{"id":"https://openalex.org/W4225299281","doi":"https://doi.org/10.1109/irps48227.2022.9764437","title":"Novel Electrical Detection Method for Random Defects on Peripheral Circuits in NAND Flash Memory","display_name":"Novel Electrical Detection Method for Random Defects on Peripheral Circuits in NAND Flash Memory","publication_year":2022,"publication_date":"2022-03-01","ids":{"openalex":"https://openalex.org/W4225299281","doi":"https://doi.org/10.1109/irps48227.2022.9764437"},"language":"en","primary_location":{"id":"doi:10.1109/irps48227.2022.9764437","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764437","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5045187096","display_name":"Buil Nam","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Bu-Il Nam","raw_affiliation_strings":["Samsung Electronics,Flash PE Team,Hwasung,Korea","Flash PE Team, Samsung Electronics, Hwasung, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Flash PE Team,Hwasung,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Flash PE Team, Samsung Electronics, Hwasung, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081987583","display_name":"Youngha Choi","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngha Choi","raw_affiliation_strings":["Samsung Electronics,Flash PE Team,Hwasung,Korea","Flash PE Team, Samsung Electronics, Hwasung, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Flash PE Team,Hwasung,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Flash PE Team, Samsung Electronics, Hwasung, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067897222","display_name":"Sungki Hong","orcid":"https://orcid.org/0000-0003-1952-0172"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sungki Hong","raw_affiliation_strings":["Samsung Electronics,Flash PE Team,Hwasung,Korea","Flash PE Team, Samsung Electronics, Hwasung, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Flash PE Team,Hwasung,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Flash PE Team, Samsung Electronics, Hwasung, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101051040","display_name":"Ki-Young Dong","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ki-Young Dong","raw_affiliation_strings":["Samsung Electronics,Flash PE Team,Hwasung,Korea","Flash PE Team, Samsung Electronics, Hwasung, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Flash PE Team,Hwasung,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Flash PE Team, Samsung Electronics, Hwasung, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018610040","display_name":"Wontaeck Jung","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Wontaeck Jung","raw_affiliation_strings":["Samsung Electronics,Flash Product &#x0026; Technology,Hwasung,Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Flash Product &#x0026; Technology,Hwasung,Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100698580","display_name":"Sang-Won Park","orcid":"https://orcid.org/0000-0003-0354-6773"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang-Won Park","raw_affiliation_strings":["Samsung Electronics,Flash Product &#x0026; Technology,Hwasung,Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Flash Product &#x0026; Technology,Hwasung,Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041057490","display_name":"Soon-Yong Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Soon-Yong Lee","raw_affiliation_strings":["Samsung Electronics,Flash Product &#x0026; Technology,Hwasung,Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Flash Product &#x0026; Technology,Hwasung,Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102428020","display_name":"Dooyeun Jung","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dooyeun Jung","raw_affiliation_strings":["Samsung Electronics,Flash PE Team,Hwasung,Korea","Flash PE Team, Samsung Electronics, Hwasung, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Flash PE Team,Hwasung,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Flash PE Team, Samsung Electronics, Hwasung, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078447099","display_name":"Kim Byounghee","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Byoung-Hee Kim","raw_affiliation_strings":["Samsung Electronics,Flash PE Team,Hwasung,Korea","Flash PE Team, Samsung Electronics, Hwasung, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Flash PE Team,Hwasung,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Flash PE Team, Samsung Electronics, Hwasung, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100673994","display_name":"Eunkyoung Kim","orcid":"https://orcid.org/0000-0003-2566-4041"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Eunkyoung Kim","raw_affiliation_strings":["Samsung Electronics,Flash PE Team,Hwasung,Korea","Flash PE Team, Samsung Electronics, Hwasung, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Flash PE Team,Hwasung,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Flash PE Team, Samsung Electronics, Hwasung, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113987543","display_name":"Ki\u2010Whan Song","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ki-Whan Song","raw_affiliation_strings":["Samsung Electronics,Flash PE Team,Hwasung,Korea","Flash PE Team, Samsung Electronics, Hwasung, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Flash PE Team,Hwasung,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Flash PE Team, Samsung Electronics, Hwasung, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102428900","display_name":"Jai Hyuk Song","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jai Hyuk