{"id":"https://openalex.org/W4410394272","doi":"https://doi.org/10.1109/irps48204.2025.10983442","title":"Distinct Signatures of Self-Heating and Trap Dynamics on the AC Y-Parameters of Advanced n-MOSFETs","display_name":"Distinct Signatures of Self-Heating and Trap Dynamics on the AC Y-Parameters of Advanced n-MOSFETs","publication_year":2025,"publication_date":"2025-03-30","ids":{"openalex":"https://openalex.org/W4410394272","doi":"https://doi.org/10.1109/irps48204.2025.10983442"},"language":"en","primary_location":{"id":"doi:10.1109/irps48204.2025.10983442","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10983442","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hdl.handle.net/11380/1397828","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5105424675","display_name":"Lisa Tondelli","orcid":"https://orcid.org/0000-0002-6917-205X"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]},{"id":"https://openalex.org/I4210161797","display_name":"Ferrari (Italy)","ror":"https://ror.org/05p859a12","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210161797"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Tondelli","raw_affiliation_strings":["University of Modena and Reggio Emilia,Department of Engineering “Enzo Ferrari”,Modena,Italy,1125"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Modena and Reggio Emilia,Department of Engineering “Enzo Ferrari”,Modena,Italy,1125","institution_ids":["https://openalex.org/I122346577","https://openalex.org/I4210161797"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070534850","display_name":"A.J. Scholten","orcid":"https://orcid.org/0000-0003-1861-883X"},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"A.J. Scholten","raw_affiliation_strings":["NXP Semiconductors,Eindhoven and Nijmegen,The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors,Eindhoven and Nijmegen,The Netherlands","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5117554480","display_name":"J. Van Beurden","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"J. Van Beurden","raw_affiliation_strings":["NXP Semiconductors,Eindhoven and Nijmegen,The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors,Eindhoven and Nijmegen,The Netherlands","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074771815","display_name":"Ralf Pijper","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"R.M.T. Pijper","raw_affiliation_strings":["NXP Semiconductors,Eindhoven and Nijmegen,The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors,Eindhoven and Nijmegen,The Netherlands","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007746953","display_name":"R. Asanovski","orcid":"https://orcid.org/0000-0001-7127-6184"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]},{"id":"https://openalex.org/I4210161797","display_name":"Ferrari (Italy)","ror":"https://ror.org/05p859a12","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210161797"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"R. Asanovski","raw_affiliation_strings":["University of Modena and Reggio Emilia,Department of Engineering “Enzo Ferrari”,Modena,Italy,1125"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Modena and Reggio Emilia,Department of Engineering “Enzo Ferrari”,Modena,Italy,1125","institution_ids":["https://openalex.org/I122346577","https://openalex.org/I4210161797"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103464907","display_name":"Thanh Vinh Dinh","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"T.V. Dinh","raw_affiliation_strings":["NXP Semiconductors,Austin,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors,Austin,USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008355061","display_name":"L. Selmi","orcid":"https://orcid.org/0000-0001-8688-4326"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]},{"id":"https://openalex.org/I4210161797","display_name":"Ferrari (Italy)","ror":"https://ror.org/05p859a12","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210161797"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Selmi","raw_affiliation_strings":["University of Modena and Reggio Emilia,Department of Engineering “Enzo Ferrari”,Modena,Italy,1125"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Modena and Reggio Emilia,Department of Engineering “Enzo Ferrari”,Modena,Italy,1125","institution_ids":["https://openalex.org/I122346577","https://openalex.org/I4210161797"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.5352,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.65832333,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"01","last_page":"05"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/trap","display_name":"Trap (plumbing)","score":0.825766384601593},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5242312550544739},{"id":"https://openalex.org/keywords/dynamics","display_name":"Dynamics (music)","score":0.5038167834281921},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.41195249557495117},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3837423622608185},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.34604066610336304},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1455557942390442},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.0923132598400116},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08860138058662415}],"concepts":[{"id":"https://openalex.org/C121099081","wikidata":"https://www.wikidata.org/wiki/Q665580","display_name":"Trap (plumbing)","level":2,"score":0.825766384601593},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5242312550544739},{"id":"https://openalex.org/C145912823","wikidata":"https://www.wikidata.org/wiki/Q113558","display_name":"Dynamics (music)","level":2,"score":0.5038167834281921},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41195249557495117},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3837423622608185},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.34604066610336304},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1455557942390442},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.0923132598400116},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08860138058662415},{"id":"https://openalex.org/C153294291","wikidata":"https://www.wikidata.org/wiki/Q25261","display_name":"Meteorology","level":1,"score":0.0},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/irps48204.2025.10983442","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10983442","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:iris.unimore.it:11380/1397828","is_oa":true,"landing_page_url":"https://hdl.handle.net/11380/1397828","pdf_url":null,"source":{"id":"https://openalex.org/S4306400718","display_name":"IRIS UNIMORE (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:zenodo.org:17395402","is_oa":true,"landing_page_url":"https://doi.org/10.1109/IRPS48204.2025.10983442","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IRPS, 2025 IEEE International Reliability Physics Symposium, Monterey, California, 30 March 2025 - 03 April 2025","raw_type":"info:eu-repo/semantics/conferencePaper"}],"best_oa_location":{"id":"pmh:oai:iris.unimore.it:11380/1397828","is_oa":true,"landing_page_url":"https://hdl.handle.net/11380/1397828","pdf_url":null,"source":{"id":"https://openalex.org/S4306400718","display_name":"IRIS UNIMORE (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.46000000834465027,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1983748953","https://openalex.org/W2019053242","https://openalex.org/W2037786155","https://openalex.org/W2067111972","https://openalex.org/W2102456325","https://openalex.org/W2116966151","https://openalex.org/W2155094265","https://openalex.org/W2165560592","https://openalex.org/W2883958810","https://openalex.org/W3011665222","https://openalex.org/W3127549302","https://openalex.org/W3144105863","https://openalex.org/W3194971064","https://openalex.org/W4403210772","https://openalex.org/W4403677328"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036"],"abstract_inverted_index":{"This":[0],"paper":[1],"explores":[2],"the":[3,16,45,61,88,95],"frequency":[4],"dispersion":[5,22],"of":[6,19,30,47,94],"Y-parameters":[7],"in":[8],"advanced":[9],"FDSOI":[10],"MOSFETs":[11],"and":[12,33,50,57,71,98],"FinFETs,":[13],"focusing":[14],"on":[15,54],"primary":[17],"causes":[18],"output":[20,90],"conductance":[21,91],"across":[23],"varying":[24],"gate":[25],"voltages.":[26],"Through":[27],"a":[28],"combination":[29],"experimental":[31],"measurements":[32],"numerical":[34],"simulations":[35],"using":[36,87],"physical":[37],"TCAD,":[38],"we":[39],"identify":[40],"distinct":[41],"patterns":[42],"that":[43],"differentiate":[44],"effects":[46,66],"self-heating":[48,105],"(SH)":[49],"trapping-detrapping":[51],"(TD)":[52],"mechanisms":[53],"device":[55,96,101],"capacitances":[56],"conductances.":[58],"By":[59],"determining":[60],"conditions":[62],"under":[63,104],"which":[64],"SH":[65],"dominate":[67],"over":[68],"TD":[69],"ones,":[70],"vice":[72],"versa,":[73],"our":[74],"analysis":[75],"provides":[76],"valuable":[77],"insights":[78],"for":[79],"technology":[80],"optimization,":[81],"circuit":[82],"design,":[83],"thermal":[84],"resistance":[85],"extraction":[86],"AC":[89],"method,":[92],"estimation":[93],"temperature":[97],"more":[99],"accurate":[100],"lifetime":[102],"predictions":[103],"stress":[106],"conditions.":[107]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}