{"id":"https://openalex.org/W3038783829","doi":"https://doi.org/10.1109/irps45951.2020.9129198","title":"The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release","display_name":"The Mysterious Bipolar Bias Temperature Stress from the Perspective of Gate-Sided Hydrogen Release","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3038783829","doi":"https://doi.org/10.1109/irps45951.2020.9129198","mag":"3038783829"},"language":"en","primary_location":{"id":"doi:10.1109/irps45951.2020.9129198","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9129198","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062594496","display_name":"Tibor Grasser","orcid":"https://orcid.org/0000-0001-6536-2238"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"T. Grasser","raw_affiliation_strings":["Institute for Microelectronics, TU Wien, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Microelectronics, TU Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058263075","display_name":"B. Kaczer","orcid":"https://orcid.org/0000-0002-1484-4007"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"B. Kaczer","raw_affiliation_strings":["imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082855147","display_name":"Barry O\u2019Sullivan","orcid":"https://orcid.org/0000-0002-9036-8241"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"B. O'Sullivan","raw_affiliation_strings":["imec, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008613051","display_name":"G. Rzepa","orcid":"https://orcid.org/0000-0002-3711-1957"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. Rzepa","raw_affiliation_strings":["Global TCAD Solutions, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Global TCAD Solutions, Austria","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088631482","display_name":"Bernhard Stampfer","orcid":"https://orcid.org/0000-0001-5424-7488"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"B. Stampfer","raw_affiliation_strings":["CDL for Single Defect Spectroscopy at the Institute for Microelectronics, TU Wien, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CDL for Single Defect Spectroscopy at the Institute for Microelectronics, TU Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077464890","display_name":"Michael Waltl","orcid":"https://orcid.org/0000-0001-6042-759X"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"M. Waltl","raw_affiliation_strings":["CDL for Single Defect Spectroscopy at the Institute for Microelectronics, TU Wien, Austria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CDL for Single Defect Spectroscopy at the Institute for Microelectronics, TU Wien, Austria","institution_ids":["https://openalex.org/I145847075"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.5783,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.94165052,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":93,"max":97},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/oxide","display_name":"Oxide","score":0.6085538268089294},{"id":"https://openalex.org/keywords/perspective","display_name":"Perspective (graphical)","score":0.607601523399353},{"id":"https://openalex.org/keywords/hydrogen","display_name":"Hydrogen","score":0.5970103144645691},{"id":"https://openalex.org/keywords/stress","display_name":"Stress (linguistics)","score":0.5096726417541504},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.4682617783546448},{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.4529147148132324},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.38170042634010315},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.37083131074905396},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3664996027946472},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34485918283462524},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3320704996585846},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3277367949485779},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1478603482246399},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14070448279380798},{"id":"https://openalex.org/keywords/philosophy","display_name":"Philosophy","score":0.10371893644332886},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08488968014717102},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.08477407693862915},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.07728490233421326}],"concepts":[{"id":"https://openalex.org/C2779851234","wikidata":"https://www.wikidata.org/wiki/Q50690","display_name":"Oxide","level":2,"score":0.6085538268089294},{"id":"https://openalex.org/C12713177","wikidata":"https://www.wikidata.org/wiki/Q1900281","display_name":"Perspective (graphical)","level":2,"score":0.607601523399353},{"id":"https://openalex.org/C512968161","wikidata":"https://www.wikidata.org/wiki/Q556","display_name":"Hydrogen","level":2,"score":0.5970103144645691},{"id":"https://openalex.org/C21036866","wikidata":"https://www.wikidata.org/wiki/Q181767","display_name":"Stress (linguistics)","level":2,"score":0.5096726417541504},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.4682617783546448},{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.4529147148132324},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.38170042634010315},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.37083131074905396},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3664996027946472},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34485918283462524},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3320704996585846},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3277367949485779},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1478603482246399},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14070448279380798},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.10371893644332886},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08488968014717102},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.08477407693862915},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.07728490233421326},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps45951.2020.9129198","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9129198","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W1604552185","https://openalex.org/W1972409839","https://openalex.org/W1975277570","https://openalex.org/W1977727537","https://openalex.org/W1981009883","https://openalex.org/W1996951009","https://openalex.org/W2001623355","https://openalex.org/W2014708246","https://openalex.org/W2015731339","https://openalex.org/W2019004317","https://openalex.org/W2056739308","https://openalex.org/W2061770847","https://openalex.org/W2062874667","https://openalex.org/W2064072391","https://openalex.org/W2065765234","https://openalex.org/W2068063617","https://openalex.org/W2074642457","https://openalex.org/W2076640651","https://openalex.org/W2081048183","https://openalex.org/W2108451895","https://openalex.org/W2109943652","https://openalex.org/W2114859176","https://openalex.org/W2132716095","https://openalex.org/W2151860561","https://openalex.org/W2153685625","https://openalex.org/W2158046457","https://openalex.org/W2288350806","https://openalex.org/W2468016554","https://openalex.org/W2523194864","https://openalex.org/W2527586943","https://openalex.org/W2537891096","https://openalex.org/W2621126165","https://openalex.org/W2781758939","https://openalex.org/W2797124026","https://openalex.org/W2802181803","https://openalex.org/W2802502993","https://openalex.org/W2974006943","https://openalex.org/W3106453698","https://openalex.org/W6655233195","https://openalex.org/W6682441551"],"related_works":["https://openalex.org/W2374313965","https://openalex.org/W2157278395","https://openalex.org/W1991431227","https://openalex.org/W2100282217","https://openalex.org/W2059440611","https://openalex.org/W3143610959","https://openalex.org/W4205623620","https://openalex.org/W2905252662","https://openalex.org/W2142629062","https://openalex.org/W2083433971"],"abstract_inverted_index":{"While":[0],"the":[1,15,60,71,82,85,88,104,119,123],"bias":[2,67],"temperature":[3],"instability":[4],"has":[5],"provided":[6],"many":[7],"puzzles":[8],"for":[9,44,95,117],"more":[10],"than":[11,27],"half":[12],"a":[13,99],"century,":[14],"observation":[16],"that":[17],"bipolar":[18,109],"(+Vg/-Vg)":[19],"AC":[20,32,110],"stress":[21,111],"can":[22,102],"lead":[23],"to":[24,55],"larger":[25],"degradation":[26,106],"DC":[28],"or":[29],"unipolar":[30],"(Vg/0)":[31],"NBTI/PBTI":[33],"combined,":[34],"is":[35,129],"particularly":[36],"mysterious.":[37],"Interestingly,":[38],"similar":[39],"observations":[40],"have":[41,52],"been":[42,53],"made":[43],"oxide":[45,61,124],"breakdown":[46],"and":[47,65,112,114],"hot":[48],"carrier":[49],"injection.":[50],"Both":[51],"linked":[54],"accelerated":[56,105],"hydrogen":[57,92],"release":[58,93],"from":[59,84,126],"under":[62],"alternating":[63],"positive":[64],"negative":[66],"which":[68,101,127],"then":[69],"causes":[70],"creation":[72],"of":[73,87],"near-interface":[74],"states.":[75],"Based":[76],"on":[77],"these":[78],"observations,":[79],"we":[80],"investigate":[81,113],"phenomenon":[83],"perspective":[86],"recently":[89],"proposed":[90],"gate-sided":[91],"model":[94],"BTI.":[96],"We":[97],"suggest":[98],"mechanism":[100],"explain":[103],"observed":[107],"during":[108],"validate":[115],"possibilities":[116],"mitigating":[118],"effect":[120],"by":[121],"reducing":[122],"volume":[125],"H":[128],"released.":[130]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}