{"id":"https://openalex.org/W3159948958","doi":"https://doi.org/10.1109/irps46558.2021.9405096","title":"A Study on System Level UFS M-PHY Reliability Measurement Method Using RDVS","display_name":"A Study on System Level UFS M-PHY Reliability Measurement Method Using RDVS","publication_year":2021,"publication_date":"2021-03-01","ids":{"openalex":"https://openalex.org/W3159948958","doi":"https://doi.org/10.1109/irps46558.2021.9405096","mag":"3159948958"},"language":"en","primary_location":{"id":"doi:10.1109/irps46558.2021.9405096","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps46558.2021.9405096","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070914588","display_name":"NamHyuk Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"NamHyuk Yang","raw_affiliation_strings":["Samsung Electronics, Hwaseong-si, Rep. of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong-si, Rep. of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100671519","display_name":"Jinhwan Kim","orcid":"https://orcid.org/0000-0001-9451-2450"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"JinHwan Kim","raw_affiliation_strings":["Samsung Electronics, Hwaseong-si, Rep. of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong-si, Rep. of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017652848","display_name":"GeonGu Park","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"GeonGu Park","raw_affiliation_strings":["Samsung Electronics, Hwaseong-si, Rep. of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong-si, Rep. of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059152190","display_name":"ChulHyuk Kwon","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"ChulHyuk Kwon","raw_affiliation_strings":["Samsung Electronics, Hwaseong-si, Rep. of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong-si, Rep. of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057017443","display_name":"Seung\u2010Taek Lee","orcid":"https://orcid.org/0000-0001-7300-9784"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"SeungTaek Lee","raw_affiliation_strings":["Samsung Electronics, Hwaseong-si, Rep. of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong-si, Rep. of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010124316","display_name":"Sangwoo Pae","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"SangWoo Pae","raw_affiliation_strings":["Samsung Electronics, Hwaseong-si, Rep. of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong-si, Rep. of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071603147","display_name":"Hoo-Sung Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"HooSung Kim","raw_affiliation_strings":["Samsung Electronics, Hwaseong-si, Rep. of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong-si, Rep. of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047504851","display_name":"Sangwon Hwang","orcid":"https://orcid.org/0000-0003-3651-2895"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"SangWon Hwang","raw_affiliation_strings":["Samsung Electronics, Hwaseong-si, Rep. of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics, Hwaseong-si, Rep. of Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5070914588"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":0.363,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.68718934,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"40 8","issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12720","display_name":"Multimedia Communication and Technology","score":0.9614999890327454,"subfield":{"id":"https://openalex.org/subfields/3312","display_name":"Sociology and Political Science"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T12720","display_name":"Multimedia Communication and Technology","score":0.9614999890327454,"subfield":{"id":"https://openalex.org/subfields/3312","display_name":"Sociology and Political Science"},"field":{"id":"https://openalex.org/fields/33","display_name":"Social Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13924","display_name":"Internet of Things and Social Network Interactions","score":0.9575999975204468,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13905","display_name":"Telecommunications and Broadcasting Technologies","score":0.9567999839782715,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phy","display_name":"PHY","score":0.7929432988166809},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7144200801849365},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5867555141448975},{"id":"https://openalex.org/keywords/physical-layer","display_name":"Physical layer","score":0.5289559364318848},{"id":"https://openalex.org/keywords/transmission","display_name":"Transmission (telecommunications)","score":0.47895294427871704},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.4559507966041565},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4392305016517639},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4193534851074219},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4168156683444977},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.22614765167236328},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.19668540358543396},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1697237193584442},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.14770841598510742},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13651862740516663},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.09630697965621948}],"concepts":[{"id":"https://openalex.org/C41918916","wikidata":"https://www.wikidata.org/wiki/Q192727","display_name":"PHY","level":4,"score":0.7929432988166809},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7144200801849365},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5867555141448975},{"id":"https://openalex.org/C19247436","wikidata":"https://www.wikidata.org/wiki/Q192727","display_name":"Physical layer","level":3,"score":0.5289559364318848},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.47895294427871704},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.4559507966041565},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4392305016517639},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4193534851074219},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4168156683444977},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.22614765167236328},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.19668540358543396},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1697237193584442},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.14770841598510742},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13651862740516663},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.09630697965621948},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps46558.2021.9405096","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps46558.2021.9405096","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4300000071525574,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1575140032","https://openalex.org/W1580873078","https://openalex.org/W1978540353","https://openalex.org/W2003473732","https://openalex.org/W2106961978","https://openalex.org/W2168901237","https://openalex.org/W2340746967","https://openalex.org/W2490904451","https://openalex.org/W2528116241","https://openalex.org/W2537983160","https://openalex.org/W2547169465","https://openalex.org/W2908630447","https://openalex.org/W6728269102","https://openalex.org/W6729464360"],"related_works":["https://openalex.org/W2994999158","https://openalex.org/W2945523224","https://openalex.org/W4313639042","https://openalex.org/W2444418218","https://openalex.org/W4241709719","https://openalex.org/W1488909492","https://openalex.org/W2727597159","https://openalex.org/W2103723486","https://openalex.org/W4234133302","https://openalex.org/W2111773294"],"abstract_inverted_index":{"With":[0],"the":[1,20,27,32,37,69,73,77,103,108,113,127,143,167,179,187,192,195,197,200,204],"development":[2,92,114],"of":[3,29,60,76,194,199],"high":[4,189],"speed":[5,11,40,71],"serial":[6],"interface":[7],"technology,":[8],"data":[9,38],"transmission":[10,22,39,70],"is":[12,16,48,98,175],"increasing":[13],"and":[14,65,67,93,159,203],"it":[15,97],"important":[17],"to":[18,100,126,177,186],"secure":[19],"signal":[21],"quality.":[23],"In":[24,51],"particular,":[25],"in":[26,90,139],"case":[28],"smartphones,":[30],"as":[31,57,68],"5G":[33],"network":[34],"era":[35],"arrives,":[36],"required":[41],"by":[42],"mobile":[43],"phone":[44],"manufacturers":[45],"for":[46,121,172],"storage":[47],"getting":[49],"faster.":[50],"addition,":[52],"smartphones":[53],"are":[54],"being":[55],"developed":[56],"a":[58,119,133,150,154,160],"combination":[59],"various":[61],"Application":[62],"Processors":[63],"(AP)":[64],"devices,":[66],"increases,":[72],"compatibility":[74],"problem":[75],"physical":[78],"layer":[79],"(M-PHY)":[80],"has":[81],"emerged.":[82],"The":[83],"M-PHY":[84,123,144],"issue":[85],"can":[86,106],"cause":[87],"an":[88],"increase":[89],"product":[91],"verification":[94],"costs,":[95],"thus":[96],"desired":[99],"verify":[101],"using":[102],"platform":[104],"that":[105],"represent":[107],"actual":[109,128],"user":[110,129],"environment":[111,130,163],"during":[112],"stage.":[115],"This":[116],"study":[117],"proposes":[118],"method":[120],"verifying":[122],"reliability":[124,145],"similar":[125],"based":[131],"on":[132],"Universal":[134],"Flash":[135],"Storage":[136],"(UFS)":[137],"used":[138],"smartphone.":[140],"To":[141],"build":[142],"evaluation":[146,171,205],"platform,":[147],"after":[148],"deriving":[149],"valid":[151],"variable":[152,155,201],"factor,":[153],"range":[156],"was":[157,164,207],"set,":[158],"virtual":[161],"noise":[162],"built":[165],"through":[166],"variable.":[168],"UFS":[169,188],"device":[170],"each":[173],"gear(speed)":[174],"conducted":[176],"compare":[178],"bit":[180],"error":[181],"rate":[182],"(BER)":[183],"trend":[184],"according":[185],"speed.":[190],"Through":[191],"analysis":[193],"results,":[196],"consistency":[198],"factor":[202],"system":[206],"successfully":[208],"demonstrated.":[209]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}