{"id":"https://openalex.org/W4410394418","doi":"https://doi.org/10.1109/irps48204.2025.10983533","title":"Evidence for Avalanche Operation in Sub-Micrometer Power GaN HEMTs with p-GaN Gate","display_name":"Evidence for Avalanche Operation in Sub-Micrometer Power GaN HEMTs with p-GaN Gate","publication_year":2025,"publication_date":"2025-03-30","ids":{"openalex":"https://openalex.org/W4410394418","doi":"https://doi.org/10.1109/irps48204.2025.10983533"},"language":"en","primary_location":{"id":"doi:10.1109/irps48204.2025.10983533","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10983533","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5092421033","display_name":"Riccardo Fraccaroli","orcid":"https://orcid.org/0009-0001-6184-6697"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Riccardo Fraccaroli","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,PD,Italy"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,PD,Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5117554501","display_name":"Matteo Dell\u2019Andrea","orcid":"https://orcid.org/0009-0000-5248-2572"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Matteo Dell\u2019Andrea","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,PD,Italy"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,PD,Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024918616","display_name":"Manuel Fregolent","orcid":"https://orcid.org/0000-0003-0801-2260"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Manuel Fregolent","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,PD,Italy"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,PD,Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062545897","display_name":"Mirco Boito","orcid":"https://orcid.org/0000-0002-8920-1348"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Mirco Boito","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,PD,Italy"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,PD,Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064109540","display_name":"Carlo De Santi","orcid":"https://orcid.org/0000-0001-6064-077X"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Carlo De Santi","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,PD,Italy"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,PD,Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101587480","display_name":"Gaudenzio Meneghesso","orcid":"https://orcid.org/0000-0002-6715-4827"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gaudenzio Meneghesso","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,PD,Italy"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,PD,Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Enrico Zanonia Eleonora Canato","orcid":null},"institutions":[{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Enrico Zanonia Eleonora Canato","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,MB,20864"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,MB,20864","institution_ids":["https://openalex.org/I4210124177"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085031554","display_name":"Isabella Rossetto","orcid":"https://orcid.org/0000-0002-9397-6146"},"institutions":[{"id":"https://openalex.org/I4210124177","display_name":"STMicroelectronics (Czechia)","ror":"https://ror.org/03c7ss521","country_code":"CZ","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210124177"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Isabella Rossetto","raw_affiliation_strings":["STMicroelectronics,Agrate Brianza,MB,20864"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Agrate Brianza,MB,20864","institution_ids":["https://openalex.org/I4210124177"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Alessio Pirani","orcid":null},"institutions":[{"id":"https://openalex.org/I4210106035","display_name":"STMicroelectronics (United States)","ror":"https://ror.org/01f8c3y78","country_code":"US","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210106035"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alessio Pirani","raw_affiliation_strings":["STMicroelectronics,Cornaredo,MI,20007"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Cornaredo,MI,20007","institution_ids":["https://openalex.org/I4210106035"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107749495","display_name":"Giansalvo Pizzo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210106035","display_name":"STMicroelectronics (United States)","ror":"https://ror.org/01f8c3y78","country_code":"US","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210106035"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Giansalvo Pizzo","raw_affiliation_strings":["STMicroelectronics,Cornaredo,MI,20007"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Cornaredo,MI,20007","institution_ids":["https://openalex.org/I4210106035"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084147164","display_name":"Cristina Miccoli","orcid":"https://orcid.org/0009-0007-4939-3625"},"institutions":[{"id":"https://openalex.org/I4210106035","display_name":"STMicroelectronics (United States)","ror":"https://ror.org/01f8c3y78","country_code":"US","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210106035"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Cristina Miccoli","raw_affiliation_strings":["STMicroelectronics,Catania,CT,95121"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Catania,CT,95121","institution_ids":["https://openalex.org/I4210106035"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110494483","display_name":"Alfio Russo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210106035","display_name":"STMicroelectronics (United States)","ror":"https://ror.org/01f8c3y78","country_code":"US","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210106035"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alfio Russo","raw_affiliation_strings":["STMicroelectronics,Catania,CT,95121"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Catania,CT,95121","institution_ids":["https://openalex.org/I4210106035"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044409603","display_name":"Maria Eloisa Castagna","orcid":"https://orcid.org/0000-0002-7864-6085"},"institutions":[{"id":"https://openalex.org/I4210106035","display_name":"STMicroelectronics (United States)","ror":"https://ror.org/01f8c3y78","country_code":"US","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210106035"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Maria Eloisa Castagna","raw_affiliation_strings":["STMicroelectronics,Catania,CT,95121"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Catania,CT,95121","institution_ids":["https://openalex.org/I4210106035"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110453844","display_name":"Ferdinando Iucolano","orcid":null},"institutions":[{"id":"https://openalex.org/I4210106035","display_name":"STMicroelectronics (United States)","ror":"https://ror.org/01f8c3y78","country_code":"US","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210106035"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ferdinando Iucolano","raw_affiliation_strings":["STMicroelectronics,Catania,CT,95121"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Catania,CT,95121","institution_ids":["https://openalex.org/I4210106035"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059611177","display_name":"Matteo