{"id":"https://openalex.org/W3039392045","doi":"https://doi.org/10.1109/irps45951.2020.9129098","title":"Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors","display_name":"Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3039392045","doi":"https://doi.org/10.1109/irps45951.2020.9129098","mag":"3039392045"},"language":"en","primary_location":{"id":"doi:10.1109/irps45951.2020.9129098","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9129098","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018900357","display_name":"Kalparupa Mukherjee","orcid":"https://orcid.org/0000-0003-1387-3321"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Kalparupa Mukherjee","raw_affiliation_strings":["Department of Information Engineering, University of Padova, Padova, Italy","Department of Information Engineering University of Padova Padova 35121, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Padova, Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Department of Information Engineering University of Padova Padova 35121, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064109540","display_name":"Carlo De Santi","orcid":"https://orcid.org/0000-0001-6064-077X"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Carlo De Santi","raw_affiliation_strings":["Department of Information Engineering, University of Padova, Padova, Italy","Department of Information Engineering University of Padova Padova 35121, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Padova, Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Department of Information Engineering University of Padova Padova 35121, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101587480","display_name":"Gaudenzio Meneghesso","orcid":"https://orcid.org/0000-0002-6715-4827"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Gaudenzio Meneghesso","raw_affiliation_strings":["Department of Information Engineering, University of Padova, Padova, Italy","Department of Information Engineering University of Padova Padova 35121, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Padova, Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Department of Information Engineering University of Padova Padova 35121, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002653396","display_name":"Enrico Zanoni","orcid":"https://orcid.org/0000-0001-7349-9656"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Enrico Zanoni","raw_affiliation_strings":["Department of Information Engineering, University of Padova, Padova, Italy","Department of Information Engineering University of Padova Padova 35121, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Padova, Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Department of Information Engineering University of Padova Padova 35121, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059611177","display_name":"Matteo Meneghini","orcid":"https://orcid.org/0000-0003-2421-505X"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Matteo Meneghini","raw_affiliation_strings":["Department of Information Engineering, University of Padova, Padova, Italy","Department of Information Engineering University of Padova Padova 35121, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, University of Padova, Padova, Italy","institution_ids":["https://openalex.org/I138689650"]},{"raw_affiliation_string":"Department of Information Engineering University of Padova Padova 35121, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091454714","display_name":"Shuzhen You","orcid":"https://orcid.org/0000-0001-5935-3976"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Shuzhen You","raw_affiliation_strings":["Imec, Heverlee, Belgium","Decoutere Imec Heverlee 3001, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec, Heverlee, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Decoutere Imec Heverlee 3001, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019671684","display_name":"Karen Geens","orcid":"https://orcid.org/0000-0003-1815-3972"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Karen Geens","raw_affiliation_strings":["Imec, Heverlee, Belgium","Decoutere Imec Heverlee 3001, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec, Heverlee, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Decoutere Imec Heverlee 3001, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041018780","display_name":"Matteo Borga","orcid":"https://orcid.org/0000-0003-3087-6612"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Matteo Borga","raw_affiliation_strings":["Imec, Heverlee, Belgium","Decoutere Imec Heverlee 3001, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec, Heverlee, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Decoutere Imec Heverlee 3001, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077631766","display_name":"Benoit Bakeroot","orcid":"https://orcid.org/0000-0003-4392-1777"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Benoit Bakeroot","raw_affiliation_strings":["Imec, Heverlee, Belgium","Decoutere Imec Heverlee 3001, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec, Heverlee, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"Decoutere Imec Heverlee 3001, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008126297","display_name":"Stefaan Decoutere","orcid":"https://orcid.org/0000-0001-6632-6239"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Stefaan Decoutere","raw_affiliation_strings":["Imec, Heverlee, Belgium","imec,Heverlee,Belgium,3001"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Imec, Heverlee, Belgium","institution_ids":["https://openalex.org/I4210114974"]},{"raw_affiliation_string":"imec,Heverlee,Belgium,3001","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5018900357"],"corresponding_institution_ids":["https://openalex.org/I138689650"],"apc_list":null,"apc_paid":null,"fwci":0.3055,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.56435104,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10099","display_name":"GaN-based semiconductor devices and materials","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12529","display_name":"Ga2O3 and related