{"id":"https://openalex.org/W4225296462","doi":"https://doi.org/10.1109/irps48227.2022.9764539","title":"DC and RF Reliability Assessment of 5G-MMW capable GaN HEMT Process (Invited)","display_name":"DC and RF Reliability Assessment of 5G-MMW capable GaN HEMT Process (Invited)","publication_year":2022,"publication_date":"2022-03-01","ids":{"openalex":"https://openalex.org/W4225296462","doi":"https://doi.org/10.1109/irps48227.2022.9764539"},"language":"en","primary_location":{"id":"doi:10.1109/irps48227.2022.9764539","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764539","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082987500","display_name":"Satyaki Ganguly","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Satyaki Ganguly","raw_affiliation_strings":["Wolfspeed, Inc,Durham,NC,USA,27703"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wolfspeed, Inc,Durham,NC,USA,27703","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007208751","display_name":"Kyle M. Bothe","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kyle M. Bothe","raw_affiliation_strings":["Wolfspeed, Inc,Durham,NC,USA,27703"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wolfspeed, Inc,Durham,NC,USA,27703","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059988959","display_name":"Alexandre Niyonzima","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Alexandre Niyonzima","raw_affiliation_strings":["Wolfspeed, Inc,Durham,NC,USA,27703"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wolfspeed, Inc,Durham,NC,USA,27703","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019890056","display_name":"Thomas E. Smith","orcid":"https://orcid.org/0000-0002-4031-7753"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Thomas Smith","raw_affiliation_strings":["Wolfspeed, Inc,Durham,NC,USA,27703"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wolfspeed, Inc,Durham,NC,USA,27703","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065417262","display_name":"Yueying Liu","orcid":"https://orcid.org/0000-0001-5335-3334"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yueying Liu","raw_affiliation_strings":["Wolfspeed, Inc,Durham,NC,USA,27703"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wolfspeed, Inc,Durham,NC,USA,27703","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030217410","display_name":"Jeremy Fisher","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jeremy Fisher","raw_affiliation_strings":["Wolfspeed, Inc,Durham,NC,USA,27703"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wolfspeed, Inc,Durham,NC,USA,27703","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039900098","display_name":"Fabian Radulescu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Fabian Radulescu","raw_affiliation_strings":["Wolfspeed, Inc,Durham,NC,USA,27703"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wolfspeed, Inc,Durham,NC,USA,27703","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112246784","display_name":"D. A. Gajewski","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Donald A. Gajewski","raw_affiliation_strings":["Wolfspeed, Inc,Durham,NC,USA,27703"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wolfspeed, Inc,Durham,NC,USA,27703","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035000366","display_name":"S.T. Sheppard","orcid":"https://orcid.org/0009-0006-8950-6383"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Scott T. Sheppard","raw_affiliation_strings":["Wolfspeed, Inc,Durham,NC,USA,27703"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wolfspeed, Inc,Durham,NC,USA,27703","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108771625","display_name":"Jim Milligan","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jim W. Milligan","raw_affiliation_strings":["Wolfspeed, Inc,Durham,NC,USA,27703"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wolfspeed, Inc,Durham,NC,USA,27703","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054302539","display_name":"Basim Noori","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Basim Noori","raw_affiliation_strings":["Wolfspeed, Inc,Durham,NC,USA,27703"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wolfspeed, Inc,Durham,NC,USA,27703","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5067864571","display_name":"John W. Palmour","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"John W. Palmour","raw_affiliation_strings":["Wolfspeed, Inc,Durham,NC,USA,27703"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wolfspeed, Inc,Durham,NC,USA,27703","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":12,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.3694,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.94865526,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"11B.5","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7365605235099792},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.6840862035751343},{"id":"https://openalex.org/keywords/high-electron-mobility-transistor","display_name":"High-electron-mobility transistor","score":0.6671313643455505},{"id":"https://openalex.org/keywords/extremely-high-frequency","display_name":"Extremely high frequency","score":0.5573580861091614},{"id":"https://openalex.org/keywords/monolithic-microwave-integrated-circuit","display_name":"Monolithic