{"id":"https://openalex.org/W4225309503","doi":"https://doi.org/10.1109/irps48227.2022.9764523","title":"Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment","display_name":"Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment","publication_year":2022,"publication_date":"2022-03-01","ids":{"openalex":"https://openalex.org/W4225309503","doi":"https://doi.org/10.1109/irps48227.2022.9764523"},"language":"en","primary_location":{"id":"doi:10.1109/irps48227.2022.9764523","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764523","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.osti.gov/servlets/purl/2001731","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5015226951","display_name":"Yoni Xiong","orcid":"https://orcid.org/0000-0002-3635-7429"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Y. Xiong","raw_affiliation_strings":["Vanderbilt University,Nashville,TN","Vanderbilt University, Nashville, TN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Nashville,TN","institution_ids":["https://openalex.org/I200719446"]},{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011739859","display_name":"A. Feeley","orcid":"https://orcid.org/0000-0001-6288-1315"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Feeley","raw_affiliation_strings":["Vanderbilt University,Nashville,TN","Vanderbilt University, Nashville, TN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Nashville,TN","institution_ids":["https://openalex.org/I200719446"]},{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005276432","display_name":"Nicholas J. Pieper","orcid":"https://orcid.org/0000-0003-4968-7029"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. J. Pieper","raw_affiliation_strings":["Vanderbilt University,Nashville,TN","Vanderbilt University, Nashville, TN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Nashville,TN","institution_ids":["https://openalex.org/I200719446"]},{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006376684","display_name":"Dennis R. Ball","orcid":"https://orcid.org/0000-0003-0411-1835"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D. R. Ball","raw_affiliation_strings":["Vanderbilt University,Nashville,TN","Vanderbilt University, Nashville, TN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Nashville,TN","institution_ids":["https://openalex.org/I200719446"]},{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075487517","display_name":"Balaji Narasimham","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127325","display_name":"Broadcom (United States)","ror":"https://ror.org/035gt5s03","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127325"]},{"id":"https://openalex.org/I1296127346","display_name":"Broadcom (Israel)","ror":"https://ror.org/01jsrac29","country_code":"IL","type":"company","lineage":["https://openalex.org/I1296127346","https://openalex.org/I4210127325"]}],"countries":["IL","US"],"is_corresponding":false,"raw_author_name":"B. Narasimham","raw_affiliation_strings":["Broadcom Inc,Irvine,CA","Broadcom Inc, Irvine, CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Broadcom Inc,Irvine,CA","institution_ids":["https://openalex.org/I1296127346"]},{"raw_affiliation_string":"Broadcom Inc, Irvine, CA","institution_ids":["https://openalex.org/I4210127325"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112728371","display_name":"John D. Brockman","orcid":null},"institutions":[{"id":"https://openalex.org/I76835614","display_name":"University of Missouri","ror":"https://ror.org/02ymw8z06","country_code":"US","type":"education","lineage":["https://openalex.org/I76835614"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Brockman","raw_affiliation_strings":["University of Missouri Research Reactor,Columbia,MO","University of Missouri Research Reactor, Columbia, MO"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Missouri Research Reactor,Columbia,MO","institution_ids":["https://openalex.org/I76835614"]},{"raw_affiliation_string":"University of Missouri Research Reactor, Columbia, MO","institution_ids":["https://openalex.org/I76835614"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087354887","display_name":"Nathaniel A. Dodds","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. A. Dodds","raw_affiliation_strings":["Sandia National Laboratories,Albuquerque,NM","Sandia National Laboratories, Albuquerque, NM"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories,Albuquerque,NM","institution_ids":["https://openalex.org/I4210104735"]},{"raw_affiliation_string":"Sandia National Laboratories, Albuquerque, NM","institution_ids":["https://openalex.org/I4210104735"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068263816","display_name":"S.A. Wender","orcid":"https://orcid.org/0000-0002-2446-5115"},"institutions":[{"id":"https://openalex.org/I1343871089","display_name":"Los Alamos National Laboratory","ror":"https://ror.org/01e41cf67","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I4210120050"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. A. Wender","raw_affiliation_strings":["Los Alamos National Laboratory,Los Alamos,NM","Los Alamos National Laboratory, Los Alamos, NM"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Los Alamos National Laboratory,Los Alamos,NM","institution_ids":["https://openalex.org/I1343871089"]},{"raw_affiliation_string":"Los Alamos National Laboratory, Los