machkaoutsan","raw_affiliation_strings":["Assignees at imec for Micron"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Assignees at imec for Micron","institution_ids":["https://openalex.org/I11912373"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113576343","display_name":"P. Fazan","orcid":null},"institutions":[{"id":"https://openalex.org/I11912373","display_name":"Micron (United States)","ror":"https://ror.org/02fv52296","country_code":"US","type":"company","lineage":["https://openalex.org/I11912373"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Fazan","raw_affiliation_strings":["Assignees at imec for Micron"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Assignees at imec for Micron","institution_ids":["https://openalex.org/I11912373"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065113949","display_name":"Naoto Horiguchi","orcid":"https://orcid.org/0000-0001-5490-0416"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"N. Horiguchi","raw_affiliation_strings":["imec,Leuven,Belgium","imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":17,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":2.2326,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.88022721,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/extrapolation","display_name":"Extrapolation","score":0.7081800699234009},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6747471690177917},{"id":"https://openalex.org/keywords/stack","display_name":"Stack (abstract data type)","score":0.6153783798217773},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.5982734560966492},{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.5563924908638},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5300849676132202},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.48975586891174316},{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.4556484818458557},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.43314462900161743},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.43253758549690247},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4223061800003052},{"id":"https://openalex.org/keywords/data-retention","display_name":"Data retention","score":0.42141860723495483},{"id":"https://openalex.org/keywords/gate-oxide","display_name":"Gate oxide","score":0.4155736565589905},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4085048735141754},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.356722354888916},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.26116031408309937},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16174080967903137},{"id":"https://openalex.org/keywords/metallurgy","display_name":"Metallurgy","score":0.0849374532699585}],"concepts":[{"id":"https://openalex.org/C132459708","wikidata":"https://www.wikidata.org/wiki/Q744069","display_name":"Extrapolation","level":2,"score":0.7081800699234009},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6747471690177917},{"id":"https://openalex.org/C9395851","wikidata":"https://www.wikidata.org/wiki/Q177929","display_name":"Stack (abstract data type)","level":2,"score":0.6153783798217773},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5982734560966492},{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.5563924908638},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5300849676132202},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.48975586891174316},{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.4556484818458557},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.43314462900161743},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.43253758549690247},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4223061800003052},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.42141860723495483},{"id":"https://openalex.org/C2361726","wikidata":"https://www.wikidata.org/wiki/Q5527031","display_name":"Gate oxide","level":4,"score":0.4155736565589905},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4085048735141754},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.356722354888916},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.26116031408309937},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16174080967903137},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0849374532699585},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48227.2022.9764547","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764547","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1991626406","https://openalex.org/W1993299361","https://openalex.org/W2007582022","https://openalex.org/W2021750186","https://openalex.org/W2034060240","https://openalex.org/W2070402395","https://openalex.org/W2081048183","https://openalex.org/W2101639999","https://openalex.org/W2122520074","https://openalex.org/W2270401521","https://openalex.org/W2289750143","https://openalex.org/W2802502993","https://openalex.org/W3005765195","https://openalex.org/W3133882587","https://openalex.org/W3172074710"],"related_works":["https://openalex.org/W2944990515","https://openalex.org/W2031302143","https://openalex.org/W2942040471","https://openalex.org/W2573726612","https://openalex.org/W2028220610","https://openalex.org/W2088008649","https://openalex.org/W2166033074","https://openalex.org/W2036808971","https://openalex.org/W1968460025","https://openalex.org/W2591640162"],"abstract_inverted_index":{"This":[0,48],"paper":[1],"reports":[2],"BTI":[3],"trends":[4,69],"in":[5,70],"high-voltage":[6],"transistors":[7],"for":[8],"memory":[9],"periphery":[10],"devices":[11],"with":[12],"SiO2/Poly-Si":[13],"and":[14,66,79],"High-K/Metal":[15],"gate":[16,46,67,76],"stacks.":[17],"For":[18,72],"PBTI,":[19],"we":[20,74],"present":[21],"an":[22],"extension":[23,49],"to":[24,33,40],"the":[25,34,45],"typical":[26],"power":[27],"law":[28],"kinetics":[29],"that":[30],"is":[31],"related":[32],"creation":[35],"of":[36,54],"interface":[37],"states":[38],"due":[39],"hot":[41],"electrons":[42],"transported":[43],"through":[44],"oxide.":[47],"enables":[50],"a":[51],"good":[52],"fit":[53],"accelerated":[55],"test":[56],"data":[57],"and,":[58],"thereby,":[59],"lifetime":[60],"extrapolation.":[61],"We":[62],"then":[63],"explore":[64],"EOT":[65],"stack":[68],"PBTI.":[71],"NBTI,":[73],"report":[75],"stack,":[77],"EOT,":[78],"thermal":[80],"budget":[81],"trends.":[82]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}