{"id":"https://openalex.org/W4410394785","doi":"https://doi.org/10.1109/irps48204.2025.10982711","title":"Optimized CDM-ESD Protection for 100+ Gbps Wireline IO in 16-nm CMOS","display_name":"Optimized CDM-ESD Protection for 100+ Gbps Wireline IO in 16-nm CMOS","publication_year":2025,"publication_date":"2025-03-30","ids":{"openalex":"https://openalex.org/W4410394785","doi":"https://doi.org/10.1109/irps48204.2025.10982711"},"language":"en","primary_location":{"id":"doi:10.1109/irps48204.2025.10982711","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10982711","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026312781","display_name":"Shudong Huang","orcid":"https://orcid.org/0000-0001-6848-5460"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shudong Huang","raw_affiliation_strings":["University of Illinois Urbana-Champaign,Department of Electrical and Computer Engineering,Urbana,IL,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Illinois Urbana-Champaign,Department of Electrical and Computer Engineering,Urbana,IL,USA","institution_ids":["https://openalex.org/I157725225"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019748322","display_name":"Elyse Rosenbaum","orcid":"https://orcid.org/0000-0002-3919-9833"},"institutions":[{"id":"https://openalex.org/I157725225","display_name":"University of Illinois Urbana-Champaign","ror":"https://ror.org/047426m28","country_code":"US","type":"education","lineage":["https://openalex.org/I157725225"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Elyse Rosenbaum","raw_affiliation_strings":["University of Illinois Urbana-Champaign,Department of Electrical and Computer Engineering,Urbana,IL,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Illinois Urbana-Champaign,Department of Electrical and Computer Engineering,Urbana,IL,USA","institution_ids":["https://openalex.org/I157725225"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I157725225"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9922999739646912,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/wireline","display_name":"Wireline","score":0.9666056036949158},{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.861366868019104},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7797178030014038},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3673979640007019},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.33569085597991943},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3150686025619507},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.31166067719459534},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21498709917068481},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.18082216382026672},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09575453400611877},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.08273723721504211}],"concepts":[{"id":"https://openalex.org/C2776951270","wikidata":"https://www.wikidata.org/wiki/Q8026910","display_name":"Wireline","level":3,"score":0.9666056036949158},{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.861366868019104},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7797178030014038},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3673979640007019},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.33569085597991943},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3150686025619507},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.31166067719459534},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21498709917068481},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.18082216382026672},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09575453400611877},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.08273723721504211}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48204.2025.10982711","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48204.2025.10982711","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7300000190734863,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W2524892090","https://openalex.org/W2546260020","https://openalex.org/W2980981953","https://openalex.org/W3000059814","https://openalex.org/W3029349274","https://openalex.org/W3200274002","https://openalex.org/W4225303527","https://openalex.org/W4249212527","https://openalex.org/W4293519386","https://openalex.org/W4376606733","https://openalex.org/W4387803193","https://openalex.org/W4387872596","https://openalex.org/W4391622577","https://openalex.org/W4392746449","https://openalex.org/W4396949253","https://openalex.org/W4403210682","https://openalex.org/W6749183639"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2368190399","https://openalex.org/W4200241224","https://openalex.org/W2374510365","https://openalex.org/W1964703610","https://openalex.org/W2085787479","https://openalex.org/W2759444425","https://openalex.org/W2792533005","https://openalex.org/W2072114268","https://openalex.org/W2083085379"],"abstract_inverted_index":{"This":[0],"work":[1],"presents":[2],"an":[3,21],"ESD":[4],"solution":[5],"for":[6],"high-speed":[7],"serial":[8],"IO":[9],"pins,":[10],"in":[11,39,47],"which":[12],"a":[13,40,57,63],"STI-poly-bounded":[14],"silicon-controlled":[15],"rectifier":[16],"(SCR)":[17],"is":[18],"integrated":[19],"into":[20],"impedance":[22,72],"matching":[23],"circuit.":[24],"The":[25],"proposed":[26],"all-pass":[27],"secondary":[28],"protection":[29],"network":[30,61],"provides":[31],"excellent":[32],"voltage":[33,42],"clamping":[34],"under":[35],"CDM-like":[36],"conditions,":[37],"resulting":[38],"peak":[41],"of":[43],"just":[44],"2":[45],"V":[46],"response":[48],"to":[49],"5-A":[50],"1-ns":[51],"VFTLP":[52],"current":[53],"injection.":[54],"Integrated":[55],"with":[56],"T-coil":[58],"circuit,":[59],"the":[60],"achieves":[62],"bandwidth":[64],"above":[65],"40":[66],"GHz,":[67],"as":[68,70],"well":[69],"broadband":[71],"matching.":[73]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}