Alamos, NM","institution_ids":["https://openalex.org/I1343871089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010035590","display_name":"Shixi Wen","orcid":"https://orcid.org/0000-0002-4285-2506"},"institutions":[{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]},{"id":"https://openalex.org/I4210129566","display_name":"Cisco Systems (United States)","ror":null,"country_code":"US","type":null,"lineage":["https://openalex.org/I4210129566"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. -J. Wen","raw_affiliation_strings":["Cisco Systems Inc,San Jose,CA","Cisco Systems Inc, San Jose, CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cisco Systems Inc,San Jose,CA","institution_ids":["https://openalex.org/I4210129566"]},{"raw_affiliation_string":"Cisco Systems Inc, San Jose, CA","institution_ids":["https://openalex.org/I135428043"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061264216","display_name":"Rita Fung","orcid":"https://orcid.org/0000-0001-9774-1451"},"institutions":[{"id":"https://openalex.org/I4210129566","display_name":"Cisco Systems (United States)","ror":null,"country_code":"US","type":null,"lineage":["https://openalex.org/I4210129566"]},{"id":"https://openalex.org/I135428043","display_name":"Cisco Systems (United States)","ror":"https://ror.org/03yt1ez60","country_code":"US","type":"company","lineage":["https://openalex.org/I135428043"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Fung","raw_affiliation_strings":["Cisco Systems Inc,San Jose,CA","Cisco Systems Inc, San Jose, CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Cisco Systems Inc,San Jose,CA","institution_ids":["https://openalex.org/I4210129566"]},{"raw_affiliation_string":"Cisco Systems Inc, San Jose, CA","institution_ids":["https://openalex.org/I135428043"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090534631","display_name":"B. L. Bhuva","orcid":"https://orcid.org/0000-0002-2171-100X"},"institutions":[{"id":"https://openalex.org/I200719446","display_name":"Vanderbilt University","ror":"https://ror.org/02vm5rt34","country_code":"US","type":"education","lineage":["https://openalex.org/I200719446"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B. L. Bhuva","raw_affiliation_strings":["Vanderbilt University,Nashville,TN","Vanderbilt University, Nashville, TN"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Vanderbilt University,Nashville,TN","institution_ids":["https://openalex.org/I200719446"]},{"raw_affiliation_string":"Vanderbilt University, Nashville, TN","institution_ids":["https://openalex.org/I200719446"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5015226951"],"corresponding_institution_ids":["https://openalex.org/I200719446"],"apc_list":null,"apc_paid":null,"fwci":3.8357,"has_fulltext":true,"cited_by_count":12,"citation_normalized_percentile":{"value":0.95325303,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"7C.3","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.6772850155830383},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.6735815405845642},{"id":"https://openalex.org/keywords/alpha-particle","display_name":"Alpha particle","score":0.5803664326667786},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5730303525924683},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5399399399757385},{"id":"https://openalex.org/keywords/neutron","display_name":"Neutron","score":0.5052579045295715},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4651079773902893},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4614829421043396},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3376493752002716},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27182537317276},{"id":"https://openalex.org/keywords/atomic-physics","display_name":"Atomic physics","score":0.22928333282470703},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.21966293454170227},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.14166420698165894},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11318299174308777},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.09386846423149109}],"concepts":[{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.6772850155830383},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.6735815405845642},{"id":"https://openalex.org/C66385817","wikidata":"https://www.wikidata.org/wiki/Q103517","display_name":"Alpha particle","level":2,"score":0.5803664326667786},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5730303525924683},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5399399399757385},{"id":"https://openalex.org/C152568617","wikidata":"https://www.wikidata.org/wiki/Q2348","display_name":"Neutron","level":2,"score":0.5052579045295715},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4651079773902893},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4614829421043396},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3376493752002716},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27182537317276},{"id":"https://openalex.org/C184779094","wikidata":"https://www.wikidata.org/wiki/Q26383","display_name":"Atomic