{"id":"https://openalex.org/W3039571017","doi":"https://doi.org/10.1109/irps45951.2020.9129230","title":"A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs","display_name":"A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3039571017","doi":"https://doi.org/10.1109/irps45951.2020.9129230","mag":"3039571017"},"language":"en","primary_location":{"id":"doi:10.1109/irps45951.2020.9129230","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9129230","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://researchonline.ljmu.ac.uk/id/eprint/14131/1/2020IRPS_Full%20manuscript_Submission%20ID%3D32.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5008578458","display_name":"Rui Gao","orcid":"https://orcid.org/0000-0001-7400-3931"},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"R. Gao","raw_affiliation_strings":["China Electronic Product Reliability and Environment Research Institute,Guangzhou,P. R. China,510610","China Electronic Product Reliability and Environment Research Institute, Guangzhou, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electronic Product Reliability and Environment Research Institute,Guangzhou,P. R. China,510610","institution_ids":["https://openalex.org/I4210113818"]},{"raw_affiliation_string":"China Electronic Product Reliability and Environment Research Institute, Guangzhou, P. R. China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060199064","display_name":"Mehzabeen Mehedi","orcid":null},"institutions":[{"id":"https://openalex.org/I63098007","display_name":"Liverpool John Moores University","ror":"https://ror.org/04zfme737","country_code":"GB","type":"education","lineage":["https://openalex.org/I63098007"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"M. Mehedi","raw_affiliation_strings":["Liverpool John Moores University,School of Engineering,Liverpool,UK,L3 3AF","School of Engineering, Liverpool John Moores University, Liverpool, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Liverpool John Moores University,School of Engineering,Liverpool,UK,L3 3AF","institution_ids":["https://openalex.org/I63098007"]},{"raw_affiliation_string":"School of Engineering, Liverpool John Moores University, Liverpool, UK","institution_ids":["https://openalex.org/I63098007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016870454","display_name":"H. Chen","orcid":"https://orcid.org/0000-0002-9936-0115"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"H. Chen","raw_affiliation_strings":["Shanghai Jiaotong University,School of Microelectronics,P. R. China,200240","School of Microelectronics, Shanghai Jiaotong University, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Jiaotong University,School of Microelectronics,P. R. China,200240","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"School of Microelectronics, Shanghai Jiaotong University, P. R. China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100346022","display_name":"Xiaojun Wang","orcid":"https://orcid.org/0000-0003-3868-5642"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"X. Wang","raw_affiliation_strings":["Harbin Institute of Technology at Weihai,Department of Electronics & Electrical Engineering,Shandong,P. R. China,264209","Department of Electronics & Electrical Engineering, Harbin Institute of Technology at Weihai, Shandong, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology at Weihai,Department of Electronics & Electrical Engineering,Shandong,P. R. China,264209","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Department of Electronics & Electrical Engineering, Harbin Institute of Technology at Weihai, Shandong, P. R. China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036637389","display_name":"J. F. Zhang","orcid":"https://orcid.org/0000-0003-4987-6428"},"institutions":[{"id":"https://openalex.org/I63098007","display_name":"Liverpool John Moores University","ror":"https://ror.org/04zfme737","country_code":"GB","type":"education","lineage":["https://openalex.org/I63098007"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"J. F. Zhang","raw_affiliation_strings":["Liverpool John Moores University,School of Engineering,Liverpool,UK,L3 3AF","School of Engineering, Liverpool John Moores University, Liverpool, UK"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Liverpool John Moores University,School of Engineering,Liverpool,UK,L3 3AF","institution_ids":["https://openalex.org/I63098007"]},{"raw_affiliation_string":"School of Engineering, Liverpool John Moores University, Liverpool, UK","institution_ids":["https://openalex.org/I63098007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032081144","display_name":"X. L. Lin","orcid":null},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"X. L. Lin","raw_affiliation_strings":["China Electronic Product Reliability and Environment Research Institute,Guangzhou,P. R. China,510610","China Electronic Product Reliability and Environment Research Institute, Guangzhou, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electronic Product Reliability and Environment Research Institute,Guangzhou,P. R. China,510610","institution_ids":["https://openalex.org/I4210113818"]},{"raw_affiliation_string":"China Electronic Product Reliability and Environment Research Institute, Guangzhou, P. R. China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100333998","display_name":"Zhiyuan He","orcid":"https://orcid.org/0000-0002-0064-3626"},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Z. Y. He","raw_affiliation_strings":["China