{"id":"https://openalex.org/W4376606721","doi":"https://doi.org/10.1109/irps48203.2023.10118131","title":"Thermally-activated failure mechanisms of 0.25 \\ \\mu \\mathrm{m}$ RF AIGaN/GaN HEMTs submitted to long-term life tests","display_name":"Thermally-activated failure mechanisms of 0.25 \\ \\mu \\mathrm{m}$ RF AIGaN/GaN HEMTs submitted to long-term life tests","publication_year":2023,"publication_date":"2023-03-01","ids":{"openalex":"https://openalex.org/W4376606721","doi":"https://doi.org/10.1109/irps48203.2023.10118131"},"language":"en","primary_location":{"id":"doi:10.1109/irps48203.2023.10118131","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48203.2023.10118131","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082047955","display_name":"Z. Gao","orcid":"https://orcid.org/0000-0002-8251-0703"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Zhan Gao","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,Italy,35131"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,Italy,35131","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038436348","display_name":"Francesca Chiocchetta","orcid":null},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Francesca Chiocchetta","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,Italy,35131"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,Italy,35131","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033707390","display_name":"Fabiana Rampazzo","orcid":"https://orcid.org/0000-0002-2418-4831"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Fabiana Rampazzo","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,Italy,35131"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,Italy,35131","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064109540","display_name":"Carlo De Santi","orcid":"https://orcid.org/0000-0001-6064-077X"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Carlo De Santi","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,Italy,35131"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,Italy,35131","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074735727","display_name":"Mirko Fornasier","orcid":"https://orcid.org/0000-0003-4974-9605"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Mirko Fornasier","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,Italy,35131"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,Italy,35131","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101587480","display_name":"Gaudenzio Meneghesso","orcid":"https://orcid.org/0000-0002-6715-4827"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gaudenzio Meneghesso","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,Italy,35131"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,Italy,35131","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059611177","display_name":"Matteo Meneghini","orcid":"https://orcid.org/0000-0003-2421-505X"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Matteo Meneghini","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,Italy,35131"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,Italy,35131","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002653396","display_name":"Enrico Zanoni","orcid":"https://orcid.org/0000-0001-7349-9656"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Enrico Zanoni","raw_affiliation_strings":["University of Padova,Department of Information Engineering,Padova,Italy,35131"],"affiliations":[{"raw_affiliation_string":"University of Padova,Department of Information Engineering,Padova,Italy,35131","institution_ids":["https://openalex.org/I138689650"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5082047955"],"corresponding_institution_ids":["https://openalex.org/I138689650"],"apc_list":null,"apc_paid":null,"fwci":0.7694,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.67066884,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/activation-energy","display_name":"Activation energy","score":0.4899536669254303},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.48426979780197144},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.4761528968811035},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.41585972905158997},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30050456523895264},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.23446521162986755},{"id":"https://openalex.org/keywords/physical-chemistry","display_name":"Physical chemistry","score":0.19738492369651794},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10709398984909058}],"concepts":[{"id":"https://openalex.org/C95121573","wikidata":"https://www.wikidata.org/wiki/Q190474","display_name":"Activation energy","level":2,"score":0.4899536669254303},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.48426979780197144},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4761528968811035},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41585972905158997},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30050456523895264},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.23446521162986755},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.19738492369651794},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10709398984909058}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps48203.2023.10118131","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48203.2023.10118131","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:www.research.unipd.it:11577/3491540","is_oa":false,"landing_page_url":"https://hdl.handle.net/11577/3491540","pdf_url":null,"source":{"id":"https://openalex.org/S4377196283","display_name":"Research Padua  Archive (University of Padua)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I138689650","host_organization_name":"University of Padua","host_organization_lineage":["https://openalex.org/I138689650"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5199999809265137,"display_name":"Responsible consumption and production","id":"https://metadata.un.org/sdg/12"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1531400731","https://openalex.org/W1875408109","https://openalex.org/W1966978795","https://openalex.org/W1986591620","https://openalex.org/W1989453159","https://openalex.org/W1992131905","https://openalex.org/W1998267143","https://openalex.org/W2001363775","https://openalex.org/W2022637140","https://openalex.org/W2027110522","https://openalex.org/W2042801850","https://openalex.org/W2111868116","https://openalex.org/W2170542824","https://openalex.org/W2172901388","https://openalex.org/W2290556677","https://openalex.org/W2323050638","https://openalex.org/W2546442988","https://openalex.org/W2565813373","https://openalex.org/W2596492049","https://openalex.org/W2988905335","https://openalex.org/W3039564247","https://openalex.org/W3094055702","https://openalex.org/W3137373271","https://openalex.org/W4210861628","https://openalex.org/W4214941655","https://openalex.org/W7009674877"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036","https://openalex.org/W2375695558"],"abstract_inverted_index":{"Reliability":[0],"and":[1,17,37,61,70,93,98],"failure":[2],"mechanism":[3],"of":[4,51,86,107],"<tex":[5,66,71,99],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[6,67,72,96,100],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\boldsymbol{0.25":[7],"\\":[8],"\\mu":[9],"}\\mathbf{m}":[10],"\\mathbf{AlGaN}/\\mathbf{GaN}$</tex>":[11],"HEMTs":[12],"under":[13],"thermal":[14,31],"storage":[15,32],"tests":[16,23],"high":[18],"temperature":[19],"operating":[20],"life":[21],"(HTOL)":[22],"have":[24],"been":[25],"evaluated.":[26],"Results":[27],"show":[28],"that,":[29],"during":[30],"tests,":[33,77],"Schottky":[34],"metal":[35],"interdiffusion":[36],"gate":[38],"sinking":[39],"took":[40],"place,":[41],"possibly":[42],"accompanied":[43],"by":[44],"thermo-mechanical":[45],"degradation,":[46],"with":[47,103],"an":[48,104],"activation":[49,105],"energy":[50,106],"1.8":[52],"eVe":[53],"Failure":[54],"modes":[55],"consisted":[56],"in":[57],"carrier":[58],"density":[59],"decrease":[60],"sheet":[62],"resistance":[63,91],"increase,":[64,92],"positive":[65],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\mathbf{V}_{\\mathbf{T}\\mathbf{H}}$</tex>":[68],"shift":[69],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\mathbf{I}_{\\mathbf{D}\\mathbf{S}\\mathbf{S}}$</tex>":[73],"decrease.":[74],"During":[75],"HTOL":[76],"the":[78],"degradation":[79],"is":[80],"mainly":[81],"due":[82],"to":[83,89],"electrochemical":[84],"oxidation":[85],"AlGaN,":[87],"leading":[88],"on":[90],"I":[94],"<inf":[95],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">dss</inf>":[97],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\mathbf{g}_{\\mathbf{m}}$</tex>":[101],"decrease,":[102],"1.0":[108],"eV.":[109]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2023-05-17T00:00:00"}