{"id":"https://openalex.org/W4376606772","doi":"https://doi.org/10.1109/irps48203.2023.10117725","title":"Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications","display_name":"Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications","publication_year":2023,"publication_date":"2023-03-01","ids":{"openalex":"https://openalex.org/W4376606772","doi":"https://doi.org/10.1109/irps48203.2023.10117725"},"language":"en","primary_location":{"id":"doi:10.1109/irps48203.2023.10117725","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48203.2023.10117725","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hal.science/hal-04604661/document","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5035925563","display_name":"Tidjani Garba-Seybou","orcid":"https://orcid.org/0000-0002-2569-9714"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Tidjani Garba-Seybou","raw_affiliation_strings":["STMicroelectronics,Crolles,France,38920","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France,38920","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087103079","display_name":"X. Federspiel","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Xavier Federspiel","raw_affiliation_strings":["STMicroelectronics,Crolles,France,38920","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France,38920","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085479051","display_name":"F. Monsieur","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Frederic Monsieur","raw_affiliation_strings":["STMicroelectronics,Crolles,France,38920","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France,38920","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029738777","display_name":"Mathieu Sicre","orcid":"https://orcid.org/0000-0003-2925-1850"},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Mathieu Sicre","raw_affiliation_strings":["STMicroelectronics,Crolles,France,38920","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France,38920","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063370961","display_name":"F. Cacho","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Florian Cacho","raw_affiliation_strings":["STMicroelectronics,Crolles,France,38920","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France,38920","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024922708","display_name":"Joycelyn Hai","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Joycelyn Hai","raw_affiliation_strings":["STMicroelectronics,Crolles,France,38920","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France,38920","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5104439073","display_name":"A. Bravaix","orcid":"https://orcid.org/0000-0002-2308-3537"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I3132279224","display_name":"Institut Sup\u00e9rieur de l'\u00c9lectronique et du Num\u00e9rique","ror":"https://ror.org/017h2rd72","country_code":"FR","type":"education","lineage":["https://openalex.org/I3132279224"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Alain Bravaix","raw_affiliation_strings":["ISEN Yncréa Méditerranée, REER-IM2NP UMR CNRS 7334,Toulon,France,83000"],"affiliations":[{"raw_affiliation_string":"ISEN Yncréa Méditerranée, REER-IM2NP UMR CNRS 7334,Toulon,France,83000","institution_ids":["https://openalex.org/I3132279224","https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5035925563"],"corresponding_institution_ids":["https://openalex.org/I4210104693"],"apc_list":null,"apc_paid":null,"fwci":0.5325,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":{"value":0.63687123,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/time-dependent-gate-oxide-breakdown","display_name":"Time-dependent gate oxide breakdown","score":0.895727276802063},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5917476415634155},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5838569402694702},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.49598464369773865},{"id":"https://openalex.org/keywords/gate-oxide","display_name":"Gate oxide","score":0.4937764108181},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.45669418573379517},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.43181347846984863},{"id":"https://openalex.org/keywords/breakdown-voltage","display_name":"Breakdown voltage","score":0.4273885488510132},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40188586711883545},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.39268431067466736},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3332976698875427},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25884416699409485},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.1445462703704834}],"concepts":[{"id":"https://openalex.org/C152909973","wikidata":"https://www.wikidata.org/wiki/Q7804816","display_name":"Time-dependent gate oxide