Song","raw_affiliation_strings":["Samsung Electronics,Flash Product &#x0026; Technology,Hwasung,Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Flash Product &#x0026; Technology,Hwasung,Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021465412","display_name":"Woo Young Choi","orcid":"https://orcid.org/0000-0002-5515-2912"},"institutions":[{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Woo Young Choi","raw_affiliation_strings":["Seoul National University,Department of Electrical and Computer Engineering,Seoul,Korea"],"affiliations":[{"raw_affiliation_string":"Seoul National University,Department of Electrical and Computer Engineering,Seoul,Korea","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":13,"corresponding_author_ids":["https://openalex.org/A5045187096"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":1.2876,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.74743737,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"7","issue":null,"first_page":"P40","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nand-gate","display_name":"NAND gate","score":0.7015243768692017},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.6228606700897217},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5887369513511658},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5835118293762207},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.4943690299987793},{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.48603278398513794},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4545315206050873},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.4534778594970703},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.42572250962257385},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.41080036759376526},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.37473931908607483},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3516382575035095},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.27406764030456543},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2612020969390869},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1947919726371765},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15012115240097046}],"concepts":[{"id":"https://openalex.org/C124296912","wikidata":"https://www.wikidata.org/wiki/Q575178","display_name":"NAND gate","level":3,"score":0.7015243768692017},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.6228606700897217},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5887369513511658},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5835118293762207},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.4943690299987793},{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.48603278398513794},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4545315206050873},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4534778594970703},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.42572250962257385},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.41080036759376526},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.37473931908607483},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3516382575035095},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.27406764030456543},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2612020969390869},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1947919726371765},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15012115240097046},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48227.2022.9764437","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48227.2022.9764437","pdf_url":null,"source":{"id":"https://openalex.org/S4363605693","display_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1913711070","https://openalex.org/W2069715597","https://openalex.org/W2117340982","https://openalex.org/W2118008391","https://openalex.org/W2121488803","https://openalex.org/W2125662822","https://openalex.org/W2131862714","https://openalex.org/W2143364495","https://openalex.org/W2342931327","https://openalex.org/W2543886144","https://openalex.org/W2789074063","https://openalex.org/W2920916186","https://openalex.org/W3133968057","https://openalex.org/W3200645987"],"related_works":["https://openalex.org/W27380437","https://openalex.org/W2603759966","https://openalex.org/W4312309788","https://openalex.org/W2350469736","https://openalex.org/W2032116217","https://openalex.org/W3033819328","https://openalex.org/W2123798696","https://openalex.org/W2351190677","https://openalex.org/W2360402255","https://openalex.org/W2348630533"],"abstract_inverted_index":{"We":[0],"propose":[1],"an":[2],"electrical":[3],"detection":[4],"method":[5,42,61],"for":[6],"peripheral":[7],"circuit":[8],"(PERI)":[9],"\u2018open\u2019":[10],"random":[11],"defects.":[12],"This":[13],"brand":[14],"new":[15],"screening":[16],"methodology":[17],"detects":[18],"only":[19],"PERI":[20],"defects":[21],"by":[22],"independently":[23],"controlling":[24],"the":[25],"supply":[26],"voltage":[27],"(V":[28],"<inf":[29],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[30],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DD</inf>":[31],")":[32],"of":[33],"each":[34],"circuitry":[35],"array":[36],"at":[37],"low":[38],"temperature.":[39],"The":[40],"proposed":[41,60],"is":[43],"confirmed":[44],"based":[45],"on":[46],"experimental,":[47],"simulation,":[48],"and":[49],"physical":[50],"analysis":[51],"results.":[52],"Compared":[53],"with":[54],"conventional":[55],"function":[56],"test":[57],"items,":[58],"our":[59],"shows":[62],">50%":[63],"error":[64],"reduction.":[65]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}