{"id":"https://openalex.org/W4225320181","doi":"https://doi.org/10.1109/irps48227.2022.9764459","title":"MTJ degradation in SOT-MRAM by self-heating-induced diffusion","display_name":"MTJ degradation in SOT-MRAM by self-heating-induced diffusion","publication_year":2022,"publication_date":"2022-03-01","ids":{"openalex":"https://openalex.org/W4225320181","doi":"https://doi.org/10.1109/irps48227.2022.9764459"},"language":"en","primary_location":{"id":"doi:10.1109/irps48227.2022.9764459","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764459","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000437483","display_name":"S. Van Beek","orcid":"https://orcid.org/0000-0002-2499-4172"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Simon Van Beek","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004623248","display_name":"Kaiming Cai","orcid":"https://orcid.org/0000-0002-1160-864X"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Kaiming Cai","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002378343","display_name":"Siddharth Rao","orcid":"https://orcid.org/0000-0001-6161-3052"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Siddharth Rao","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090350858","display_name":"Ganesh Jayakumar","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ganesh Jayakumar","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022214575","display_name":"S\u00e9bastien Couet","orcid":"https://orcid.org/0000-0001-6436-9593"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Sebastien Couet","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004463732","display_name":"N. Jossart","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Nico Jossart","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040074138","display_name":"Adrian Chasin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Adrian Chasin","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080181961","display_name":"Gouri Sankar Kar","orcid":"https://orcid.org/0000-0003-3122-4237"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Gouri Sankar Kar","raw_affiliation_strings":["Imec,Leuven,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5000437483"],"corresponding_institution_ids":["https://openalex.org/I4210114974"],"apc_list":null,"apc_paid":null,"fwci":3.8348,"has_fulltext":false,"cited_by_count":13,"citation_normalized_percentile":{"value":0.95338361,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"4A.2","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10049","display_name":"Magnetic properties of thin films","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.9238295555114746},{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.788709282875061},{"id":"https://openalex.org/keywords/tunnel-magnetoresistance","display_name":"Tunnel magnetoresistance","score":0.7214088439941406},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6847059726715088},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.6421087980270386},{"id":"https://openalex.org/keywords/diffusion","display_name":"Diffusion","score":0.5856751799583435},{"id":"https://openalex.org/keywords/reading","display_name":"Reading (process)","score":0.5579255223274231},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.5419841408729553},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.516734778881073},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.48560136556625366},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.45716914534568787},{"id":"https://openalex.org/keywords/diffusion-barrier","display_name":"Diffusion barrier","score":0.4547301232814789},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.40239763259887695},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.38691502809524536},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.33967769145965576},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.24838852882385254},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.22256413102149963},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.16311684250831604},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12138631939888},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.10232430696487427},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09335929155349731}],"concepts":[{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.9238295555114746},{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.788709282875061},{"id":"https://openalex.org/C56202322","wikidata":"https://www.wikidata.org/wiki/Q1884383","display_name":"Tunnel magnetoresistance","level":3,"score":0.7214088439941406},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6847059726715088},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.6421087980270386},{"id":"https://openalex.org/C69357855","wikidata":"https://www.wikidata.org/wiki/Q163214","display_name":"Diffusion","level":2,"score":0.5856751799583435},{"id":"https://openalex.org/C554936623","wikidata":"https://www.wikidata.org/wiki/Q199657","display_name":"Reading (process)","level":2,"score":0.5579255223274231},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.5419841408729553},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.516734778881073},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.48560136556625366},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.45716914534568787},{"id":"https://openalex.org/C2778836790","wikidata":"https://www.wikidata.org/wiki/Q5275435","display_name":"Diffusion barrier","level":3,"score":0.4547301232814789},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.40239763259887695},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.38691502809524536},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.33967769145965576},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.24838852882385254},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.22256413102149963},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.16311684250831604},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12138631939888},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.10232430696487427},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09335929155349731},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48227.2022.9764459","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764459","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8199999928474426,"display_name":"Quality Education","id":"https://metadata.un.org/sdg/4"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2068896528","https://openalex.org/W2742694477","https://openalex.org/W2896872617","https://openalex.org/W3158222379","https://openalex.org/W3193341937","https://openalex.org/W6800303666"],"related_works":["https://openalex.org/W2160372845","https://openalex.org/W1545438037","https://openalex.org/W1977755618","https://openalex.org/W2131964951","https://openalex.org/W2897770615","https://openalex.org/W4226197542","https://openalex.org/W4214681414","https://openalex.org/W1890124164","https://openalex.org/W2032117939","https://openalex.org/W2034593071"],"abstract_inverted_index":{"In":[0],"SOT-MRAM,":[1],"the":[2,8,19,28,34,39,51,58,65],"writing":[3],"path":[4,10],"is":[5,42],"decoupled":[6],"from":[7],"reading":[9],"and":[11,68],"therefore":[12],"considered":[13],"robust":[14,43],"against":[15,44],"MgO":[16,69],"breakdown":[17],"in":[18],"MTJ.":[20,35,52],"At":[21],"operation,":[22],"high":[23],"current":[24],"densities":[25],"flow":[26],"through":[27],"thin":[29],"metallic":[30],"SOT":[31,40],"layer":[32,67],"underneath":[33],"We":[36],"find":[37],"that":[38,63],"track":[41],"electromigration,":[45],"but":[46],"we":[47],"observe":[48],"failure":[49],"of":[50,60],"A":[53],"thorough":[54],"chemical":[55],"analysis":[56],"indicates":[57],"activation":[59],"diffusion":[61],"mechanisms":[62],"degrade":[64],"free":[66],"tunnel":[70],"barrier.":[71]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":1}],"updated_date":"2026-05-04T08:30:34.212998","created_date":"2025-10-10T00:00:00"}