{"id":"https://openalex.org/W4410395304","doi":"https://doi.org/10.1109/irps48204.2025.10983844","title":"Latch-Up Over-Current Protection Design with Power Restarted Function","display_name":"Latch-Up Over-Current Protection Design with Power Restarted Function","publication_year":2025,"publication_date":"2025-03-30","ids":{"openalex":"https://openalex.org/W4410395304","doi":"https://doi.org/10.1109/irps48204.2025.10983844"},"language":"en","primary_location":{"id":"doi:10.1109/irps48204.2025.10983844","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10983844","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041662706","display_name":"Shih-Cheng Huang","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Shih-Cheng Huang","raw_affiliation_strings":["National Yang Ming Chiao Tung University,Institute of Pioneer Semiconductor Innovation,Hsinchu,Taiwan"],"affiliations":[{"raw_affiliation_string":"National Yang Ming Chiao Tung University,Institute of Pioneer Semiconductor Innovation,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043540734","display_name":"Ming\u2010Dou Ker","orcid":"https://orcid.org/0000-0003-3622-181X"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Dou Ker","raw_affiliation_strings":["National Yang Ming Chiao Tung University,Institute of Electronics,Hsinchu,Taiwan"],"affiliations":[{"raw_affiliation_string":"National Yang Ming Chiao Tung University,Institute of Electronics,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I148366613"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5041662706"],"corresponding_institution_ids":["https://openalex.org/I148366613"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10845519,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9921000003814697,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9050999879837036,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12699","display_name":"Electromagnetic Launch and Propulsion Technology","score":0.9043999910354614,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.5106657147407532},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5103287100791931},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5051565766334534},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.48443320393562317},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4797438383102417},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.38984864950180054},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16550731658935547},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12973055243492126}],"concepts":[{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.5106657147407532},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5103287100791931},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5051565766334534},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.48443320393562317},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4797438383102417},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.38984864950180054},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16550731658935547},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12973055243492126},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48204.2025.10983844","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10983844","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7099999785423279,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1494199278","https://openalex.org/W1968622030","https://openalex.org/W2110712997","https://openalex.org/W2155491659","https://openalex.org/W2479957002","https://openalex.org/W2481205792","https://openalex.org/W4251109733","https://openalex.org/W4295046596","https://openalex.org/W4312494245"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W1982412832","https://openalex.org/W4244464241","https://openalex.org/W2384573129","https://openalex.org/W2351224547","https://openalex.org/W2358945257","https://openalex.org/W4318692582","https://openalex.org/W4368618351","https://openalex.org/W2006863447","https://openalex.org/W4406527385"],"abstract_inverted_index":{"Latch-up":[0],"is":[1,47,111],"a":[2,24,65],"reliability":[3],"issue":[4],"in":[5],"CMOS":[6],"integrated":[7],"circuits":[8],"caused":[9,118],"by":[10,55,119],"the":[11,28,37,58,62,78,106,125,133,146],"parasitic":[12],"silicon-controlled":[13],"rectifier":[14],"(SCR)":[15],"structure.":[16],"When":[17],"it":[18,22,54],"was":[19],"triggered":[20],"on,":[21],"creates":[23],"low-impedance":[25],"path":[26],"between":[27],"power":[29,84,134],"(VDD)":[30],"and":[31,60,76,91,102],"ground":[32],"(Vss)":[33],"to":[34,49,71,97,114,145],"burn":[35],"out":[36],"silicon":[38],"chip.":[39],"In":[40],"this":[41],"work,":[42],"an":[43,138],"over-current":[44,108,126,139],"protection":[45,109,127],"design":[46,69],"proposed":[48],"detect":[50],"latch-up":[51,73,100,107,149],"occurrence,":[52],"deactivate":[53],"turning":[56],"off":[57],"power,":[59],"reinitialize":[61],"circuit":[63,80,94,110,128],"after":[64],"programmable":[66,87],"delay.":[67],"This":[68],"aims":[70],"mitigate":[72],"hardware":[74],"failure":[75],"restore":[77],"normal":[79],"operation":[81],"through":[82],"timely":[83],"cycling.":[85],"The":[86],"delay,":[88],"auto-restart":[89],"function,":[90],"independent":[92],"control":[93],"are":[95],"designed":[96,113],"enhance":[98],"both":[99],"immunity":[101],"application":[103],"flexibility.":[104],"Additionally,":[105],"also":[112],"resist":[115],"false":[116],"triggering":[117],"inrush":[120],"current.":[121],"Through":[122],"experimental":[123],"results,":[124],"can":[129],"promptly":[130],"shut":[131],"down":[132],"supply":[135],"upon":[136],"detecting":[137],"event,":[140],"effectively":[141],"preventing":[142],"irreversible":[143],"damage":[144],"chip":[147],"from":[148],"incidents.":[150]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}