{"id":"https://openalex.org/W4376606618","doi":"https://doi.org/10.1109/irps48203.2023.10118220","title":"Engineering Custom TLP I-V Characteristic Using a SCR-Diode Series ESD Protection Concept","display_name":"Engineering Custom TLP I-V Characteristic Using a SCR-Diode Series ESD Protection Concept","publication_year":2023,"publication_date":"2023-03-01","ids":{"openalex":"https://openalex.org/W4376606618","doi":"https://doi.org/10.1109/irps48203.2023.10118220"},"language":"en","primary_location":{"id":"doi:10.1109/irps48203.2023.10118220","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/irps48203.2023.10118220","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108140936","display_name":"Harsha B. Variar","orcid":null},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Harsha B Variar","raw_affiliation_strings":["Indian Institute of Science,Department of ESE,Bangalore,Karnataka,India","Department of ESE, Indian Institute of Science, Bangalore, Karnataka, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science,Department of ESE,Bangalore,Karnataka,India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Department of ESE, Indian Institute of Science, Bangalore, Karnataka, India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055154029","display_name":"Satendra Kumar Gautam","orcid":"https://orcid.org/0000-0003-0374-0461"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Satendra Kumar Gautam","raw_affiliation_strings":["Indian Institute of Science,Department of ESE,Bangalore,Karnataka,India","Department of ESE, Indian Institute of Science, Bangalore, Karnataka, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science,Department of ESE,Bangalore,Karnataka,India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Department of ESE, Indian Institute of Science, Bangalore, Karnataka, India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101203011","display_name":"Ashita Kumar","orcid":null},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ashita Kumar","raw_affiliation_strings":["Indian Institute of Science,Department of ESE,Bangalore,Karnataka,India","Department of ESE, Indian Institute of Science, Bangalore, Karnataka, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science,Department of ESE,Bangalore,Karnataka,India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Department of ESE, Indian Institute of Science, Bangalore, Karnataka, India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034168135","display_name":"K. M. Amogh","orcid":null},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"K M Amogh","raw_affiliation_strings":["Indian Institute of Science,Department of ESE,Bangalore,Karnataka,India","Department of ESE, Indian Institute of Science, Bangalore, Karnataka, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science,Department of ESE,Bangalore,Karnataka,India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Department of ESE, Indian Institute of Science, Bangalore, Karnataka, India","institution_ids":["https://openalex.org/I59270414"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101139174","display_name":"Juan Luo","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094156","display_name":"Alpha and Omega Semiconductor (United States)","ror":"https://ror.org/00pgwrm68","country_code":"US","type":"company","lineage":["https://openalex.org/I4210094156","https://openalex.org/I4210130822"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Juan Luo","raw_affiliation_strings":["Alpha & Omega Semiconductor,Sunnyvale,USA"],"affiliations":[{"raw_affiliation_string":"Alpha & Omega Semiconductor,Sunnyvale,USA","institution_ids":["https://openalex.org/I4210094156"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100707880","display_name":"Ning Shi","orcid":"https://orcid.org/0000-0002-4769-1609"},"institutions":[{"id":"https://openalex.org/I4210094156","display_name":"Alpha and Omega Semiconductor (United States)","ror":"https://ror.org/00pgwrm68","country_code":"US","type":"company","lineage":["https://openalex.org/I4210094156","https://openalex.org/I4210130822"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ning Shi","raw_affiliation_strings":["Alpha & Omega Semiconductor,Sunnyvale,USA"],"affiliations":[{"raw_affiliation_string":"Alpha & Omega Semiconductor,Sunnyvale,USA","institution_ids":["https://openalex.org/I4210094156"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019384320","display_name":"David Marreiro","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094156","display_name":"Alpha and Omega Semiconductor (United States)","ror":"https://ror.org/00pgwrm68","country_code":"US","type":"company","lineage":["https://openalex.org/I4210094156","https://openalex.org/I4210130822"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"David Marreiro","raw_affiliation_strings":["Alpha & Omega Semiconductor,Sunnyvale,USA"],"affiliations":[{"raw_affiliation_string":"Alpha & Omega Semiconductor,Sunnyvale,USA","institution_ids":["https://openalex.org/I4210094156"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103532421","display_name":"Shekar Mallikarjunaswamy","orcid":null},"institutions":[{"id":"https://openalex.org/I4210094156","display_name":"Alpha and Omega Semiconductor (United States)","ror":"https://ror.org/00pgwrm68","country_code":"US","type":"company","lineage":["https://openalex.org/I4210094156","https://openalex.org/I4210130822"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shekar