{"id":"https://openalex.org/W4376606791","doi":"https://doi.org/10.1109/irps48203.2023.10117840","title":"Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology","display_name":"Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology","publication_year":2023,"publication_date":"2023-03-01","ids":{"openalex":"https://openalex.org/W4376606791","doi":"https://doi.org/10.1109/irps48203.2023.10117840"},"language":"en","primary_location":{"id":"doi:10.1109/irps48203.2023.10117840","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/irps48203.2023.10117840","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022461285","display_name":"Zixuan Sun","orcid":"https://orcid.org/0000-0002-8257-5531"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zixuan Sun","raw_affiliation_strings":["School of Integrated Circuits, Peking University,Beijing,China,100871"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University,Beijing,China,100871","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104240248","display_name":"Haoran Lu","orcid":"https://orcid.org/0000-0001-5829-0723"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haoran Lu","raw_affiliation_strings":["School of Integrated Circuits, Peking University,Beijing,China,100871"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University,Beijing,China,100871","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078217690","display_name":"Yongkang Xue","orcid":"https://orcid.org/0000-0003-4542-5566"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongkang Xue","raw_affiliation_strings":["Shanghai Jiaotong University,National Key Laboratory of Science and Technology on Micro/Nano Fabrication,Shanghai,China,200240"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Jiaotong University,National Key Laboratory of Science and Technology on Micro/Nano Fabrication,Shanghai,China,200240","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049926407","display_name":"Wenpu Luo","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenpu Luo","raw_affiliation_strings":["School of Integrated Circuits, Peking University,Beijing,China,100871"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University,Beijing,China,100871","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111126191","display_name":"Zirui Wang","orcid":"https://orcid.org/0009-0002-1941-517X"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zirui Wang","raw_affiliation_strings":["School of Integrated Circuits, Peking University,Beijing,China,100871"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University,Beijing,China,100871","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101803787","display_name":"Jiayang Zhang","orcid":"https://orcid.org/0000-0001-9573-4346"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiayang Zhang","raw_affiliation_strings":["School of Integrated Circuits, Peking University,Beijing,China,100871"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University,Beijing,China,100871","institution_ids":["https://openalex.org/I20231570"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058083493","display_name":"Zhigang Ji","orcid":"https://orcid.org/0000-0003-1138-804X"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]},{"id":"https://openalex.org/I4210165198","display_name":"Beijing Advanced Sciences and Innovation Center","ror":"https://ror.org/05qm21180","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhigang Ji","raw_affiliation_strings":["Shanghai Jiaotong University,National Key Laboratory of Science and Technology on Micro/Nano Fabrication,Shanghai,China,200240","Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Jiaotong University,National Key Laboratory of Science and Technology on Micro/Nano Fabrication,Shanghai,China,200240","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China","institution_ids":["https://openalex.org/I4210165198"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002760019","display_name":"Runsheng Wang","orcid":"https://orcid.org/0000-0002-7514-0767"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]},{"id":"https://openalex.org/I4210165198","display_name":"Beijing Advanced Sciences and Innovation Center","ror":"https://ror.org/05qm21180","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Runsheng Wang","raw_affiliation_strings":["School of Integrated Circuits, Peking University,Beijing,China,100871","Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University,Beijing,China,100871","institution_ids":["https://openalex.org/I20231570"]},{"raw_affiliation_string":"Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China","institution_ids":["https://openalex.org/I4210165198"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062886480","display_name":"Ru Huang","orcid":"https://orcid.org/0000-0002-8146-4821"},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]},{"id":"https://openalex.org/I4210165198","display_name":"Beijing Advanced Sciences and Innovation Center","ror":"https://ror.org/05qm21180","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165198"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ru Huang","raw_affiliation_strings":["School of Integrated Circuits, Peking University,Beijing,China,100871","Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits, Peking University,Beijing,China,100871","institution_ids":["https://openalex.org/I20231570"]},{"raw_affiliation_string":"Beijing Advanced Innovation Center for Integrated