{"id":"https://openalex.org/W4225324665","doi":"https://doi.org/10.1109/irps48227.2022.9764486","title":"Mitigating read-program variation and IR drop by circuit architecture in RRAM-based neural network accelerators","display_name":"Mitigating read-program variation and IR drop by circuit architecture in RRAM-based neural network accelerators","publication_year":2022,"publication_date":"2022-03-01","ids":{"openalex":"https://openalex.org/W4225324665","doi":"https://doi.org/10.1109/irps48227.2022.9764486"},"language":"en","primary_location":{"id":"doi:10.1109/irps48227.2022.9764486","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764486","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013456803","display_name":"Nicola Lepri","orcid":"https://orcid.org/0000-0001-7602-4058"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Nicola Lepri","raw_affiliation_strings":["Politecnico di Milano and IU.NET,Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB),Milan,Italy,20133"],"affiliations":[{"raw_affiliation_string":"Politecnico di Milano and IU.NET,Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB),Milan,Italy,20133","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029478217","display_name":"Artem Glukhov","orcid":"https://orcid.org/0000-0001-9362-2113"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Artem Glukhov","raw_affiliation_strings":["Politecnico di Milano and IU.NET,Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB),Milan,Italy,20133"],"affiliations":[{"raw_affiliation_string":"Politecnico di Milano and IU.NET,Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB),Milan,Italy,20133","institution_ids":["https://openalex.org/I93860229"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5054173368","display_name":"Daniele Ielmini","orcid":"https://orcid.org/0000-0002-1853-1614"},"institutions":[{"id":"https://openalex.org/I93860229","display_name":"Politecnico di Milano","ror":"https://ror.org/01nffqt88","country_code":"IT","type":"education","lineage":["https://openalex.org/I93860229"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Daniele Ielmini","raw_affiliation_strings":["Politecnico di Milano and IU.NET,Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB),Milan,Italy,20133"],"affiliations":[{"raw_affiliation_string":"Politecnico di Milano and IU.NET,Dipartimento di Elettronica, Informazione e Bioingegneria (DEIB),Milan,Italy,20133","institution_ids":["https://openalex.org/I93860229"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5013456803"],"corresponding_institution_ids":["https://openalex.org/I93860229"],"apc_list":null,"apc_paid":null,"fwci":4.1891,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.95958736,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":null,"issue":null,"first_page":"3C.2","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-drop","display_name":"Voltage drop","score":0.6822217106819153},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.6802448034286499},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6243597269058228},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.580599844455719},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4981210231781006},{"id":"https://openalex.org/keywords/drop","display_name":"Drop (telecommunication)","score":0.4846547245979309},{"id":"https://openalex.org/keywords/power-network-design","display_name":"Power network design","score":0.4840030372142792},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4793418347835541},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.41102176904678345},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3976902961730957},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3084286153316498},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18427255749702454},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16395241022109985},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09068667888641357}],"concepts":[{"id":"https://openalex.org/C82178898","wikidata":"https://www.wikidata.org/wiki/Q166839","display_name":"Voltage drop","level":3,"score":0.6822217106819153},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.6802448034286499},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6243597269058228},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.580599844455719},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4981210231781006},{"id":"https://openalex.org/C2781345722","wikidata":"https://www.wikidata.org/wiki/Q5308388","display_name":"Drop (telecommunication)","level":2,"score":0.4846547245979309},{"id":"https://openalex.org/C164565468","wikidata":"https://www.wikidata.org/wiki/Q7236535","display_name":"Power network design","level":3,"score":0.4840030372142792},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4793418347835541},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.41102176904678345},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3976902961730957},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3084286153316498},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18427255749702454},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16395241022109985},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09068667888641357}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps48227.2022.9764486","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764486","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:re.public.polimi.it:11311/1219088","is_oa":false,"landing_page_url":"http://hdl.handle.net/11311/1219088","pdf_url":null,"source":{"id":"https://openalex.org/S4306400312","display_name":"Virtual Community of Pathological Anatomy (University of Castilla La Mancha)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I79189158","host_organization_name":"University of Castilla-La Mancha","host_organization_lineage":["https://openalex.org/I79189158"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.9100000262260437,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1522301498","https://openalex.org/W2307193480","https://openalex.org/W2399958287","https://openalex.org/W2469490737","https://openalex.org/W2769049661","https://openalex.org/W2769433089","https://openalex.org/W2778935320","https://openalex.org/W2805362231","https://openalex.org/W2911439915","https://openalex.org/W2946033333","https://openalex.org/W2948661249","https://openalex.org/W3005722387","https://openalex.org/W3028754834","https://openalex.org/W3030670306","https://openalex.org/W3101272433","https://openalex.org/W3106392217","https://openalex.org/W3111367661","https://openalex.org/W3138725418","https://openalex.org/W3180792321","https://openalex.org/W3183888357","https://openalex.org/W3201969459","https://openalex.org/W4210419143","https://openalex.org/W6631190155","https://openalex.org/W6720242923"],"related_works":["https://openalex.org/W2363818268","https://openalex.org/W2108172432","https://openalex.org/W2119232911","https://openalex.org/W2143381869","https://openalex.org/W2109799272","https://openalex.org/W2018764485","https://openalex.org/W4233629644","https://openalex.org/W2742658476","https://openalex.org/W4255681223","https://openalex.org/W2319035808"],"abstract_inverted_index":{"In-memory":[0],"computing":[1],"(IMC)":[2],"with":[3],"memory":[4,105],"arrays":[5],"allows":[6],"reducing":[7],"the":[8,25,40,46,54,72,81,98,104],"time":[9],"and":[10,39,68],"energy":[11],"consumption":[12],"for":[13,18,64,79],"matrix":[14],"vector":[15],"multiplication":[16],"(MVM)":[17],"artificial":[19],"neural":[20],"networks":[21],"(ANN)":[22],"inference.":[23],"However,":[24],"IMC":[26,61],"accuracy":[27,82,94],"is":[28],"affected":[29],"by":[30],"nonidealities,":[31],"such":[32],"as":[33],"program/read":[34],"variations":[35,67],"of":[36,83,95,100,103],"device":[37],"conductance":[38],"parasitic":[41],"voltage":[42],"(IR)":[43],"drop":[44,70],"along":[45],"wires,":[47],"whose":[48],"impact":[49],"quickly":[50],"increases":[51],"when":[52],"increasing":[53],"array":[55,106],"size.":[56],"This":[57],"work":[58],"presents":[59],"new":[60,76],"circuit":[62],"architectures":[63],"mitigating":[65],"both":[66],"IR":[69],"at":[71,97],"same":[73],"time.":[74],"The":[75],"schemes":[77],"allow":[78],"improving":[80],"an":[84,101],"ANN":[85],"from":[86],"72.7%":[87],"to":[88,91],"94.9%,":[89],"compared":[90],"a":[92],"software":[93],"96.9%,":[96],"expense":[99],"increase":[102],"area.":[107]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2022-05-05T00:00:00"}