{"id":"https://openalex.org/W4410394172","doi":"https://doi.org/10.1109/irps48204.2025.10983392","title":"Physical Insights into High Current Collapse under ON-state Stress in RF GaN HEMTs","display_name":"Physical Insights into High Current Collapse under ON-state Stress in RF GaN HEMTs","publication_year":2025,"publication_date":"2025-03-30","ids":{"openalex":"https://openalex.org/W4410394172","doi":"https://doi.org/10.1109/irps48204.2025.10983392"},"language":"en","primary_location":{"id":"doi:10.1109/irps48204.2025.10983392","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10983392","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069630589","display_name":"Amratansh Gupta","orcid":"https://orcid.org/0000-0003-4313-3463"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Amratansh Gupta","raw_affiliation_strings":["imec,Leuven,Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076194686","display_name":"Hao Yu","orcid":"https://orcid.org/0000-0002-1976-0259"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Hao Yu","raw_affiliation_strings":["imec,Leuven,Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013615458","display_name":"Sachin Yadav","orcid":"https://orcid.org/0000-0003-4530-2603"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Sachin Yadav","raw_affiliation_strings":["imec,Leuven,Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016143962","display_name":"A. Alian","orcid":"https://orcid.org/0000-0003-3463-416X"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"AliReza Alian","raw_affiliation_strings":["imec,Leuven,Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066899300","display_name":"Uthayasankaran Peralagu","orcid":"https://orcid.org/0000-0001-9166-4408"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Uthavasankaran Peralagu","raw_affiliation_strings":["imec,Leuven,Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010853629","display_name":"Esan Jang","orcid":"https://orcid.org/0000-0001-5600-7656"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"E-San Jang","raw_affiliation_strings":["imec,Leuven,Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Ying-Chun Kuo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ying-Chun Kuo","raw_affiliation_strings":["imec,Leuven,Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046242688","display_name":"Nadine Collaert","orcid":"https://orcid.org/0000-0002-8062-3165"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Nadine Collaert","raw_affiliation_strings":["imec,Leuven,Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085080900","display_name":"Bertrand Parvais","orcid":"https://orcid.org/0000-0003-0769-7069"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Bertrand Parvais","raw_affiliation_strings":["imec,Leuven,Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9218,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.73404918,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9825000166893005,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9718000292778015,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6886138319969177},{"id":"https://openalex.org/keywords/wide-bandgap-semiconductor","display_name":"Wide-bandgap semiconductor","score":0.6396377682685852},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6357851028442383},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.5750817060470581},{"id":"https://openalex.org/keywords/gallium-nitride","display_name":"Gallium nitride","score":0.5540298819541931},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.5400740504264832},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.537945568561554},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.4559074938297272},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3411005139350891},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.19475948810577393},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18729841709136963},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.1808362901210785},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.09454312920570374}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6886138319969177},{"id":"https://openalex.org/C189278905","wikidata":"https://www.wikidata.org/wiki/Q2157708","display_name":"Wide-bandgap semiconductor","level":2,"score":0.6396377682685852},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6357851028442383},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.5750817060470581},{"id":"https://openalex.org/C2778871202","wikidata":"https://www.wikidata.org/wiki/Q411713","display_name":"Gallium nitride","level":3,"score":0.5540298819541931},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.5400740504264832},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.537945568561554},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.4559074938297272},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3411005139350891},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.19475948810577393},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18729841709136963},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.1808362901210785},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.09454312920570374},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/irps48204.2025.10983392","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10983392","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:vubissmart:VUBISSMART:2000:212789","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306402573","display_name":"VUBIR (Vrije Universiteit Brussel)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I13469542","host_organization_name":"Vrije Universiteit Brussel","host_organization_lineage":["https://openalex.org/I13469542"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"},{"id":"pmh:oai:vubissmart:VUBISSMART:2000:259654","is_oa":false,"landing_page_url":"https://biblio.vub.ac.be/vubir/physical-insights-into-high-current-collapse-under-onstate-stress-in-rf-gan-hemts(6f74f66c-0c8e-4709-a426-ed89d196809e).html","pdf_url":null,"source":{"id":"https://openalex.org/S4306402573","display_name":"VUBIR (Vrije Universiteit Brussel)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I13469542","host_organization_name":"Vrije Universiteit Brussel","host_organization_lineage":["https://openalex.org/I13469542"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7900000214576721,"display_name":"Climate action","id":"https://metadata.un.org/sdg/13"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2743457035","https://openalex.org/W3006010459","https://openalex.org/W3139082809","https://openalex.org/W4313064048","https://openalex.org/W4317793339","https://openalex.org/W4317793510","https://openalex.org/W4387717611","https://openalex.org/W4391594536","https://openalex.org/W4396949450"],"related_works":["https://openalex.org/W2000487630","https://openalex.org/W2017113730","https://openalex.org/W2109359929","https://openalex.org/W2654716541","https://openalex.org/W2037936622","https://openalex.org/W1988167421","https://openalex.org/W4297582192","https://openalex.org/W2533157014","https://openalex.org/W4289782876","https://openalex.org/W4385624134"],"abstract_inverted_index":{"This":[0,55],"work":[1,56],"presents":[2],"a":[3,37,69],"study":[4],"focused":[5],"on":[6],"current":[7],"collapse":[8],"(CC)":[9],"in":[10],"several":[11],"RF":[12,74],"GaN-on-Si":[13,75],"HEMT":[14,76],"architectures":[15],"under":[16,64,93],"ON-state":[17,29,32,66,95],"stress":[18,33,40,50,67],"and":[19,48],"offers":[20],"insights":[21],"into":[22],"the":[23,52,58,65,86,94],"significantly":[24,90],"high":[25],"CC":[26,63,92],"observed":[27],"during":[28],"stress.":[30,96],"The":[31],"is":[34],"identified":[35],"as":[36],"more":[38],"detrimental":[39],"state":[41],"to":[42,46],"device":[43,77],"reliability":[44],"compared":[45],"SemiON":[47],"OFF-state":[49],"at":[51,85],"same":[53],"VDS.":[54],"explores":[57],"underlying":[59],"physical":[60],"mechanism":[61],"of":[62,72],"by":[68],"comprehensive":[70],"comparison":[71],"various":[73],"architectures.":[78],"We":[79],"find":[80],"that":[81],"electric":[82],"field":[83],"engineering":[84],"gate":[87],"corner":[88],"can":[89],"reduce":[91]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}