breakdown","level":5,"score":0.895727276802063},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5917476415634155},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5838569402694702},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.49598464369773865},{"id":"https://openalex.org/C2361726","wikidata":"https://www.wikidata.org/wiki/Q5527031","display_name":"Gate oxide","level":4,"score":0.4937764108181},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.45669418573379517},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.43181347846984863},{"id":"https://openalex.org/C119321828","wikidata":"https://www.wikidata.org/wiki/Q1267190","display_name":"Breakdown voltage","level":3,"score":0.4273885488510132},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40188586711883545},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.39268431067466736},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3332976698875427},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25884416699409485},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.1445462703704834},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps48203.2023.10117725","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps48203.2023.10117725","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-04604661v1","is_oa":true,"landing_page_url":"https://hal.science/hal-04604661","pdf_url":"https://hal.science/hal-04604661/document","source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS 2023), Mar 2023, Monterey, CA, United States. ⟨10.1109/IRPS48203.2023.10117725⟩","raw_type":"Conference papers"}],"best_oa_location":{"id":"pmh:oai:HAL:hal-04604661v1","is_oa":true,"landing_page_url":"https://hal.science/hal-04604661","pdf_url":"https://hal.science/hal-04604661/document","source":{"id":"https://openalex.org/S4406922461","display_name":"SPIRE - Sciences Po Institutional REpository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2023 IEEE International Reliability Physics Symposium (IRPS 2023), Mar 2023, Monterey, CA, United States. ⟨10.1109/IRPS48203.2023.10117725⟩","raw_type":"Conference papers"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W4376606772.pdf"},"referenced_works_count":27,"referenced_works":["https://openalex.org/W2029347203","https://openalex.org/W2067141080","https://openalex.org/W2086663653","https://openalex.org/W2093349812","https://openalex.org/W2098550459","https://openalex.org/W2102434753","https://openalex.org/W2111744887","https://openalex.org/W2128923591","https://openalex.org/W2137035619","https://openalex.org/W2137096648","https://openalex.org/W2142289532","https://openalex.org/W2146982716","https://openalex.org/W2147842458","https://openalex.org/W2156003850","https://openalex.org/W2167276183","https://openalex.org/W2608285642","https://openalex.org/W2946123700","https://openalex.org/W3006357440","https://openalex.org/W3006670335","https://openalex.org/W3039077533","https://openalex.org/W3095985545","https://openalex.org/W3157051985","https://openalex.org/W3206537186","https://openalex.org/W4225328475","https://openalex.org/W4225331993","https://openalex.org/W4226299729","https://openalex.org/W4360585747"],"related_works":["https://openalex.org/W2099624314","https://openalex.org/W2539595190","https://openalex.org/W2106473374","https://openalex.org/W3160961382","https://openalex.org/W3038423925","https://openalex.org/W2077805257","https://openalex.org/W4229016249","https://openalex.org/W2150292786","https://openalex.org/W2311850564","https://openalex.org/W2102648694"],"abstract_inverted_index":{"A":[0],"detailed":[1],"analysis":[2],"of":[3,34,61,100],"Off-state":[4,43],"gate-oxide":[5],"breakdown":[6,27],"(BD)":[7],"mode":[8,109],"and":[9,68,94],"its":[10],"location":[11],"under":[12,48,86,107],"non-uniform":[13],"electric":[14],"field":[15],"is":[16,46,76],"performed":[17],"in":[18],"28nm":[19],"FDSOI":[20],"N-MOSFET":[21],"devices.":[22],"We":[23,70],"show":[24],"that":[25,72],"hard":[26],"(HBD)":[28],"occurs":[29],"exclusively":[30],"from":[31],"the":[32,35,38,73,77,91,96,101],"middle":[33],"channel":[36],"to":[37,84],"drain":[39,62],"overlap":[40],"extension":[41],"for":[42,80],"TDDB.":[44],"HBD":[45,85],"characterized":[47],"DC":[49],"stress":[50,88],"with":[51],"different":[52,97],"gate-length":[53],"L":[54],"G":[57],"as":[58],"a":[59],"function":[60],"voltage":[63],"V":[64],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DS":[67],"temperature.":[69],"check":[71],"leakage":[74],"current":[75],"better":[78],"monitor":[79],"TDDB":[81],"dependence":[82],"precursor":[83],"Off-mode":[87],"by":[89],"using":[90],"proper":[92],"modeling":[93],"discussing":[95],"possible":[98],"origin":[99],"higher":[102],"form":[103],"factor":[104],"\u03b2":[105],"value":[106],"Off":[108],"stressing.":[110]},"counts_by_year":[{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-11T14:59:36.786465","created_date":"2025-10-10T00:00:00"}