Circuits, Beijing, China","institution_ids":["https://openalex.org/I4210165198"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5870262384414673},{"id":"https://openalex.org/keywords/biasing","display_name":"Biasing","score":0.5649356842041016},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5468841791152954},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5452847480773926},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.49997472763061523},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4665023684501648},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.4654916524887085},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.45263728499412537},{"id":"https://openalex.org/keywords/modulation","display_name":"Modulation (music)","score":0.44652536511421204},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.44415366649627686},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2866247296333313},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2272450029850006},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2227340042591095},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14665192365646362},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.121847003698349},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11285972595214844},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.0954328179359436}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5870262384414673},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.5649356842041016},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5468841791152954},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5452847480773926},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.49997472763061523},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4665023684501648},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4654916524887085},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.45263728499412537},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.44652536511421204},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.44415366649627686},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2866247296333313},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2272450029850006},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2227340042591095},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14665192365646362},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.121847003698349},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11285972595214844},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.0954328179359436},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps48203.2023.10117840","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/irps48203.2023.10117840","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G179221623","display_name":null,"funder_award_id":"62125401,61874005,61927901","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6847781164","display_name":null,"funder_award_id":"B18001","funder_id":"https://openalex.org/F4320327912","funder_display_name":"Higher Education Discipline Innovation Project"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320327912","display_name":"Higher Education Discipline Innovation Project","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1968565334","https://openalex.org/W1999169264","https://openalex.org/W2030105454","https://openalex.org/W2077522337","https://openalex.org/W2095322467","https://openalex.org/W2102352834","https://openalex.org/W2106878230","https://openalex.org/W2139082921","https://openalex.org/W2485848341","https://openalex.org/W2527438975","https://openalex.org/W2583425950","https://openalex.org/W2785433663","https://openalex.org/W2887806601","https://openalex.org/W2913668696","https://openalex.org/W2991487748","https://openalex.org/W3032174739","https://openalex.org/W3037038174","https://openalex.org/W3038337678","https://openalex.org/W3114516987","https://openalex.org/W4210826599","https://openalex.org/W4225323177","https://openalex.org/W4226205063"],"related_works":["https://openalex.org/W2069427488","https://openalex.org/W4281694563","https://openalex.org/W2080696413","https://openalex.org/W2163182355","https://openalex.org/W1506140395","https://openalex.org/W4232799642","https://openalex.org/W2912082923","https://openalex.org/W2744827311","https://openalex.org/W2376107070","https://openalex.org/W1965165143"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"observed":[4],"non-negligible":[5],"body":[6,25,66],"bias":[7,26,67],"effect":[8,68],"after":[9,71],"hot":[10],"carrier":[11],"degeneration":[12],"(HCD)":[13],"in":[14],"7":[15],"and":[16,57,70],"5nm":[17],"FinFET":[18],"technologies,":[19],"even":[20],"though":[21],"they":[22],"have":[23],"negligible":[24],"dependence":[27],"before":[28,69],"HCD.":[29],"We":[30,60],"revealed":[31],"that":[32],"the":[33,38,42,47,50,78],"trap-induced":[34],"partial":[35],"shift":[36],"of":[37,44],"channel":[39],"current":[40],"towards":[41],"bottom":[43],"fin":[45],"is":[46],"culprit":[48],"for":[49,77,85],"enhanced":[51],"body-biased":[52],"effect,":[53],"by":[54,65],"combining":[55],"TCAD":[56],"experimental":[58],"results.":[59],"also":[61],"studied":[62],"mobility":[63],"modulation":[64],"degradation.":[72],"The":[73],"results":[74],"are":[75],"beneficial":[76],"reliability-aware":[79],"circuit":[80],"design":[81],"against":[82],"HCD":[83],"particularly":[84],"FinFET-based":[86],"circuits.":[87]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}