{"id":"https://openalex.org/W4225317053","doi":"https://doi.org/10.1109/irps48227.2022.9764504","title":"Reliability Analysis of Physically Unclonable Function by Using Aging Variability Simulation","display_name":"Reliability Analysis of Physically Unclonable Function by Using Aging Variability Simulation","publication_year":2022,"publication_date":"2022-03-01","ids":{"openalex":"https://openalex.org/W4225317053","doi":"https://doi.org/10.1109/irps48227.2022.9764504"},"language":"en","primary_location":{"id":"doi:10.1109/irps48227.2022.9764504","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764504","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101978093","display_name":"Jae-Gyung Ahn","orcid":"https://orcid.org/0000-0003-3137-5924"},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jae-Gyung Ahn","raw_affiliation_strings":["Xilinx Inc,San Jose,CA,USA","Xilinx Inc, San Jose, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xilinx Inc,San Jose,CA,USA","institution_ids":["https://openalex.org/I32923980"]},{"raw_affiliation_string":"Xilinx Inc, San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059312623","display_name":"Jim Wesselkamper","orcid":null},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jim Wesselkamper","raw_affiliation_strings":["Xilinx Inc,San Jose,CA,USA","Xilinx Inc, San Jose, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xilinx Inc,San Jose,CA,USA","institution_ids":["https://openalex.org/I32923980"]},{"raw_affiliation_string":"Xilinx Inc, San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009091940","display_name":"Ryan SW Baek","orcid":null},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ryan SW Baek","raw_affiliation_strings":["Xilinx Inc,San Jose,CA,USA","Xilinx Inc, San Jose, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xilinx Inc,San Jose,CA,USA","institution_ids":["https://openalex.org/I32923980"]},{"raw_affiliation_string":"Xilinx Inc, San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009973636","display_name":"Ping-Chin Yeh","orcid":null},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ping-Chin Yeh","raw_affiliation_strings":["Xilinx Inc,San Jose,CA,USA","Xilinx Inc, San Jose, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xilinx Inc,San Jose,CA,USA","institution_ids":["https://openalex.org/I32923980"]},{"raw_affiliation_string":"Xilinx Inc, San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081987422","display_name":"Jonathan Chang","orcid":"https://orcid.org/0000-0002-3811-1254"},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jonathan Chang","raw_affiliation_strings":["Xilinx Inc,San Jose,CA,USA","Xilinx Inc, San Jose, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xilinx Inc,San Jose,CA,USA","institution_ids":["https://openalex.org/I32923980"]},{"raw_affiliation_string":"Xilinx Inc, San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052827371","display_name":"J. Wong","orcid":null},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jennifer Wong","raw_affiliation_strings":["Xilinx Inc,San Jose,CA,USA","Xilinx Inc, San Jose, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xilinx Inc,San Jose,CA,USA","institution_ids":["https://openalex.org/I32923980"]},{"raw_affiliation_string":"Xilinx Inc, San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111714809","display_name":"Xin Wu","orcid":"https://orcid.org/0009-0000-1056-1918"},"institutions":[{"id":"https://openalex.org/I32923980","display_name":"Xilinx (United States)","ror":"https://ror.org/01rb7bk56","country_code":"US","type":"company","lineage":["https://openalex.org/I32923980"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xin Wu","raw_affiliation_strings":["Xilinx Inc,San Jose,CA,USA","Xilinx Inc, San Jose, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Xilinx Inc,San Jose,CA,USA","institution_ids":["https://openalex.org/I32923980"]},{"raw_affiliation_string":"Xilinx Inc, San Jose, CA, USA","institution_ids":["https://openalex.org/I32923980"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I32923980"],"apc_list":null,"apc_paid":null,"fwci":0.2133,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.26405622,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"P1.1","last_page":"P1.5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.982699990272522,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/physical-unclonable-function","display_name":"Physical unclonable function","score":0.6823352575302124},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6677560210227966},{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.6120316386222839},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5819194316864014},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.4692530632019043},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.46125778555870056},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.46075329184532166},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4095913767814636},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3469720482826233},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3201996684074402},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2602252960205078},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.21423548460006714},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.17977160215377808},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16812634468078613},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.14617478847503662},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12182271480560303},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11071926355361938},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10265776515007019}],"concepts":[{"id":"https://openalex.org/C8643368","wikidata":"https://www.wikidata.org/wiki/Q4046262","display_name":"Physical unclonable function","level":3,"score":0.6823352575302124},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6677560210227966},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.6120316386222839},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5819194316864014},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.4692530632019043},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.46125778555870056},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.46075329184532166},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4095913767814636},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3469720482826233},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3201996684074402},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2602252960205078},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.21423548460006714},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.17977160215377808},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16812634468078613},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.14617478847503662},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12182271480560303},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11071926355361938},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10265776515007019},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48227.2022.9764504","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764504","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.49000000953674316,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W1974113657","https://openalex.org/W1988922865","https://openalex.org/W2291301542"],"related_works":["https://openalex.org/W4386278306","https://openalex.org/W2010558539","https://openalex.org/W4392590355","https://openalex.org/W2580259249","https://openalex.org/W3096667951","https://openalex.org/W3151633427","https://openalex.org/W4288068867","https://openalex.org/W102880045","https://openalex.org/W2775062502","https://openalex.org/W2302863414"],"abstract_inverted_index":{"We":[0],"applied":[1],"Monte":[2],"Carlo":[3],"(MC)":[4],"aging":[5,11,40],"simulation":[6,41,53],"flow":[7,42,73],"to":[8,43,76],"explain":[9],"measured":[10,59],"effects":[12],"of":[13,25,37,80,83],"PUF":[14,27,45,84],"(Physically":[15],"Unclonable":[16],"Function)":[17],"circuit.":[18],"Simulation":[19],"data":[20,60],"provides":[21],"a":[22],"good":[23],"understanding":[24],"how":[26],"circuit":[28],"stability":[29,46,79],"is":[30,47,54,65],"degraded":[31],"with":[32,57],"the":[33,58,62,78],"NBTI":[34],"effect.":[35],"Procedure":[36],"using":[38],"MC":[39],"predict":[44,77],"explained":[48],"in":[49],"detail.":[50],"Result":[51],"from":[52],"well":[55],"matching":[56],"when":[61],"variability":[63],"model":[64],"correctly":[66],"extracted":[67],"considering":[68],"MOSFET":[69],"device":[70],"size.":[71],"This":[72],"was":[74],"used":[75],"different":[81],"types":[82],"designs.":[85]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}