{"id":"https://openalex.org/W3040306552","doi":"https://doi.org/10.1109/irps45951.2020.9129638","title":"Reliability Aspects of SONOS Based Analog Memory for Neuromorphic Computing","display_name":"Reliability Aspects of SONOS Based Analog Memory for Neuromorphic Computing","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3040306552","doi":"https://doi.org/10.1109/irps45951.2020.9129638","mag":"3040306552"},"language":"en","primary_location":{"id":"doi:10.1109/irps45951.2020.9129638","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9129638","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108023963","display_name":"K. Ramkumar","orcid":"https://orcid.org/0000-0003-0795-6956"},"institutions":[{"id":"https://openalex.org/I4210127281","display_name":"Cypress Semiconductor Corporation (United States)","ror":"https://ror.org/02wpc5d77","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127281"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Ramkumar","raw_affiliation_strings":["Technology R&D, Cypress Semiconductor Corporation, San Jose, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology R&D, Cypress Semiconductor Corporation, San Jose, CA, USA","institution_ids":["https://openalex.org/I4210127281"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026831641","display_name":"V. Prabhakar","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127281","display_name":"Cypress Semiconductor Corporation (United States)","ror":"https://ror.org/02wpc5d77","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127281"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. Prabhakar","raw_affiliation_strings":["Technology R&D, Cypress Semiconductor Corporation, San Jose, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology R&D, Cypress Semiconductor Corporation, San Jose, CA, USA","institution_ids":["https://openalex.org/I4210127281"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058664767","display_name":"Vikesh Agrawal","orcid":"https://orcid.org/0000-0003-0144-5952"},"institutions":[{"id":"https://openalex.org/I4210127281","display_name":"Cypress Semiconductor Corporation (United States)","ror":"https://ror.org/02wpc5d77","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127281"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"V. Agrawal","raw_affiliation_strings":["Technology R&D, Cypress Semiconductor Corporation, San Jose, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology R&D, Cypress Semiconductor Corporation, San Jose, CA, USA","institution_ids":["https://openalex.org/I4210127281"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088632310","display_name":"Long Hinh","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127281","display_name":"Cypress Semiconductor Corporation (United States)","ror":"https://ror.org/02wpc5d77","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127281"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L. Hinh","raw_affiliation_strings":["Technology R&D, Cypress Semiconductor Corporation, San Jose, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology R&D, Cypress Semiconductor Corporation, San Jose, CA, USA","institution_ids":["https://openalex.org/I4210127281"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026604745","display_name":"Swatilekha Saha","orcid":"https://orcid.org/0000-0003-2366-8620"},"institutions":[{"id":"https://openalex.org/I4210127281","display_name":"Cypress Semiconductor Corporation (United States)","ror":"https://ror.org/02wpc5d77","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127281"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Saha","raw_affiliation_strings":["Technology R&D, Cypress Semiconductor Corporation, San Jose, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology R&D, Cypress Semiconductor Corporation, San Jose, CA, USA","institution_ids":["https://openalex.org/I4210127281"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002567391","display_name":"Sutanu Samanta","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127281","display_name":"Cypress Semiconductor Corporation (United States)","ror":"https://ror.org/02wpc5d77","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127281"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Samanta","raw_affiliation_strings":["Technology R&D, Cypress Semiconductor Corporation, San Jose, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology R&D, Cypress Semiconductor Corporation, San Jose, CA, USA","institution_ids":["https://openalex.org/I4210127281"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112325435","display_name":"R. Kapre","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127281","display_name":"Cypress Semiconductor Corporation (United States)","ror":"https://ror.org/02wpc5d77","country_code":"US","type":"company","lineage":["https://openalex.org/I4210127281"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. M. Kapre","raw_affiliation_strings":["Technology R&D, Cypress Semiconductor Corporation, San Jose, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Technology R&D, Cypress Semiconductor Corporation, San Jose, CA, USA","institution_ids":["https://openalex.org/I4210127281"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1041,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.42213339,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/neuromorphic-engineering","display_name":"Neuromorphic engineering","score":0.8720462322235107},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7764155864715576},{"id":"https://openalex.org/keywords/data-retention","display_name":"Data retention","score":0.6956405639648438},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.626217246055603},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.5202801823616028},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.42906278371810913},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4265410900115967},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3923836648464203},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3911878764629364},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.33230873942375183},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1627124547958374},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13146060705184937},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.09598445892333984}],"concepts":[{"id":"https://openalex.org/C151927369","wikidata":"https://www.wikidata.org/wiki/Q1981312","display_name":"Neuromorphic engineering","level":3,"score":0.8720462322235107},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7764155864715576},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.6956405639648438},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.626217246055603},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.5202801823616028},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.42906278371810913},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4265410900115967},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3923836648464203},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3911878764629364},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.33230873942375183},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1627124547958374},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13146060705184937},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.09598445892333984},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps45951.2020.9129638","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9129638","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.47999998927116394,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1982691031","https://openalex.org/W2052802950","https://openalex.org/W2058130446","https://openalex.org/W2137980144","https://openalex.org/W2158178489","https://openalex.org/W2765081478","https://openalex.org/W2808985247","https://openalex.org/W2953013835","https://openalex.org/W3006575968","https://openalex.org/W3099073033","https://openalex.org/W6683106926","https://openalex.org/W6752309912"],"related_works":["https://openalex.org/W2110321764","https://openalex.org/W3031505884","https://openalex.org/W3013437739","https://openalex.org/W2951049725","https://openalex.org/W4285308918","https://openalex.org/W2971712727","https://openalex.org/W4387459935","https://openalex.org/W2908450434","https://openalex.org/W3193008624","https://openalex.org/W4382561696"],"abstract_inverted_index":{"Reliability":[0],"of":[1,53],"40nm":[2],"SONOS":[3,54],"(Si-Oxide-Nitride-Oxide-Si)":[4],"based":[5],"non-volatile":[6],"memory":[7,15,65],"(NVM)":[8],"cell":[9],"has":[10],"been":[11],"evaluated":[12,56],"for":[13,37],"analog":[14],"to":[16,27,42],"perform":[17],"neuromorphic":[18],"computing.":[19],"Process":[20],"flow":[21],"and":[22,34,67],"smart-write":[23],"algorithms":[24],"were":[25],"developed":[26],"tune":[28],"key":[29],"reliability":[30,46],"parameters":[31],"like":[32],"retention":[33,69],"noise":[35],"performance":[36,52],"this":[38],"application.":[39],"Their":[40],"optimization":[41],"meet":[43],"the":[44,68],"product":[45],"requirements":[47],"are":[48,72],"also":[49],"discussed.":[50,73],"The":[51],"was":[55],"on":[57],"mini":[58],"test":[59],"arrays":[60,66],"as":[61,63],"well":[62],"actual":[64],"data":[70],"obtained":[71]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}