{"id":"https://openalex.org/W4376606695","doi":"https://doi.org/10.1109/irps48203.2023.10117832","title":"A Unified Framework to Explain Random Telegraph Noise Complexity in MOSFETs and RRAMs","display_name":"A Unified Framework to Explain Random Telegraph Noise Complexity in MOSFETs and RRAMs","publication_year":2023,"publication_date":"2023-03-01","ids":{"openalex":"https://openalex.org/W4376606695","doi":"https://doi.org/10.1109/irps48203.2023.10117832"},"language":"en","primary_location":{"id":"doi:10.1109/irps48203.2023.10117832","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48203.2023.10117832","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hdl.handle.net/11380/1306366","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005350888","display_name":"Sara Vecchi","orcid":"https://orcid.org/0000-0002-0260-3003"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Sara Vecchi","raw_affiliation_strings":["Universit&#x00E1; degli Studi di Modena e Reggio Emilia,Dipartimento di Ingegneria &#x201C;Enzo Ferrari&#x201D;,Modena,MO,Italy,41125"],"affiliations":[{"raw_affiliation_string":"Universit&#x00E1; degli Studi di Modena e Reggio Emilia,Dipartimento di Ingegneria &#x201C;Enzo Ferrari&#x201D;,Modena,MO,Italy,41125","institution_ids":["https://openalex.org/I122346577"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005663559","display_name":"Paolo Pavan","orcid":"https://orcid.org/0000-0001-5420-1797"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Paolo Pavan","raw_affiliation_strings":["Universit&#x00E1; degli Studi di Modena e Reggio Emilia,Dipartimento di Ingegneria &#x201C;Enzo Ferrari&#x201D;,Modena,MO,Italy,41125"],"affiliations":[{"raw_affiliation_string":"Universit&#x00E1; degli Studi di Modena e Reggio Emilia,Dipartimento di Ingegneria &#x201C;Enzo Ferrari&#x201D;,Modena,MO,Italy,41125","institution_ids":["https://openalex.org/I122346577"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021479723","display_name":"Francesco Maria Puglisi","orcid":"https://orcid.org/0000-0001-6178-2614"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Francesco Maria Puglisi","raw_affiliation_strings":["Universit&#x00E1; degli Studi di Modena e Reggio Emilia,Dipartimento di Ingegneria &#x201C;Enzo Ferrari&#x201D;,Modena,MO,Italy,41125"],"affiliations":[{"raw_affiliation_string":"Universit&#x00E1; degli Studi di Modena e Reggio Emilia,Dipartimento di Ingegneria &#x201C;Enzo Ferrari&#x201D;,Modena,MO,Italy,41125","institution_ids":["https://openalex.org/I122346577"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5005350888"],"corresponding_institution_ids":["https://openalex.org/I122346577"],"apc_list":null,"apc_paid":null,"fwci":0.6578,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.67502559,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.741689145565033},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5790443420410156},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4699941575527191},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.41553425788879395},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3632217347621918},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3402901291847229},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3325751721858978},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2723925709724426},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2622922956943512},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1698620319366455},{"id":"https://openalex.org/keywords/electrode","display_name":"Electrode","score":0.1486123502254486},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.10811296105384827}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.741689145565033},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5790443420410156},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4699941575527191},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.41553425788879395},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3632217347621918},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3402901291847229},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3325751721858978},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2723925709724426},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2622922956943512},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1698620319366455},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.1486123502254486},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.10811296105384827},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps48203.2023.10117832","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48203.2023.10117832","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:iris.unimore.it:11380/1306366","is_oa":true,"landing_page_url":"https://hdl.handle.net/11380/1306366","pdf_url":null,"source":{"id":"https://openalex.org/S4306400718","display_name":"IRIS