{"id":"https://openalex.org/W4225299258","doi":"https://doi.org/10.1109/irps48227.2022.9764481","title":"Endurance Evaluation on OTS-PCM Device using Constant Current Stress Scheme","display_name":"Endurance Evaluation on OTS-PCM Device using Constant Current Stress Scheme","publication_year":2022,"publication_date":"2022-03-01","ids":{"openalex":"https://openalex.org/W4225299258","doi":"https://doi.org/10.1109/irps48227.2022.9764481"},"language":"en","primary_location":{"id":"doi:10.1109/irps48227.2022.9764481","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764481","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102711288","display_name":"Wei-Chih Chien","orcid":"https://orcid.org/0000-0001-7290-8411"},"institutions":[{"id":"https://openalex.org/I4210086683","display_name":"Macronix International (China)","ror":"https://ror.org/00yec5b88","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210086683"]},{"id":"https://openalex.org/I4210092191","display_name":"Macronix International (Taiwan)","ror":"https://ror.org/01bggjn73","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210092191"]}],"countries":["CN","TW"],"is_corresponding":true,"raw_author_name":"W. C. Chien","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","institution_ids":["https://openalex.org/I4210086683","https://openalex.org/I4210092191"]},{"raw_affiliation_string":"Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060588958","display_name":"L. Gignac","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. M. Gignac","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110919280","display_name":"Y. C. Chou","orcid":"https://orcid.org/0009-0000-4570-5387"},"institutions":[{"id":"https://openalex.org/I4210092191","display_name":"Macronix International (Taiwan)","ror":"https://ror.org/01bggjn73","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210092191"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Y. C. Chou","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, Product Design and Engineering Center,Hsinchu,Taiwan","IBM/Macronix Phase Change Memory Joint Project, Product Design and Engineering Center, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, Product Design and Engineering Center,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210092191"]},{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, Product Design and Engineering Center, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210092191"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110618625","display_name":"C. H. Yang","orcid":"https://orcid.org/0009-0003-8246-6575"},"institutions":[{"id":"https://openalex.org/I4210092191","display_name":"Macronix International (Taiwan)","ror":"https://ror.org/01bggjn73","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210092191"]},{"id":"https://openalex.org/I4210086683","display_name":"Macronix International (China)","ror":"https://ror.org/00yec5b88","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210086683"]}],"countries":["CN","TW"],"is_corresponding":false,"raw_author_name":"C. H. Yang","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","institution_ids":["https://openalex.org/I4210086683","https://openalex.org/I4210092191"]},{"raw_affiliation_string":"Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038958881","display_name":"Nanbo Gong","orcid":"https://orcid.org/0000-0002-9797-5124"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. Gong","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110630714","display_name":"H. Y. Ho","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092191","display_name":"Macronix International (Taiwan)","ror":"https://ror.org/01bggjn73","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210092191"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"H. Y. Ho","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, Product Design and Engineering Center,Hsinchu,Taiwan","IBM/Macronix Phase Change Memory Joint Project, Product Design and Engineering Center, Hsinchu, Taiwan"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, Product Design and Engineering Center,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210092191"]},{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, Product Design and Engineering Center, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210092191"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084950175","display_name":"C. W. Yeh","orcid":"https://orcid.org/0000-0002-8018-5812"},"institutions":[{"id":"https://openalex.org/I4210092191","display_name":"Macronix International (Taiwan)","ror":"https://ror.org/01bggjn73","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210092191"]},{"id":"https://openalex.org/I4210086683","display_name":"Macronix International (China)","ror":"https://ror.org/00yec5b88","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210086683"]}],"countries":["CN","TW"],"is_corresponding":false,"raw_author_name":"C. W. Yeh","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","institution_ids":["https://openalex.org/I4210086683","https://openalex.org/I4210092191"]},{"raw_affiliation_string":"Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101897992","display_name":"Huai\u2010Yu Cheng","orcid":"https://orcid.org/0000-0001-5365-4946"},"institutions":[{"id":"https://openalex.org/I4210086683","display_name":"Macronix International (China)","ror":"https://ror.org/00yec5b88","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210086683"]},{"id":"https://openalex.org/I4210092191","display_name":"Macronix International (Taiwan)","ror":"https://ror.org/01bggjn73","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210092191"]}],"countries":["CN","TW"],"is_corresponding":false,"raw_author_name":"H. Y. Cheng","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","institution_ids":["https://openalex.org/I4210086683","https://openalex.org/I4210092191"]},{"raw_affiliation_string":"Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028647601","display_name":"W. Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"W. Kim","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108730173","display_name":"I. T. Kuo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092191","display_name":"Macronix International (Taiwan)","ror":"https://ror.org/01bggjn73","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210092191"]},{"id":"https://openalex.org/I4210086683","display_name":"Macronix International (China)","ror":"https://ror.org/00yec5b88","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210086683"]}],"countries":["CN","TW"],"is_corresponding":false,"raw_author_name":"I. T. Kuo","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","institution_ids":["https://openalex.org/I4210086683","https://openalex.org/I4210092191"]},{"raw_affiliation_string":"Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111718032","display_name":"Erh-Kun Lai","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092191","display_name":"Macronix International (Taiwan)","ror":"https://ror.org/01bggjn73","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210092191"]},{"id":"https://openalex.org/I4210086683","display_name":"Macronix International (China)","ror":"https://ror.org/00yec5b88","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210086683"]}],"countries":["CN","TW"],"is_corresponding":false,"raw_author_name":"E. K. Lai","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","institution_ids":["https://openalex.org/I4210086683","https://openalex.org/I4210092191"]},{"raw_affiliation_string":"Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112927920","display_name":"Chiyu Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"C. W. Cheng","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064115557","display_name":"L. Buzi","orcid":"https://orcid.org/0000-0002-8698-9950"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. Buzi","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030773148","display_name":"A. Ray","orcid":"https://orcid.org/0000-0002-5247-0261"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Ray","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007847180","display_name":"C. S. Hsu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210092191","display_name":"Macronix International (Taiwan)","ror":"https://ror.org/01bggjn73","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210092191"]},{"id":"https://openalex.org/I4210086683","display_name":"Macronix International (China)","ror":"https://ror.org/00yec5b88","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210086683"]}],"countries":["CN","TW"],"is_corresponding":false,"raw_author_name":"C. S. Hsu","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","institution_ids":["https://openalex.org/I4210086683","https://openalex.org/I4210092191"]},{"raw_affiliation_string":"Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024630942","display_name":"Robert L. Bruce","orcid":"https://orcid.org/0000-0002-5574-5603"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. L. Bruce","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109090176","display_name":"M. BrightSky","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M. BrightSky","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, IBM T.J. Watson Research Center,Yorktown Heights,NY,USA,10598","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108730172","display_name":"H.L. Lung","orcid":null},"institutions":[{"id":"https://openalex.org/I4210086683","display_name":"Macronix International (China)","ror":"https://ror.org/00yec5b88","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210086683"]},{"id":"https://openalex.org/I4210092191","display_name":"Macronix International (Taiwan)","ror":"https://ror.org/01bggjn73","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210092191"]}],"countries":["CN","TW"],"is_corresponding":false,"raw_author_name":"H. L. Lung","raw_affiliation_strings":["IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd"],"affiliations":[{"raw_affiliation_string":"IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd.,Emerging Central Lab","institution_ids":["https://openalex.org/I4210086683","https://openalex.org/I4210092191"]},{"raw_affiliation_string":"Emerging Central Lab, IBM/Macronix Phase Change Memory Joint Project, Macronix International Co., Ltd","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":18,"corresponding_author_ids":["https://openalex.org/A5102711288"],"corresponding_institution_ids":["https://openalex.org/I4210086683","https://openalex.org/I4210092191"],"apc_list":null,"apc_paid":null,"fwci":0.7168,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.60695587,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"P7","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.63165283203125},{"id":"https://openalex.org/keywords/constant","display_name":"Constant (computer programming)","score":0.5644241571426392},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5369150042533875},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.5045074224472046},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.49249228835105896},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4734877049922943},{"id":"https://openalex.org/keywords/constant-current","display_name":"Constant current","score":0.46633195877075195},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.4485902190208435},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.35359513759613037},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.281242311000824},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2496267557144165},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1265290081501007},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09799471497535706}],"concepts":[{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.63165283203125},{"id":"https://openalex.org/C2777027219","wikidata":"https://www.wikidata.org/wiki/Q1284190","display_name":"Constant (computer programming)","level":2,"score":0.5644241571426392},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5369150042533875},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.5045074224472046},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.49249228835105896},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4734877049922943},{"id":"https://openalex.org/C53392680","wikidata":"https://www.wikidata.org/wiki/Q5163647","display_name":"Constant current","level":3,"score":0.46633195877075195},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.4485902190208435},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.35359513759613037},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.281242311000824},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2496267557144165},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1265290081501007},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09799471497535706},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48227.2022.9764481","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764481","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1976198489","https://openalex.org/W2899380985","https://openalex.org/W2912478339","https://openalex.org/W2950214027","https://openalex.org/W3107587861","https://openalex.org/W3108108861","https://openalex.org/W3139165709","https://openalex.org/W6758713445"],"related_works":["https://openalex.org/W2360467594","https://openalex.org/W2113872621","https://openalex.org/W2360902204","https://openalex.org/W4232570085","https://openalex.org/W2361918486","https://openalex.org/W4242473446","https://openalex.org/W4245987301","https://openalex.org/W3088363441","https://openalex.org/W4247404905","https://openalex.org/W4246134083"],"abstract_inverted_index":{"A":[0,39],"constant":[1],"current":[2],"stress":[3],"scheme":[4],"is":[5,45],"implemented":[6],"for":[7,13,27,36],"endurance":[8,26,51],"study":[9],"on":[10,53],"OTS-PCM":[11],"devices":[12],"the":[14,24,50,54],"first":[15],"time.":[16],"It":[17],"provides":[18],"a":[19],"feasible":[20],"method":[21],"to":[22],"estimate":[23],"read/write":[25],"cross-point":[28],"PCM":[29],"products,":[30],"which":[31],"can":[32],"save":[33],"testing":[34],"time":[35],"chips":[37],"qualification.":[38],"256kb":[40],"chip":[41],"with":[42,49,58],"1E7":[43],"cycles":[44],"demonstrated":[46],"that":[47],"corresponds":[48],"evaluation":[52],"doped":[55,59],"AsGeSe":[56],"OTS":[57],"Ge2Sb2Te5":[60],"system.":[61]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}