{"id":"https://openalex.org/W4410394813","doi":"https://doi.org/10.1109/irps48204.2025.10982736","title":"Cycling Induced Imprint Phenomenon at Intermediate State used for Multi-Level Operation in HfO<sub>2</sub>-FeFET","display_name":"Cycling Induced Imprint Phenomenon at Intermediate State used for Multi-Level Operation in HfO<sub>2</sub>-FeFET","publication_year":2025,"publication_date":"2025-03-30","ids":{"openalex":"https://openalex.org/W4410394813","doi":"https://doi.org/10.1109/irps48204.2025.10982736"},"language":"en","primary_location":{"id":"doi:10.1109/irps48204.2025.10982736","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10982736","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053664688","display_name":"Viktoria Schlykow","orcid":"https://orcid.org/0000-0001-9341-9983"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Viktoria Schlykow","raw_affiliation_strings":["Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan"],"affiliations":[{"raw_affiliation_string":"Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104092789","display_name":"Kunifumi Suzuki","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kunifumi Suzuki","raw_affiliation_strings":["Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan"],"affiliations":[{"raw_affiliation_string":"Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022450843","display_name":"Yoko Yoshimura","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yoko Yoshimura","raw_affiliation_strings":["Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan"],"affiliations":[{"raw_affiliation_string":"Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103981140","display_name":"Hidesato Ishida","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hidesato Ishida","raw_affiliation_strings":["Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan"],"affiliations":[{"raw_affiliation_string":"Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112769942","display_name":"Kiwamu Sakuma","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kiwamu Sakuma","raw_affiliation_strings":["Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan"],"affiliations":[{"raw_affiliation_string":"Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113910685","display_name":"Kazuhiro Matsuo","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kazuhiro Matsuo","raw_affiliation_strings":["Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan"],"affiliations":[{"raw_affiliation_string":"Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087391821","display_name":"Masumi Saitoh","orcid":"https://orcid.org/0000-0001-6469-7992"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Masumi Saitoh","raw_affiliation_strings":["Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan"],"affiliations":[{"raw_affiliation_string":"Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008690719","display_name":"Reika Ichihara","orcid":"https://orcid.org/0000-0001-9016-5420"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Reika Ichihara","raw_affiliation_strings":["Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan"],"affiliations":[{"raw_affiliation_string":"Frontier Technology R&#x0026;D Institute Kioxia Corporation,Yokohama,Japan","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5053664688"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.10826634,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cycling","display_name":"Cycling","score":0.6704550981521606},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.49859189987182617},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.45332708954811096},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.37988710403442383}],"concepts":[{"id":"https://openalex.org/C541528975","wikidata":"https://www.wikidata.org/wiki/Q53121","display_name":"Cycling","level":2,"score":0.6704550981521606},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.49859189987182617},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.45332708954811096},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37988710403442383},{"id":"https://openalex.org/C95457728","wikidata":"https://www.wikidata.org/wiki/Q309","display_name":"History","level":0,"score":0.0},{"id":"https://openalex.org/C166957645","wikidata":"https://www.wikidata.org/wiki/Q23498","display_name":"Archaeology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48204.2025.10982736","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10982736","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Climate action","id":"https://metadata.un.org/sdg/13","score":0.5899999737739563}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1969067455","https://openalex.org/W1997925836","https://openalex.org/W2043400249","https://openalex.org/W2051157602","https://openalex.org/W2092639597","https://openalex.org/W2166894497","https://openalex.org/W2482978312","https://openalex.org/W2769364246","https://openalex.org/W2800070060","https://openalex.org/W2804429430","https://openalex.org/W2911460118","https://openalex.org/W2945198154","https://openalex.org/W3005761635","https://openalex.org/W3108325618","https://openalex.org/W3201962828","https://openalex.org/W3204638218","https://openalex.org/W4206200129","https://openalex.org/W4210423638","https://openalex.org/W4225975907","https://openalex.org/W4313434913","https://openalex.org/W4385215131","https://openalex.org/W4401880488","https://openalex.org/W4407692229","https://openalex.org/W4407694581"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2899084033","https://openalex.org/W2748952813","https://openalex.org/W2396534229","https://openalex.org/W2135440372","https://openalex.org/W2922415454","https://openalex.org/W4396712140","https://openalex.org/W1965853983","https://openalex.org/W4391375468","https://openalex.org/W1996037090"],"abstract_inverted_index":{"We":[0,97],"present":[1],"a":[2,66],"detailed":[3],"understanding":[4],"of":[5,15,31,110,116],"the":[6,32,45,55,94],"imprint":[7,52,73,82,95],"behavior":[8],"during":[9,62,69,75,83],"cycling":[10,76],"at":[11,44],"intermediate":[12,111],"states,":[13],"consisting":[14],"mixed":[16],"programmed":[17],"and":[18,113],"erased":[19],"domains,":[20,42],"used":[21],"for":[22,101],"multi-level":[23,70,103],"operation":[24],"in":[25],"Hf0<inf":[26],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[27],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</inf>-FeFET":[28],"devices.":[29],"Analysis":[30],"transient":[33],"current,":[34],"corresponding":[35],"to":[36,81],"spontaneous":[37,90],"polarization":[38,91],"reversal,":[39],"clarified":[40],"that":[41,86],"kept":[43],"same":[46],"state,":[47],"are":[48,58],"independently":[49],"affected":[50],"by":[51],"even":[53],"if":[54],"neighboring":[56],"domains":[57],"reversed":[59],"every":[60],"time":[61],"cycling,":[63],"which":[64],"is":[65,77],"possible":[67],"scenario":[68],"operation.":[71],"Furthermore,":[72],"phenomenon":[74],"more":[78],"severe":[79],"compared":[80],"retention,":[84],"indicating":[85],"electrical":[87],"stress":[88],"without":[89],"reversal":[92],"accelerates":[93],"effect.":[96],"demonstrate":[98],"two":[99],"strategies":[100],"reliable":[102],"operation:":[104],"(I)":[105],"full":[106,117],"program/erase":[107,118],"before":[108],"programming":[109],"states":[112],"(II)":[114],"addition":[115],"(refresh)":[119],"after":[120],"cycling.":[121]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}