UNIMORE (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":{"id":"pmh:oai:iris.unimore.it:11380/1306366","is_oa":true,"landing_page_url":"https://hdl.handle.net/11380/1306366","pdf_url":null,"source":{"id":"https://openalex.org/S4306400718","display_name":"IRIS UNIMORE (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W753821166","https://openalex.org/W1565621290","https://openalex.org/W1571862906","https://openalex.org/W1599992741","https://openalex.org/W1971367461","https://openalex.org/W2008147998","https://openalex.org/W2022193217","https://openalex.org/W2035358534","https://openalex.org/W2036656598","https://openalex.org/W2051513095","https://openalex.org/W2069415920","https://openalex.org/W2117188320","https://openalex.org/W2121425010","https://openalex.org/W2132401497","https://openalex.org/W2345292896","https://openalex.org/W2904664224","https://openalex.org/W3164175827","https://openalex.org/W3165790670","https://openalex.org/W3185230002","https://openalex.org/W3188081262","https://openalex.org/W4224280767","https://openalex.org/W4225307813","https://openalex.org/W4281874271","https://openalex.org/W4283221311","https://openalex.org/W4310664599","https://openalex.org/W4312374978","https://openalex.org/W4313332756"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2545245183","https://openalex.org/W2054635671","https://openalex.org/W2017425642","https://openalex.org/W2350916061","https://openalex.org/W1970117475","https://openalex.org/W3161624601","https://openalex.org/W2611512961","https://openalex.org/W2078381924","https://openalex.org/W1942251340"],"abstract_inverted_index":{"As":[0],"well":[1],"known,":[2],"the":[3,22,27,32,56,68,174],"implementation":[4],"of":[5,55,107,167,176],"<tex":[6,11,38,71],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[7,12,39,72],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\text{high}-\\kappa$</tex>":[8],"dielectrics":[9],"(e.g.,":[10,109],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\text{HfO}_{2})$</tex>":[13],"in":[14,62,91,123,150],"nanoscale":[15],"devices":[16,97,152,178],"is":[17,160],"unavoidable":[18],"to":[19,31,37,84],"cope":[20],"with":[21],"device":[23,69],"scaling":[24],"required":[25],"by":[26,77,163],"market.":[28],"Nevertheless,":[29],"due":[30],"higher":[33],"defect":[34,79],"density":[35,80],"compared":[36],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\text{SiO}_{2}$</tex>":[40],",":[41],"hafnium":[42],"oxide":[43],"exhibits":[44,133],"stronger":[45],"and":[46,81,114,130,156,179],"more":[47],"complex":[48],"Random":[49,93,188],"Telegraph":[50],"Noise":[51],"(RTN),":[52],"namely":[53],"one":[54],"most":[57],"relevant":[58],"defect-related":[59],"reliability":[60],"issues":[61],"ultra-thin":[63],"oxides.":[64],"However,":[65],"depending":[66],"on":[67],"type,":[70],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">$\\text{HfO}_{2}$</tex>":[73],"can":[74],"be":[75,171],"characterized":[76],"different":[78,86,151],"therefore":[82],"leading":[83],"a":[85,104,127,134,154],"RTN":[87,98,125],"signals.":[88],"In":[89,142],"particular,":[90],"Resistive":[92],"Access":[94],"Memory":[95],"(RRAM)":[96],"arises":[99],"very":[100],"often":[101],"but":[102],"shows":[103],"high":[105],"degree":[106],"complexity":[108],"multilevel,":[110],"anomalous,":[111],"temporary":[112],"RTN)":[113],"instabilities":[115],"[3],":[116],"[4]":[117],"which":[118,159],"hinders":[119],"its":[120],"characterization.":[121],"Conversely,":[122],"MOSFETs":[124],"has":[126],"small":[128],"occurrence":[129],"it":[131],"typically":[132],"simple":[135],"behavior":[136],"(i.e.,":[137],"2-level":[138],"signal)":[139],"if":[140],"detected.":[141],"this":[143,168],"work,":[144],"we":[145],"fully":[146],"analyze":[147],"such":[148,185],"phenomena":[149],"providing":[153],"unified":[155],"physics-based":[157],"framework":[158],"also":[161],"confirmed":[162],"experiments.":[164],"The":[165],"results":[166],"study":[169],"will":[170],"crucial":[172],"for":[173,181],"design":[175],"new":[177],"circuits":[180],"emerging":[182],"RTN-based":[183],"applications,":[184],"as":[186],"True":[187],"Number":[189],"Generators":[190],"(TRNGs).":[191]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":2}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}