{"id":"https://openalex.org/W4376606796","doi":"https://doi.org/10.1109/irps48203.2023.10117917","title":"MTJ degradation in multi-pillar SOT-MRAM with selective writing","display_name":"MTJ degradation in multi-pillar SOT-MRAM with selective writing","publication_year":2023,"publication_date":"2023-03-01","ids":{"openalex":"https://openalex.org/W4376606796","doi":"https://doi.org/10.1109/irps48203.2023.10117917"},"language":"en","primary_location":{"id":"doi:10.1109/irps48203.2023.10117917","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48203.2023.10117917","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5000437483","display_name":"S. Van Beek","orcid":"https://orcid.org/0000-0002-2499-4172"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Simon Van Beek","raw_affiliation_strings":["imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004623248","display_name":"Kaiming Cai","orcid":"https://orcid.org/0000-0002-1160-864X"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Kaiming Cai","raw_affiliation_strings":["imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034446374","display_name":"Kaiquan Fan","orcid":"https://orcid.org/0000-0003-4875-7179"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]},{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Kaiquan Fan","raw_affiliation_strings":["imec,Leuven,Belgium,3001","imec, Leuven, Belgium","ESAT, KU Leuven, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"ESAT, KU Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032798211","display_name":"Giacomo Talmelli","orcid":"https://orcid.org/0000-0001-7763-7008"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Giacomo Talmelli","raw_affiliation_strings":["imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003609213","display_name":"A. Trovato","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Anna Trovato","raw_affiliation_strings":["imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004463732","display_name":"N. Jossart","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Nico Jossart","raw_affiliation_strings":["imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002378343","display_name":"Siddharth Rao","orcid":"https://orcid.org/0000-0001-6161-3052"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Siddharth Rao","raw_affiliation_strings":["imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069528357","display_name":"Adrian Chasin","orcid":"https://orcid.org/0000-0002-9940-0260"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Adrian Chasin","raw_affiliation_strings":["imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022214575","display_name":"S\u00e9bastien Couet","orcid":"https://orcid.org/0000-0001-6436-9593"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Sebastien Couet","raw_affiliation_strings":["imec,Leuven,Belgium,3001"],"affiliations":[{"raw_affiliation_string":"imec,Leuven,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5000437483"],"corresponding_institution_ids":["https://openalex.org/I4210114974"],"apc_list":null,"apc_paid":null,"fwci":0.8033,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.71094219,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10377","display_name":"Metal and Thin Film Mechanics","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/magnetoresistive-random-access-memory","display_name":"Magnetoresistive random-access memory","score":0.8651107549667358},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.56742262840271},{"id":"https://openalex.org/keywords/reading","display_name":"Reading (process)","score":0.5427617430686951},{"id":"https://openalex.org/keywords/pillar","display_name":"Pillar","score":0.5282458662986755},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.5262094140052795},{"id":"https://openalex.org/keywords/diffusion","display_name":"Diffusion","score":0.4609907269477844},{"id":"https://openalex.org/keywords/tunnel-magnetoresistance","display_name":"Tunnel magnetoresistance","score":0.4566797614097595},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.432400643825531},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.42698344588279724},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3959541320800781},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.28895825147628784},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.23549070954322815},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2227075695991516},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.19289186596870422},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.1714777946472168},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.13625964522361755},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.10296308994293213},{"id":"https://openalex.org/keywords/law","display_name":"Law","score":0.08597919344902039},{"id":"https://openalex.org/keywords/political-science","display_name":"Political science","score":0.08082082867622375}],"concepts":[{"id":"https://openalex.org/C46891859","wikidata":"https://www.wikidata.org/wiki/Q1061546","display_name":"Magnetoresistive random-access memory","level":3,"score":0.8651107549667358},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.56742262840271},{"id":"https://openalex.org/C554936623","wikidata":"https://www.wikidata.org/wiki/Q199657","display_name":"Reading (process)","level":2,"score":0.5427617430686951},{"id":"https://openalex.org/C105289051","wikidata":"https://www.wikidata.org/wiki/Q1930094","display_name":"Pillar","level":2,"score":0.5282458662986755},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.5262094140052795},{"id":"https://openalex.org/C69357855","wikidata":"https://www.wikidata.org/wiki/Q163214","display_name":"Diffusion","level":2,"score":0.4609907269477844},{"id":"https://openalex.org/C56202322","wikidata":"https://www.wikidata.org/wiki/Q1884383","display_name":"Tunnel magnetoresistance","level":3,"score":0.4566797614097595},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.432400643825531},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.42698344588279724},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3959541320800781},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.28895825147628784},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.23549070954322815},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2227075695991516},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.19289186596870422},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.1714777946472168},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.13625964522361755},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.10296308994293213},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.08597919344902039},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.08082082867622375},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48203.2023.10117917","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48203.2023.10117917","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/4","score":0.9100000262260437,"display_name":"Quality Education"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2068896528","https://openalex.org/W2799333888","https://openalex.org/W2896872617","https://openalex.org/W3154071697","https://openalex.org/W3158222379","https://openalex.org/W3170565144","https://openalex.org/W3193341937","https://openalex.org/W4225320181","https://openalex.org/W4286571914","https://openalex.org/W6800303666"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2899084033","https://openalex.org/W1890124164","https://openalex.org/W1977755618","https://openalex.org/W1545438037","https://openalex.org/W2131964951","https://openalex.org/W4214681414","https://openalex.org/W2065530429","https://openalex.org/W2755795443","https://openalex.org/W2109595167"],"abstract_inverted_index":{"In":[0],"SOT-MRAM,":[1],"the":[2,8,19,28,34,41,55,79],"writing":[3],"path":[4,10],"is":[5,104],"decoupled":[6],"from":[7],"reading":[9],"and":[11,43,65,115],"therefore":[12],"considered":[13],"robust":[14],"against":[15],"MgO":[16,86],"breakdown":[17,87,101],"in":[18,107],"MTJ.":[20,44,56],"At":[21,45],"operation,":[22],"high":[23],"current":[24],"densities":[25],"flow":[26],"through":[27],"thin":[29],"metallic":[30],"SOT":[31,69,82],"track":[32,42],"underneath":[33],"MTJ,":[35],"causing":[36],"significant":[37],"heating":[38],"of":[39,54,112],"both":[40],"these":[46],"elevated":[47],"temperatures,":[48],"diffusion":[49,91],"mechanisms":[50],"can":[51,66,84,98],"cause":[52,85],"failure":[53,89,95],"We":[57],"find":[58],"that":[59,100,110],"longer":[60,113],"tracks":[61,114],"heat":[62],"up":[63],"more":[64],"sustain":[67],"less":[68],"current.":[70],"Moreover,":[71],"applying":[72],"a":[73,94],"voltage":[74],"<tex":[75,117],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[76,118],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$(V_{G})$</tex>":[77],"on":[78],"MTJ":[80],"during":[81],"stress":[83],"before":[88],"by":[90],"occurs.":[92],"With":[93],"model,":[96],"we":[97],"predict":[99],"event.":[102],"This":[103],"particularly":[105],"important":[106],"multi-pillar":[108],"concepts":[109],"consist":[111],"use":[116],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$V_{G}$</tex>":[119],"for":[120],"selectivity.":[121]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}