{"id":"https://openalex.org/W3161370575","doi":"https://doi.org/10.1109/irps46558.2021.9405198","title":"Overhead Reduction with Optimal Margining Using A Reliability Aware Design Paradigm","display_name":"Overhead Reduction with Optimal Margining Using A Reliability Aware Design Paradigm","publication_year":2021,"publication_date":"2021-03-01","ids":{"openalex":"https://openalex.org/W3161370575","doi":"https://doi.org/10.1109/irps46558.2021.9405198","mag":"3161370575"},"language":"en","primary_location":{"id":"doi:10.1109/irps46558.2021.9405198","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps46558.2021.9405198","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://lirias.kuleuven.be/handle/20.500.12942/730826","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001442930","display_name":"Subrat Mishra","orcid":"https://orcid.org/0000-0002-1435-3275"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"S. Mishra","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087726615","display_name":"Pieter Weckx","orcid":"https://orcid.org/0000-0003-4579-0571"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"P. Weckx","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013521006","display_name":"Odysseas Zografos","orcid":"https://orcid.org/0000-0002-9998-8009"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"O. Zografos","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079611556","display_name":"Ji-Yung Lin","orcid":"https://orcid.org/0000-0001-9119-6069"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"J. Y. Lin","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019510660","display_name":"A. Spessot","orcid":"https://orcid.org/0000-0003-2381-0121"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"A. Spessot","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033235745","display_name":"Francky Catthoor","orcid":"https://orcid.org/0000-0002-3599-8515"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"F. Catthoor","raw_affiliation_strings":["IMEC vzw, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"IMEC vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5001442930"],"corresponding_institution_ids":["https://openalex.org/I4210114974"],"apc_list":null,"apc_paid":null,"fwci":0.3036,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.55321341,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7553418874740601},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6988171935081482},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5989989042282104},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5978238582611084},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.5422189831733704},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.5215580463409424},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.5037927031517029},{"id":"https://openalex.org/keywords/workload","display_name":"Workload","score":0.5004026889801025},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4561518728733063},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.45056217908859253},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.43597352504730225},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24944207072257996},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.1532573699951172}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7553418874740601},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6988171935081482},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5989989042282104},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5978238582611084},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.5422189831733704},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.5215580463409424},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.5037927031517029},{"id":"https://openalex.org/C2778476105","wikidata":"https://www.wikidata.org/wiki/Q628539","display_name":"Workload","level":2,"score":0.5004026889801025},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4561518728733063},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.45056217908859253},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.43597352504730225},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24944207072257996},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.1532573699951172},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/irps46558.2021.9405198","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps46558.2021.9405198","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:20.500.12942/730826","is_oa":true,"landing_page_url":"https://lirias.kuleuven.be/handle/20.500.12942/730826","pdf_url":null,"source":{"id":"https://openalex.org/S4306401954","display_name":"Lirias (KU Leuven)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I99464096","host_organization_name":"KU Leuven","host_organization_lineage":["https://openalex.org/I99464096"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"IEEE International Reliability Physics Symposium (IRPS), ELECTR NETWORK, 21-24 March 2021","raw_type":"info:eu-repo/semantics/publishedVersion"},{"id":"pmh:oai:zenodo.org:4899462","is_oa":true,"landing_page_url":"https://zenodo.org/record/4899462","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferencePaper"}],"best_oa_location":{"id":"pmh:oai:lirias2repo.kuleuven.be:20.500.12942/730826","is_oa":true,"landing_page_url":"https://lirias.kuleuven.be/handle/20.500.12942/730826","pdf_url":null,"source":{"id":"https://openalex.org/S4306401954","display_name":"Lirias (KU Leuven)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I99464096","host_organization_name":"KU Leuven","host_organization_lineage":["https://openalex.org/I99464096"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"IEEE International Reliability Physics Symposium (IRPS), ELECTR NETWORK, 21-24 March 2021","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5477360420","display_name":null,"funder_award_id":"843546","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"}],"funders":[{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1584309135","https://openalex.org/W1956210796","https://openalex.org/W1966571707","https://openalex.org/W2020875745","https://openalex.org/W2024805091","https://openalex.org/W2083709430","https://openalex.org/W2098764315","https://openalex.org/W2114859176","https://openalex.org/W2130720335","https://openalex.org/W2155105016","https://openalex.org/W2164321834","https://openalex.org/W2357001619","https://openalex.org/W2620889448","https://openalex.org/W2973914964","https://openalex.org/W3038945185","https://openalex.org/W4246562469"],"related_works":["https://openalex.org/W986318368","https://openalex.org/W2000785801","https://openalex.org/W2384410913","https://openalex.org/W2352878646","https://openalex.org/W2990194547","https://openalex.org/W2004734601","https://openalex.org/W2130149817","https://openalex.org/W1480123525","https://openalex.org/W1979986803","https://openalex.org/W2102295724"],"abstract_inverted_index":{"Design":[0],"margins":[1,63],"are":[2],"necessary":[3],"to":[4,35,75,84],"ensure":[5],"reliable":[6],"operation":[7],"of":[8,14,25,106],"integrated":[9],"circuits":[10],"over":[11],"extreme":[12],"ranges":[13],"environmental":[15],"variations":[16],"(Voltage,":[17],"Temperature)":[18],"and":[19,88,132],"manufacturing":[20],"Process":[21],"variations.":[22],"On":[23],"top":[24],"these":[26],"PVT":[27],"variations,":[28],"aging":[29,108],"related":[30],"parametric":[31],"drift":[32],"(e.g.":[33],"due":[34,83],"BTI,":[36],"HCI)":[37],"also":[38],"limits":[39],"performance":[40],"by":[41,109,127],"requiring":[42],"additional":[43],"timing":[44],"margin.":[45],"In":[46,92],"principle,":[47],"corner":[48],"based":[49],"design":[50,126],"methodology":[51],"can":[52],"be":[53,66],"adopted.":[54],"However,":[55],"this":[56,93],"approach":[57],"is":[58],"sub-optimal,":[59],"because":[60],"it":[61,73],"applies":[62],"which":[64,80],"may":[65],"either":[67],"too":[68],"optimistic":[69],"or":[70],"pessimistic":[71],"since":[72],"tends":[74],"ignore":[76],"the":[77,85,89,104,121,129,136],"correlation":[78],"effects":[79],"exist":[81],"inherently":[82],"circuit":[86],"topology":[87],"workload":[90],"effects.":[91],"paper,":[94],"we":[95],"propose":[96],"a":[97,125],"workload-dependent":[98],"reliability":[99,143],"aware":[100],"optimization":[101],"flow":[102,117],"under":[103],"influence":[105],"NBTI":[107],"utilizing":[110],"an":[111],"optimal":[112],"margining":[113],"scheme.":[114],"The":[115],"proposed":[116],"takes":[118],"into":[119],"account":[120],"relevant":[122],"correlations":[123],"in":[124],"modelling":[128],"degradation":[130],"accurately":[131],"thus":[133],"enables":[134],"achieving":[135],"desired":[137],"Power-Performance-Area":[138],"(PPA)":[139],"goals":[140],"without":[141],"severe":[142],"penalty.":[144]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}