microwave integrated circuit","score":0.5122877359390259},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4648965895175934},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.45317015051841736},{"id":"https://openalex.org/keywords/rf-power-amplifier","display_name":"RF power amplifier","score":0.4480734169483185},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4089794158935547},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.39239823818206787},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33652588725090027},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3106502890586853},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.2787292003631592},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26423895359039307},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.2592584192752838},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.15016740560531616},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12283459305763245},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10776036977767944}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7365605235099792},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.6840862035751343},{"id":"https://openalex.org/C162057924","wikidata":"https://www.wikidata.org/wiki/Q1617706","display_name":"High-electron-mobility transistor","level":4,"score":0.6671313643455505},{"id":"https://openalex.org/C45764600","wikidata":"https://www.wikidata.org/wiki/Q570342","display_name":"Extremely high frequency","level":2,"score":0.5573580861091614},{"id":"https://openalex.org/C128450285","wikidata":"https://www.wikidata.org/wiki/Q1945036","display_name":"Monolithic microwave integrated circuit","level":4,"score":0.5122877359390259},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4648965895175934},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.45317015051841736},{"id":"https://openalex.org/C196054291","wikidata":"https://www.wikidata.org/wiki/Q7276624","display_name":"RF power amplifier","level":4,"score":0.4480734169483185},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4089794158935547},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.39239823818206787},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33652588725090027},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3106502890586853},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.2787292003631592},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26423895359039307},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.2592584192752838},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.15016740560531616},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12283459305763245},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10776036977767944},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48227.2022.9764539","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764539","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.4300000071525574,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2756539855","https://openalex.org/W2793788354","https://openalex.org/W4206908589"],"related_works":["https://openalex.org/W1542549500","https://openalex.org/W2167356313","https://openalex.org/W2990861346","https://openalex.org/W2226943413","https://openalex.org/W1897760433","https://openalex.org/W1557806132","https://openalex.org/W2014448200","https://openalex.org/W4297099710","https://openalex.org/W1824302017","https://openalex.org/W2367067752"],"abstract_inverted_index":{"Owing":[0],"to":[1,37,134],"its":[2],"high":[3,5,7,10],"power,":[4],"efficiency,":[6],"gain":[8],"and":[9,21,53,89,92,96,101,118,129,140],"frequency":[11],"capabilities":[12],"RF-GaN":[13],"technology":[14,35,114,144],"has":[15],"not":[16],"only":[17],"dominated":[18],"satellite,":[19],"aerospace":[20],"telecom":[22],"industry":[23],"but":[24],"also":[25],"been":[26,63],"tapped":[27],"as":[28,145],"the":[29,84,123,138],"most":[30],"promising":[31],"candidate":[32,148],"for":[33,149],"5G":[34],"extension":[36],"millimeter":[38],"wave":[39],"(MMW)":[40],"applications.":[41,151],"Excellent":[42],"device":[43],"performances":[44],"with":[45,122],"output":[46],"power":[47,55],"density":[48],"(Pout)":[49],"exceeding":[50],"3":[51],"W/mm":[52],"peak":[54],"added":[56],"efficiency":[57],"(PAE)":[58],"above":[59],"35":[60],"%":[61],"have":[62],"demonstrated":[64],"by":[65],"Wolfspeed's":[66],"5G-MMW":[67],"capable":[68,106],"28":[69,107],"V,":[70],"150-nm":[71,110],"gate":[72,111],"length":[73,112],"(V5)":[74],"GaN":[75],"on":[76,88],"SiC":[77],"technology.":[78],"In":[79],"this":[80],"work":[81],"we":[82],"show":[83],"comprehensive":[85],"DC":[86,100],"(both":[87,99],"off":[90],"state)":[91],"RF":[93],"reliability":[94,124,131,141],"assessment":[95,132],"lifetime":[97],"projection":[98],"RF)":[102],"of":[103,142],"such":[104],"MMW":[105,150],"V":[108],"rated":[109],"process":[113],"(G28V5).":[115],"The":[116],"on-state":[117],"off-state":[119],"results":[120],"coupled":[121],"without":[125],"hermiticity":[126],"(RWOH)":[127],"capability":[128],"intrinsic":[130],"up":[133],"31.5":[135],"GHz":[136],"demonstrate":[137],"maturity":[139],"V5":[143],"a":[146],"true":[147]},"counts_by_year":[{"year":2025,"cited_by_count":4},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}