{"id":"https://openalex.org/W4410395349","doi":"https://doi.org/10.1109/irps48204.2025.10983054","title":"Understanding Correlation Between Memory Window Closure, Leakage and Read Delay Effects for FEFET Reliability Improvement: Role of IL and FE Traps","display_name":"Understanding Correlation Between Memory Window Closure, Leakage and Read Delay Effects for FEFET Reliability Improvement: Role of IL and FE Traps","publication_year":2025,"publication_date":"2025-03-30","ids":{"openalex":"https://openalex.org/W4410395349","doi":"https://doi.org/10.1109/irps48204.2025.10983054"},"language":"en","primary_location":{"id":"doi:10.1109/irps48204.2025.10983054","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10983054","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086197036","display_name":"Priyankka Gundlapudi Ravikumar","orcid":"https://orcid.org/0000-0001-7454-9088"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Priyankka Ravikumar","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,GA,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,GA,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083166491","display_name":"Andrea Padovani","orcid":"https://orcid.org/0000-0003-1145-5257"},"institutions":[{"id":"https://openalex.org/I4210161797","display_name":"Ferrari (Italy)","ror":"https://ror.org/05p859a12","country_code":"IT","type":"company","lineage":["https://openalex.org/I4210161797"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Andrea Padovani","raw_affiliation_strings":["UNIMORE,Engineering Department “Enzo Ferrari”,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UNIMORE,Engineering Department “Enzo Ferrari”,Italy","institution_ids":["https://openalex.org/I4210161797"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111340528","display_name":"Prasanna Venkatesan","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Prasanna Venkatesan","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,GA,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,GA,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026330441","display_name":"Chinsung Park","orcid":"https://orcid.org/0000-0001-9631-2866"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chinsung Park","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,GA,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,GA,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082159966","display_name":"Nashrah Afroze","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nashrah Afroze","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,GA,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,GA,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061080492","display_name":"Mengkun Tian","orcid":"https://orcid.org/0000-0003-2790-7799"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mengkun Tian","raw_affiliation_strings":["Institute of Materials,GA,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Materials,GA,USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036105393","display_name":"Suman Datta","orcid":"https://orcid.org/0000-0001-6044-5173"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Suman Datta","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,GA,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,GA,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054894631","display_name":"Shimeng Yu","orcid":"https://orcid.org/0000-0002-0068-3652"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shimeng Yu","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,GA,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,GA,USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003731777","display_name":"Luca Larcher","orcid":"https://orcid.org/0000-0002-9139-349X"},"institutions":[{"id":"https://openalex.org/I4210165146","display_name":"Applied Materials (Germany)","ror":"https://ror.org/05ejpyv46","country_code":"DE","type":"company","lineage":["https://openalex.org/I193427800","https://openalex.org/I4210165146"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Luca Larcher","raw_affiliation_strings":["Applied Materials"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Materials","institution_ids":["https://openalex.org/I4210165146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062522713","display_name":"Gaurav Thareja","orcid":null},"institutions":[{"id":"https://openalex.org/I4210165146","display_name":"Applied Materials (Germany)","ror":"https://ror.org/05ejpyv46","country_code":"DE","type":"company","lineage":["https://openalex.org/I193427800","https://openalex.org/I4210165146"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Gaurav Thareja","raw_affiliation_strings":["Applied Materials"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Applied Materials","institution_ids":["https://openalex.org/I4210165146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049163544","display_name":"Asif Islam Khan","orcid":"https://orcid.org/0000-0003-4369-106X"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Asif Khan","raw_affiliation_strings":["Georgia Institute of Technology,School of Electrical and Computer Engineering,GA,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology,School