Electronic Product Reliability and Environment Research Institute,Guangzhou,P. R. China,510610","China Electronic Product Reliability and Environment Research Institute, Guangzhou, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electronic Product Reliability and Environment Research Institute,Guangzhou,P. R. China,510610","institution_ids":["https://openalex.org/I4210113818"]},{"raw_affiliation_string":"China Electronic Product Reliability and Environment Research Institute, Guangzhou, P. R. China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101455397","display_name":"Yiqiang Chen","orcid":"https://orcid.org/0000-0001-6901-3000"},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Y. Q. Chen","raw_affiliation_strings":["China Electronic Product Reliability and Environment Research Institute,Guangzhou,P. R. China,510610","China Electronic Product Reliability and Environment Research Institute, Guangzhou, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electronic Product Reliability and Environment Research Institute,Guangzhou,P. R. China,510610","institution_ids":["https://openalex.org/I4210113818"]},{"raw_affiliation_string":"China Electronic Product Reliability and Environment Research Institute, Guangzhou, P. R. China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020411063","display_name":"Dengyun Lei","orcid":"https://orcid.org/0000-0001-8935-649X"},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"D. Y. Lei","raw_affiliation_strings":["China Electronic Product Reliability and Environment Research Institute,Guangzhou,P. R. China,510610","China Electronic Product Reliability and Environment Research Institute, Guangzhou, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electronic Product Reliability and Environment Research Institute,Guangzhou,P. R. China,510610","institution_ids":["https://openalex.org/I4210113818"]},{"raw_affiliation_string":"China Electronic Product Reliability and Environment Research Institute, Guangzhou, P. R. China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101460522","display_name":"Yiming Huang","orcid":"https://orcid.org/0009-0009-7531-039X"},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Y. Huang","raw_affiliation_strings":["China Electronic Product Reliability and Environment Research Institute,Guangzhou,P. R. China,510610","China Electronic Product Reliability and Environment Research Institute, Guangzhou, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electronic Product Reliability and Environment Research Institute,Guangzhou,P. R. China,510610","institution_ids":["https://openalex.org/I4210113818"]},{"raw_affiliation_string":"China Electronic Product Reliability and Environment Research Institute, Guangzhou, P. R. China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000237593","display_name":"Yunfei En","orcid":"https://orcid.org/0000-0002-9038-8103"},"institutions":[{"id":"https://openalex.org/I4210113818","display_name":"China Electronic Product Reliability and Environmental Test Institute","ror":"https://ror.org/01f4k3b46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210113818"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Y. F. En","raw_affiliation_strings":["China Electronic Product Reliability and Environment Research Institute,Guangzhou,P. R. China,510610","China Electronic Product Reliability and Environment Research Institute, Guangzhou, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"China Electronic Product Reliability and Environment Research Institute,Guangzhou,P. R. China,510610","institution_ids":["https://openalex.org/I4210113818"]},{"raw_affiliation_string":"China Electronic Product Reliability and Environment Research Institute, Guangzhou, P. R. China","institution_ids":["https://openalex.org/I4210113818"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058083493","display_name":"Zhigang Ji","orcid":"https://orcid.org/0000-0003-1138-804X"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Z. Ji","raw_affiliation_strings":["Shanghai Jiaotong University,National Key Laboratory of Science and Technology on Micro/Nano Fabrication,Shanghai,P. R. China,200240","National Key Laboratory of Science and Technology on Micro/Nano Fabrication, Shanghai Jiaotong University, Shanghai, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Shanghai Jiaotong University,National Key Laboratory of Science and Technology on Micro/Nano Fabrication,Shanghai,P. R. China,200240","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"National Key Laboratory of Science and Technology on Micro/Nano Fabrication, Shanghai Jiaotong University, Shanghai, P. R. China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036325339","display_name":"R. Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I20231570","display_name":"Peking University","ror":"https://ror.org/02v51f717","country_code":"CN","type":"education","lineage":["https://openalex.org/I20231570"]},{"id":"https://openalex.org/I4210119392","display_name":"Institute of Microelectronics","ror":"https://ror.org/02s6gs133","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210119392"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"R. Wang","raw_affiliation_strings":["Peking University,Institute of Microelectronics,Beijing,P. R. China,100871","Institute of Microelectronics, Peking University, Beijing, P. R. China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Peking University,Institute of Microelectronics,Beijing,P. R. China,100871","institution_ids":["https://openalex.org/I20231570","https://openalex.org/I4210119392"]},{"raw_affiliation_string":"Institute of Microelectronics, Peking University, Beijing, P. R. China","institution_ids":["https://openalex.org/I20231570","https://openalex.org/I4210119392"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":13,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2081,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.50853284,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nano","display_name":"Nano-","score":0.5781244039535522},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5152128338813782},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.47918474674224854},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45966634154319763},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.33014675974845886},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.328914999961853},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2440076470375061}],"concepts":[{"id":"https://openalex.org/C2780357685","wikidata":"https://www.wikidata.org/wiki/Q154357","display_name":"Nano-","level":2,"score":0.5781244039535522},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5152128338813782},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.47918474674224854},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45966634154319763},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.33014675974845886},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.328914999961853},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2440076470375061},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps45951.2020.9129230","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9129230","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:researchonline.ljmu.ac.uk:14131","is_oa":true,"landing_page_url":null,"pdf_url":"https://researchonline.ljmu.ac.uk/id/eprint/14131/1/2020IRPS_Full%20manuscript_Submission%20ID%3D32.pdf","source":{"id":"https://openalex.org/S4306401246","display_name":"Liverpool John Moores University","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I63098007","host_organization_name":"Liverpool John Moores University","host_organization_lineage":["https://openalex.org/I63098007"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference or Workshop Item"}],"best_oa_location":{"id":"pmh:oai:researchonline.ljmu.ac.uk:14131","is_oa":true,"landing_page_url":null,"pdf_url":"https://researchonline.ljmu.ac.uk/id/eprint/14131/1/2020IRPS_Full%20manuscript_Submission%20ID%3D32.pdf","source":{"id":"https://openalex.org/S4306401246","display_name":"Liverpool John Moores University","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I63098007","host_organization_name":"Liverpool John Moores University","host_organization_lineage":["https://openalex.org/I63098007"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference or Workshop Item"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2538574774","display_name":null,"funder_award_id":"EP/L010607/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W3039571017.pdf","grobid_xml":"https://content.openalex.org/works/W3039571017.grobid-xml"},"referenced_works_count":22,"referenced_works":["https://openalex.org/W1519877492","https://openalex.org/W1994014147","https://openalex.org/W2026785404","https://openalex.org/W2034484655","https://openalex.org/W2035374584","https://openalex.org/W2045583681","https://openalex.org/W2045769000","https://openalex.org/W2057593019","https://openalex.org/W2073767856","https://openalex.org/W2077635144","https://openalex.org/W2086126257","https://openalex.org/W2086739087","https://openalex.org/W2097733814","https://openalex.org/W2123485989","https://openalex.org/W2126813050","https://openalex.org/W2150230118","https://openalex.org/W2167981182","https://openalex.org/W2527506610","https://openalex.org/W2585053806","https://openalex.org/W2591640162","https://openalex.org/W2750649354","https://openalex.org/W2981743243"],"related_works":["https://openalex.org/W4402299999","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W2898370298","https://openalex.org/W2137437058","https://openalex.org/W4390401159","https://openalex.org/W2744391499","https://openalex.org/W2800070131","https://openalex.org/W4230250635","https://openalex.org/W3041790586"],"abstract_inverted_index":{"Random":[0],"Telegraph":[1],"Noise":[2],"(RTN)/fluctuation":[3],"is":[4,35,55],"one":[5],"of":[6,52,85],"the":[7,30,62,68,87],"most":[8],"serious":[9],"reliability":[10],"issues":[11],"in":[12,57],"modern":[13],"deeply":[14],"scaled":[15],"CMOS.":[16],"The":[17],"current":[18],"RTN":[19],"characterization":[20],"methods":[21],"need":[22],"to":[23,38],"select":[24],"devices":[25],"and":[26,40,49,80],"can":[27,71,76],"only":[28],"capture":[29],"fast":[31,48],"traps,":[32],"thus":[33],"it":[34],"very":[36],"difficult":[37],"predict":[39],"validate":[41],"device":[42],"long-term":[43],"fluctuation":[44,70],"behavior.":[45],"A":[46],"new":[47],"test-proven":[50],"methodology":[51],"assessing":[53],"RTN/fluctuation":[54],"proposed":[56],"this":[58],"work.":[59],"By":[60],"using":[61],"Within":[63],"Device":[64],"Fluctuation":[65],"(WDF),":[66],"all":[67,86],"devices\u2019":[69],"be":[72,77],"captured.":[73],"Moreover,":[74],"WDF":[75],"well":[78],"explained":[79],"simulated":[81],"as":[82],"a":[83],"sum":[84],"As-grown":[88],"Traps":[89],"(AT)":[90],"induced":[91],"RTN.":[92]},"counts_by_year":[{"year":2022,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}