Mallikarjunaswamy","raw_affiliation_strings":["Alpha & Omega Semiconductor,Sunnyvale,USA"],"affiliations":[{"raw_affiliation_string":"Alpha & Omega Semiconductor,Sunnyvale,USA","institution_ids":["https://openalex.org/I4210094156"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5031450949","display_name":"Mayank Shrivastava","orcid":"https://orcid.org/0000-0003-1005-040X"},"institutions":[{"id":"https://openalex.org/I59270414","display_name":"Indian Institute of Science Bangalore","ror":"https://ror.org/04dese585","country_code":"IN","type":"education","lineage":["https://openalex.org/I59270414"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Mayank Shrivastava","raw_affiliation_strings":["Indian Institute of Science,Department of ESE,Bangalore,Karnataka,India","Department of ESE, Indian Institute of Science, Bangalore, Karnataka, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Science,Department of ESE,Bangalore,Karnataka,India","institution_ids":["https://openalex.org/I59270414"]},{"raw_affiliation_string":"Department of ESE, Indian Institute of Science, Bangalore, Karnataka, India","institution_ids":["https://openalex.org/I59270414"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5108140936"],"corresponding_institution_ids":["https://openalex.org/I59270414"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.03855164,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"5 2","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9959999918937683,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.7024620771408081},{"id":"https://openalex.org/keywords/thyristor","display_name":"Thyristor","score":0.5852393507957458},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4949182868003845},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.4448346495628357},{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.41042786836624146},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.406730592250824},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.39970362186431885},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35062482953071594},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3298036754131317},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.13656720519065857}],"concepts":[{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.7024620771408081},{"id":"https://openalex.org/C121922863","wikidata":"https://www.wikidata.org/wiki/Q180805","display_name":"Thyristor","level":3,"score":0.5852393507957458},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4949182868003845},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.4448346495628357},{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.41042786836624146},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.406730592250824},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.39970362186431885},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35062482953071594},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3298036754131317},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.13656720519065857},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps48203.2023.10118220","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/irps48203.2023.10118220","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai::82117","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306401702","display_name":"Universitas Pasundan institutional repositories & scientific journals (Universitas Pasundan)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I4210159629","host_organization_name":"Universitas Pasundan","host_organization_lineage":["https://openalex.org/I4210159629"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1494199278","https://openalex.org/W1506434528","https://openalex.org/W2094682294","https://openalex.org/W2135978993","https://openalex.org/W2140045281","https://openalex.org/W2782391744","https://openalex.org/W4298033106","https://openalex.org/W6630372040","https://openalex.org/W6680394826"],"related_works":["https://openalex.org/W4213279392","https://openalex.org/W2725874044","https://openalex.org/W2379676388","https://openalex.org/W3009399878","https://openalex.org/W2365452505","https://openalex.org/W2059544191","https://openalex.org/W3080165816","https://openalex.org/W614960760","https://openalex.org/W2092371272","https://openalex.org/W2150640605"],"abstract_inverted_index":{"This":[0,44],"work":[1],"demonstrates":[2,80],"an":[3],"SCR-Diode":[4],"series":[5],"ESD":[6,55],"Protection":[7],"concept,":[8],"which":[9,35],"can":[10,88],"be":[11,89],"engineered":[12],"to":[13,91],"provide":[14],"a":[15,38,64],"custom":[16],"TLP":[17,41],"I-V":[18,42],"characteristic.":[19],"SCRs":[20],"and":[21,32,67,83,96],"diodes":[22],"with":[23,48,75],"dimensional":[24],"variations":[25],"have":[26],"been":[27],"used":[28,90],"in":[29,37],"different":[30],"combinations":[31],"width":[33],"ratios,":[34],"results":[36],"range":[39],"of":[40,60,70,86,98],"characteristics.":[43],"protection":[45,56,65,100],"circuit":[46],"comes":[47],"several":[49],"advantages":[50],"as":[51,63],"adaptability":[52],"for":[53],"various":[54],"windows,":[57],"the":[58,68,72,94,99],"benefits":[59],"using":[61],"SCR":[62,87],"device":[66],"ease":[69],"designing":[71],"circuit.":[73,101],"Along":[74],"TCAD":[76],"studies,":[77],"experimental":[78],"data":[79],"that":[81],"N-well":[82],"P-well":[84],"doping":[85],"further":[92],"tune":[93],"Vhold":[95],"Ron":[97]},"counts_by_year":[],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}