of Electrical and Computer Engineering,GA,USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.9408,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.95604438,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.9750999808311462,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.6180458664894104},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5898759961128235},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49787259101867676},{"id":"https://openalex.org/keywords/closure","display_name":"Closure (psychology)","score":0.44650083780288696},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.43458855152130127},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38406646251678467},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.328302264213562},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17711758613586426},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11541250348091125},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.09250149130821228}],"concepts":[{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.6180458664894104},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5898759961128235},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49787259101867676},{"id":"https://openalex.org/C146834321","wikidata":"https://www.wikidata.org/wiki/Q2979672","display_name":"Closure (psychology)","level":2,"score":0.44650083780288696},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43458855152130127},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38406646251678467},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.328302264213562},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17711758613586426},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11541250348091125},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.09250149130821228},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C34447519","wikidata":"https://www.wikidata.org/wiki/Q179522","display_name":"Market economy","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps48204.2025.10983054","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10983054","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:iris.unimore.it:11380/1378350","is_oa":false,"landing_page_url":"https://hdl.handle.net/11380/1378350","pdf_url":null,"source":{"id":"https://openalex.org/S4306400718","display_name":"IRIS UNIMORE (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1987850127","https://openalex.org/W2482978312","https://openalex.org/W2769364246","https://openalex.org/W3095256020","https://openalex.org/W3204638218","https://openalex.org/W4310267017","https://openalex.org/W4317792996","https://openalex.org/W4317794237","https://openalex.org/W4320002711","https://openalex.org/W4385212767","https://openalex.org/W4409185432"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4233600955","https://openalex.org/W4322734194","https://openalex.org/W3116237489","https://openalex.org/W4404996554","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935"],"abstract_inverted_index":{"Memory":[0],"window":[1],"(MW)":[2],"closure,":[3,76,128],"read":[4,77,124],"delay,":[5,78],"and":[6,35,67,71,79,92,111,126],"gate":[7],"leakage":[8,80,141],"are":[9,108,112],"three":[10,45],"key":[11],"reliability":[12,187],"challenges":[13],"in":[14,47,99,120,179],"ferroelectric":[15],"(FE)":[16],"field-effect":[17],"transistors":[18],"(FEFETs),":[19],"all":[20],"of":[21,43,53,149,169,175,188],"which":[22,152],"have":[23],"traditionally":[24],"been":[25],"analyzed":[26],"separately.":[27],"In":[28],"this":[29],"work,":[30],"we":[31,83,138],"exploit":[32],"dedicated":[33],"experiments":[34],"device":[36],"simulations":[37],"to":[38,114,171,184],"present":[39],"a":[40,50,130],"detailed":[41],"study":[42],"these":[44],"mechanisms":[46],"Si-FEFETs":[48],"with":[49,123],"10nm":[51],"layer":[52,102],"FE":[54],"HZO.":[55],"The":[56,167],"results":[57],"reveal":[58],"critical":[59],"insights":[60],"into":[61],"the":[62,72,100,134,147,173,180,189],"interplay":[63],"between":[64,74,133],"trap":[65,86],"generation":[66,87,148],"polarization":[68],"switching":[69],"(PS),":[70],"correlation":[73,132],"MW":[75,121,127,165],"current.":[81],"First,":[82],"show":[84,139],"that":[85,140],"is":[88,144,153,161,182],"accelerated":[89],"by":[90,146,155],"PS":[91,105],"initially":[93],"(up":[94],"to$5\\times":[95],"10^{4}$cycles)":[96],"occurs":[97],"mainly":[98],"interfacial":[101],"(IL).":[103],"These":[104],"induced":[106],"traps":[107,110],"slow":[109,176],"found":[113],"be":[115],"responsible":[116],"for":[117],"both":[118],"reduction":[119],"recovery":[122],"delay":[125],"demonstrating":[129],"strong":[131],"two":[135],"mechanisms.":[136],"Finally,":[137],"current":[142],"increase":[143],"controlled":[145],"HZO":[150],"traps,":[151],"triggered":[154],"internal":[156],"field":[157],"redistribution":[158],"once":[159],"IL":[160,181],"highly":[162],"degraded":[163],"(after":[164],"closure).":[166],"engineering":[168],"FEFETs":[170],"minimize":[172],"formation":[174],"(de)trapping":[177],"defects":[178],"essential":[183],"improve":[185],"overall":[186],"FEFET":[190],"device.":[191]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}