Meneghini","orcid":"https://orcid.org/0000-0003-2421-505X"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Matteo Meneghini","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,PD,Italy"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,PD,Italy","institution_ids":["https://openalex.org/I138689650"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":15,"corresponding_author_ids":["https://openalex.org/A5092421033"],"corresponding_institution_ids":["https://openalex.org/I138689650"],"apc_list":null,"apc_paid":null,"fwci":2.2754,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.87159493,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9837999939918518,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10022","display_name":"Semiconductor Quantum Structures and Devices","score":0.972100019454956,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.7550511956214905},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.692826509475708},{"id":"https://openalex.org/keywords/wide-bandgap-semiconductor","display_name":"Wide-bandgap semiconductor","score":0.6167151927947998},{"id":"https://openalex.org/keywords/gallium-nitride","display_name":"Gallium nitride","score":0.612140953540802},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.48226219415664673},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4425807595252991},{"id":"https://openalex.org/keywords/avalanche-breakdown","display_name":"Avalanche breakdown","score":0.4315425455570221},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.31067970395088196},{"id":"https://openalex.org/keywords/breakdown-voltage","display_name":"Breakdown voltage","score":0.16025549173355103},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.14460641145706177},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11888617277145386},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10963872075080872},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10633036494255066}],"concepts":[{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.7550511956214905},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.692826509475708},{"id":"https://openalex.org/C189278905","wikidata":"https://www.wikidata.org/wiki/Q2157708","display_name":"Wide-bandgap semiconductor","level":2,"score":0.6167151927947998},{"id":"https://openalex.org/C2778871202","wikidata":"https://www.wikidata.org/wiki/Q411713","display_name":"Gallium nitride","level":3,"score":0.612140953540802},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.48226219415664673},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4425807595252991},{"id":"https://openalex.org/C33652038","wikidata":"https://www.wikidata.org/wiki/Q175906","display_name":"Avalanche breakdown","level":4,"score":0.4315425455570221},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.31067970395088196},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.16025549173355103},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.14460641145706177},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11888617277145386},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10963872075080872},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10633036494255066},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps48204.2025.10983533","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10983533","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:www.research.unipd.it:11577/3561494","is_oa":false,"landing_page_url":"https://hdl.handle.net/11577/3561494","pdf_url":null,"source":{"id":"https://openalex.org/S4377196283","display_name":"Research Padua  Archive (University of Padua)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I138689650","host_organization_name":"University of Padua","host_organization_lineage":["https://openalex.org/I138689650"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6399999856948853,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W2068111547","https://openalex.org/W2111051464","https://openalex.org/W2135780270","https://openalex.org/W2191701978","https://openalex.org/W2209714492","https://openalex.org/W2526772450","https://openalex.org/W2554381269","https://openalex.org/W2945025225","https://openalex.org/W2976926207","https://openalex.org/W3048927839","https://openalex.org/W3092199139","https://openalex.org/W3153030198","https://openalex.org/W4225307194","https://openalex.org/W4386222517","https://openalex.org/W4389109655","https://openalex.org/W4404563756"],"related_works":["https://openalex.org/W2000487630","https://openalex.org/W2017113730","https://openalex.org/W2109359929","https://openalex.org/W2654716541","https://openalex.org/W2037936622","https://openalex.org/W1988167421","https://openalex.org/W4297582192","https://openalex.org/W2533157014","https://openalex.org/W4289782876","https://openalex.org/W4385624134"],"abstract_inverted_index":{"We":[0],"demonstrate":[1,38],"the":[2,53,83,86,114,117,128,135,138,148,159],"existence":[3],"of":[4,35,116,130,137,158],"sustainable":[5,59,98],"avalanche":[6,160],"operation":[7],"on":[8],"100":[9],"V":[10,51],"lateral-":[11],"power":[12],"GaN":[13],"HEMT":[14],"with":[15,145],"submicrometer":[16],"gate":[17],"length.":[18],"Results":[19],"show":[20],"that:":[21],"(a)":[22],"current-voltage":[23],"I<inf":[24],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[25,27,72,95],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DS</inf>-V<inf":[26],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DS</inf>":[28],"measurements":[29,126,152],"carried":[30],"out":[31],"as":[32],"a":[33,39,76,106,154],"function":[34],"device":[36,55],"geometry":[37],"significant":[40],"and":[41,103,122],"repeatable":[42],"increase":[43],"in":[44,67,90],"drain":[45],"current":[46,79],"for":[47],"voltages":[48],"around":[49],"160":[50],"(for":[52],"standard":[54],"geometry),":[56],"corresponding":[57],"to":[58,113,134],"breakdown":[60,99,115],"operation.":[61],"Such":[62],"phenomenon":[63],"is":[64,100],"only":[65],"observed":[66],"\u201creference\u201d":[68],"pinch-off":[69],"conditions":[70,93],"(V<inf":[71,94],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">GS</inf>=0V),":[73],"i.e.":[74],"when":[75],"small":[77],"sub-threshold":[78],"can":[80],"flow":[81],"through":[82],"devices.":[84],"On":[85],"other":[87],"hand":[88],"(b),":[89],"\u201cstrong":[91],"pinch-off\u201d":[92],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">GS</inf>=-7":[96],"V),":[97],"not":[101],"present,":[102],"devices":[104],"reach":[105],"catastrophic":[107],"failure":[108],"(at":[109],"higher":[110],"voltage),":[111],"due":[112],"dielectric":[118],"between":[119],"field":[120],"plate":[121],"drain.":[123],"c)":[124],"electroluminescence":[125],"indicate":[127,153],"presence":[129],"band-to-band":[131],"luminescence,":[132],"ascribed":[133],"recombination":[136],"holes":[139],"generated":[140],"by":[141],"impact":[142],"ionization":[143],"(i.i.)":[144],"electrons":[146],"near":[147],"source.":[149],"d)":[150],"temperature-dependent":[151],"positive":[155],"temperature":[156],"coefficient":[157],"voltage.":[161]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}
