{"id":"https://openalex.org/W3039077533","doi":"https://doi.org/10.1109/irps45951.2020.9129214","title":"Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS","display_name":"Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3039077533","doi":"https://doi.org/10.1109/irps45951.2020.9129214","mag":"3039077533"},"language":"en","primary_location":{"id":"doi:10.1109/irps45951.2020.9129214","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9129214","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5104439073","display_name":"A. Bravaix","orcid":"https://orcid.org/0000-0002-2308-3537"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I3132279224","display_name":"Institut Sup\u00e9rieur de l'\u00c9lectronique et du Num\u00e9rique","ror":"https://ror.org/017h2rd72","country_code":"FR","type":"education","lineage":["https://openalex.org/I3132279224"]},{"id":"https://openalex.org/I4210112016","display_name":"Institut des Mat\u00e9riaux, de Micro\u00e9lectronique et des Nanosciences de Provence","ror":"https://ror.org/0238zyh04","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I143002897","https://openalex.org/I21491767","https://openalex.org/I3132279224","https://openalex.org/I4210098836","https://openalex.org/I4210112016"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Alain Bravaix","raw_affiliation_strings":["Maison des technologies,IM2NP-ISEN, UMR CNRS 7334,Toulon,France,83000"],"affiliations":[{"raw_affiliation_string":"Maison des technologies,IM2NP-ISEN, UMR CNRS 7334,Toulon,France,83000","institution_ids":["https://openalex.org/I3132279224","https://openalex.org/I4210112016","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008813980","display_name":"Edith Kussener","orcid":"https://orcid.org/0000-0002-1670-9327"},"institutions":[{"id":"https://openalex.org/I4210112016","display_name":"Institut des Mat\u00e9riaux, de Micro\u00e9lectronique et des Nanosciences de Provence","ror":"https://ror.org/0238zyh04","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I143002897","https://openalex.org/I21491767","https://openalex.org/I3132279224","https://openalex.org/I4210098836","https://openalex.org/I4210112016"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I3132279224","display_name":"Institut Sup\u00e9rieur de l'\u00c9lectronique et du Num\u00e9rique","ror":"https://ror.org/017h2rd72","country_code":"FR","type":"education","lineage":["https://openalex.org/I3132279224"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Edith Kussener","raw_affiliation_strings":["Maison des technologies,IM2NP-ISEN, UMR CNRS 7334,Toulon,France,83000"],"affiliations":[{"raw_affiliation_string":"Maison des technologies,IM2NP-ISEN, UMR CNRS 7334,Toulon,France,83000","institution_ids":["https://openalex.org/I3132279224","https://openalex.org/I4210112016","https://openalex.org/I1294671590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030226306","display_name":"D. Ney","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"David Ney","raw_affiliation_strings":["STMicroelectronics,Crolles,France,38926","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France,38926","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087103079","display_name":"X. Federspiel","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Xavier Federspiel","raw_affiliation_strings":["STMicroelectronics,Crolles,France,38926","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France,38926","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5063370961","display_name":"F. Cacho","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104693","display_name":"STMicroelectronics (France)","ror":"https://ror.org/01c74sd89","country_code":"FR","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210104693"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Florian Cacho","raw_affiliation_strings":["STMicroelectronics,Crolles,France,38926","ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)"],"affiliations":[{"raw_affiliation_string":"STMicroelectronics,Crolles,France,38926","institution_ids":["https://openalex.org/I4210104693"]},{"raw_affiliation_string":"ST-CROLLES - STMicroelectronics [Crolles] (850 rue Jean Monnet BP 16 38926 Crolles - France)","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5104439073"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I3132279224","https://openalex.org/I4210112016"],"apc_list":null,"apc_paid":null,"fwci":0.6223,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.67747977,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.44966214895248413}],"concepts":[{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.44966214895248413}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps45951.2020.9129214","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9129214","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-03659275v1","is_oa":false,"landing_page_url":"https://hal.science/hal-03659275","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS), Apr 2020, Dallas, France. pp.1-8, &#x27E8;10.1109/IRPS45951.2020.9129214&#x27E9;","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1672498908","https://openalex.org/W1944763706","https://openalex.org/W1973659025","https://openalex.org/W1974741798","https://openalex.org/W1999169264","https://openalex.org/W2025966285","https://openalex.org/W2029316851","https://openalex.org/W2030105454","https://openalex.org/W2036357065","https://openalex.org/W2068765570","https://openalex.org/W2072096830","https://openalex.org/W2073090060","https://openalex.org/W2077451903","https://openalex.org/W2089673179","https://openalex.org/W2095322467","https://openalex.org/W2096995644","https://openalex.org/W2099624314","https://openalex.org/W2100572368","https://openalex.org/W2102352834","https://openalex.org/W2107009305","https://openalex.org/W2107079616","https://openalex.org/W2112778928","https://openalex.org/W2115997634","https://openalex.org/W2117810651","https://openalex.org/W2123082808","https://openalex.org/W2134541455","https://openalex.org/W2135804694","https://openalex.org/W2137096648","https://openalex.org/W2143611291","https://openalex.org/W2146007527","https://openalex.org/W2146151178","https://openalex.org/W2146982716","https://openalex.org/W2149961975","https://openalex.org/W2160557949","https://openalex.org/W2161109468","https://openalex.org/W2164480240","https://openalex.org/W2314355690","https://openalex.org/W2944891235","https://openalex.org/W6644857354"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2935759653","https://openalex.org/W3105167352","https://openalex.org/W54078636","https://openalex.org/W2954470139","https://openalex.org/W1501425562","https://openalex.org/W2902782467","https://openalex.org/W3084825885","https://openalex.org/W2298861036","https://openalex.org/W2271181815"],"abstract_inverted_index":{"Extended":[0],"Drain":[1],"MOS":[2],"(EDMOS)":[3],"transistors":[4],"were":[5,50],"studied":[6],"about":[7],"hot-carrier":[8],"(HC)":[9],"degradation":[10],"and":[11,46,55,64,93,131,150,175],"its":[12],"involvement":[13],"in":[14,34,69,125,167],"hard":[15],"breakdown":[16],"(BD)":[17],"events":[18,124],"as":[19,79],"these":[20],"smart":[21],"power":[22,171],"devices":[23,38],"represent":[24],"a":[25,80],"big":[26],"challenge":[27],"to":[28,60,121,137,158],"optimize":[29],"under":[30],"Off/On":[31],"mode":[32,152],"switching":[33],"RF":[35],"circuits.":[36],"N-channel":[37],"with":[39,112,143],"gate-length":[40],"L":[41],"<inf":[42,85,90,95,101,117],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[43,86,91,96,102,118],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">G</inf>":[44],"=0.5\u00b5m":[45],"two":[47],"gate-oxide":[48],"thicknesses":[49],"tested":[51],"Tox=":[52],"2.3nm":[53],"(GO1)":[54],"8.5nm":[56],"(GO2).":[57],"The":[58],"sensitivity":[59],"BD":[61,123],"between":[62,148],"Off-mode":[63],"HC":[65,106],"is":[66],"pointed":[67],"out":[68],"GO1":[70],"through":[71],"the":[72,99,126,138],"hot-hole":[73],"injections":[74],"(HHI)":[75],"that":[76,108],"are":[77,134],"involved":[78],"function":[81],"of":[82,141],"gate-voltage":[83],"V":[84,89,94,100],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">GS</inf>":[87],"=":[88],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">TH</inf>":[92,103],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">Gmax</inf>":[97],"where":[98],"case":[104],"induces":[105],"damage":[107],"can":[109,155],"be":[110,156],"used":[111,157],"series":[113],"resistance":[114],"increase":[115],"(\u0394R":[116],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">SD</inf>":[119],")":[120],"detect":[122],"drift":[127],"region.":[128],"Hole":[129],"trapping":[130],"interface":[132],"traps":[133],"generated":[135],"leading":[136],"dominant":[139],"effect":[140],"HHI,":[142],"very":[144],"close":[145],"generation":[146],"rates":[147],"Off-":[149],"On-":[151],"stressing.":[153],"This":[154],"prevent":[159],"circuit":[160],"aging":[161],"giving":[162],"warning":[163],"level":[164],"for":[165,170],"confidence":[166],"AC":[168],"lifetime":[169],"amplifiers":[172],"class":[173,176],"E":[174],"A.":[177]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}