physics","level":1,"score":0.22928333282470703},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.21966293454170227},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.14166420698165894},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11318299174308777},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.09386846423149109},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps48227.2022.9764523","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764523","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:osti.gov:2001731","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/2001731","pdf_url":"https://www.osti.gov/servlets/purl/2001731","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"pmh:oai:osti.gov:2001731","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/2001731","pdf_url":"https://www.osti.gov/servlets/purl/2001731","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2209453243","display_name":null,"funder_award_id":"DE-NA0003525","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"},{"id":"https://openalex.org/G2214935549","display_name":null,"funder_award_id":"NA0003525","funder_id":"https://openalex.org/F4320338291","funder_display_name":"Sandia National Laboratories"},{"id":"https://openalex.org/G4903105778","display_name":null,"funder_award_id":"NA0003525","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"},{"id":"https://openalex.org/G4947178736","display_name":null,"funder_award_id":"-NA0003525","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"},{"id":"https://openalex.org/G5211897158","display_name":null,"funder_award_id":"DE-NA0003525","funder_id":"https://openalex.org/F4320332369","funder_display_name":"National Nuclear Security Administration"},{"id":"https://openalex.org/G5339743583","display_name":null,"funder_award_id":"NA0003525","funder_id":"https://openalex.org/F4320332369","funder_display_name":"National Nuclear Security Administration"},{"id":"https://openalex.org/G8168174417","display_name":null,"funder_award_id":"DE-NA0003960","funder_id":"https://openalex.org/F4320332369","funder_display_name":"National Nuclear Security Administration"},{"id":"https://openalex.org/G8279418378","display_name":null,"funder_award_id":"DE-NA0003525","funder_id":"https://openalex.org/F4320338291","funder_display_name":"Sandia National Laboratories"}],"funders":[{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"},{"id":"https://openalex.org/F4320332369","display_name":"National Nuclear Security Administration","ror":"https://ror.org/03sk1we31"},{"id":"https://openalex.org/F4320338291","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12"}],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4225309503.pdf"},"referenced_works_count":35,"referenced_works":["https://openalex.org/W1500230652","https://openalex.org/W1624911842","https://openalex.org/W2025507854","https://openalex.org/W2052153312","https://openalex.org/W2054131667","https://openalex.org/W2068238940","https://openalex.org/W2072397237","https://openalex.org/W2099569658","https://openalex.org/W2106163649","https://openalex.org/W2137273775","https://openalex.org/W2142358791","https://openalex.org/W2164965628","https://openalex.org/W2291822759","https://openalex.org/W2313981178","https://openalex.org/W2321543641","https://openalex.org/W2325092268","https://openalex.org/W2524697621","https://openalex.org/W2535424311","https://openalex.org/W2538317288","https://openalex.org/W2621393226","https://openalex.org/W2654812537","https://openalex.org/W2769280674","https://openalex.org/W2781306629","https://openalex.org/W2911467114","https://openalex.org/W2915257715","https://openalex.org/W2948702813","https://openalex.org/W2983088209","https://openalex.org/W3013683757","https://openalex.org/W3040320225","https://openalex.org/W3118958636","https://openalex.org/W3119773381","https://openalex.org/W3157303364","https://openalex.org/W3163212909","https://openalex.org/W6630003096","https://openalex.org/W6663529649"],"related_works":["https://openalex.org/W2041615232","https://openalex.org/W2167002145","https://openalex.org/W2149032943","https://openalex.org/W2106281713","https://openalex.org/W2154081718","https://openalex.org/W1544140237","https://openalex.org/W141820298","https://openalex.org/W1599771994","https://openalex.org/W3149410719","https://openalex.org/W2161109877"],"abstract_inverted_index":{"Soft":[0],"error":[1],"rates":[2],"(SER)":[3],"are":[4],"characterized":[5],"for":[6,13,41,57,94,117],"the":[7,31,38,58,67,71,95,100,120,124],"5-nm":[8,32,59,96,125],"bulk":[9],"FinFET":[10],"D":[11],"flip-flops":[12],"alpha":[14,84,108],"particles,":[15],"thermal":[16],"neutrons,":[17],"and":[18,51,102,114],"high-energy":[19],"neutrons":[20],"as":[21],"a":[22],"function":[23],"of":[24,48,66,107,119],"supply":[25],"voltage.":[26],"At":[27],"nominal":[28],"operating":[29],"voltage,":[30],"node":[33,40,60,97],"has":[34],"higher":[35,77],"SER":[36,56,90,110,122],"than":[37,64,78,98],"7-nm":[39,68,101],"all":[42],"three":[43],"particle":[44,85,109],"types,":[45],"with":[46,112],"increases":[47,111],"148%,":[49],"168%,":[50],"26%,":[52],"respectively.":[53],"The":[54],"overall":[55,121],"was":[61,76],"~2X":[62],"greater":[63],"that":[65,79],"node,":[69],"because":[70],"reduction":[72],"in":[73,80],"critical":[74],"charge":[75],"collected":[81],"charge.":[82],"For":[83],"exposures,":[86],"temperature":[87],"effects":[88],"on":[89],"were":[91],"more":[92],"prominent":[93],"both":[99],"16-nm":[103],"node.":[104,126],"Relative":[105],"contribution":[106],"scaling,":[113],"it":[115],"accounts":[116],"13%":[118],"at":[123]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":2}],"updated_date":"2026-04-25T08:17:42.794288","created_date":"2025-10-10T00:00:00"}