materials","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bilayer","display_name":"Bilayer","score":0.5683479309082031},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5328059196472168},{"id":"https://openalex.org/keywords/electroluminescence","display_name":"Electroluminescence","score":0.5206331610679626},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.4698200523853302},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.43924108147621155},{"id":"https://openalex.org/keywords/analytical-chemistry","display_name":"Analytical Chemistry (journal)","score":0.34984004497528076},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.2407200038433075},{"id":"https://openalex.org/keywords/layer","display_name":"Layer (electronics)","score":0.237444669008255},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.2257554829120636},{"id":"https://openalex.org/keywords/organic-chemistry","display_name":"Organic chemistry","score":0.07025817036628723}],"concepts":[{"id":"https://openalex.org/C192157962","wikidata":"https://www.wikidata.org/wiki/Q4087243","display_name":"Bilayer","level":3,"score":0.5683479309082031},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5328059196472168},{"id":"https://openalex.org/C31625292","wikidata":"https://www.wikidata.org/wiki/Q215803","display_name":"Electroluminescence","level":3,"score":0.5206331610679626},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.4698200523853302},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.43924108147621155},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.34984004497528076},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.2407200038433075},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.237444669008255},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.2257554829120636},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.07025817036628723},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C41625074","wikidata":"https://www.wikidata.org/wiki/Q176088","display_name":"Membrane","level":2,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/irps45951.2020.9129098","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9129098","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:archive.ugent.be:8756569","is_oa":false,"landing_page_url":"http://hdl.handle.net/1854/LU-8756569","pdf_url":null,"source":{"id":"https://openalex.org/S4306400478","display_name":"Ghent University Academic Bibliography (Ghent University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I32597200","host_organization_name":"Ghent University","host_organization_lineage":["https://openalex.org/I32597200"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"ISBN: 9781728131993","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:www.research.unipd.it:11577/3344621","is_oa":false,"landing_page_url":"http://hdl.handle.net/11577/3344621","pdf_url":null,"source":{"id":"https://openalex.org/S4377196283","display_name":"Research Padua  Archive (University of Padua)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I138689650","host_organization_name":"University of Padua","host_organization_lineage":["https://openalex.org/I138689650"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G4540246335","display_name":"Research for GaN technologies, devices, packages and applications to address the challenges of the future GaN roadmap","funder_award_id":"826392","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"},{"id":"https://openalex.org/G4701793695","display_name":null,"funder_award_id":"826392","funder_id":"https://openalex.org/F4320327207","funder_display_name":"Electronic Components and Systems for European Leadership"},{"id":"https://openalex.org/G5329322851","display_name":null,"funder_award_id":"232/2016","funder_id":"https://openalex.org/F4320317295","funder_display_name":"Dipartimenti di Eccellenza"},{"id":"https://openalex.org/G5417130124","display_name":null,"funder_award_id":"232/2016","funder_id":"https://openalex.org/F4320321873","funder_display_name":"Ministero dell\u2019Istruzione, dell\u2019Universit\u00e0 e della Ricerca"},{"id":"https://openalex.org/G7842005466","display_name":null,"funder_award_id":"Horizon 2020","funder_id":"https://openalex.org/F4320320300","funder_display_name":"European Commission"}],"funders":[{"id":"https://openalex.org/F4320317295","display_name":"Dipartimenti di Eccellenza","ror":null},{"id":"https://openalex.org/F4320320300","display_name":"European Commission","ror":"https://ror.org/00k4n6c32"},{"id":"https://openalex.org/F4320321873","display_name":"Ministero dell\u2019Istruzione, dell\u2019Universit\u00e0 e della Ricerca","ror":"https://ror.org/0166hxq48"},{"id":"https://openalex.org/F4320321966","display_name":"Universit\u00e0 degli Studi di Padova","ror":"https://ror.org/00240q980"},{"id":"https://openalex.org/F4320327207","display_name":"Electronic Components and Systems for European Leadership","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2025102540","https://openalex.org/W2534102917","https://openalex.org/W2556611407","https://openalex.org/W2726235191","https://openalex.org/W2772177073","https://openalex.org/W2775369742","https://openalex.org/W2783591991","https://openalex.org/W2792946804","https://openalex.org/W2800574161","https://openalex.org/W2802531030","https://openalex.org/W2805359728","https://openalex.org/W2884124301","https://openalex.org/W2913537790"],"related_works":["https://openalex.org/W2150038201","https://openalex.org/W1976110942","https://openalex.org/W940975362","https://openalex.org/W2038762453","https://openalex.org/W2382302308","https://openalex.org/W4248751768","https://openalex.org/W2137930185","https://openalex.org/W2060993002","https://openalex.org/W2049059605","https://openalex.org/W2124537405"],"abstract_inverted_index":{"We":[0],"demonstrate":[1],"that":[2],"the":[3,31,61,112,129,137],"use":[4],"of":[5,33,71],"a":[6,40,84],"bilayer":[7,66,130],"gate":[8,74],"oxide":[9],"(2.5":[10],"nm":[11,22,44],"Al":[12,45],"<inf":[13,17,24,46,50],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[14,18,25,47,51],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</inf>":[15,26,48],"O":[16,49],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">3</inf>":[19,52],"+":[20],"35":[21],"SiO":[23],")":[27,53],"can":[28],"substantially":[29],"improve":[30],"reliability":[32,105],"GaN-on-Si":[34],"vertical":[35],"MOSFETs,":[36],"with":[37,65,101],"respect":[38],"to":[39,60,110,126],"conventional":[41],"uni-layer":[42,62,102],"(35":[43],"insulator.":[54],"Specifically,":[55],"we":[56],"show":[57],"that,":[58],"compared":[59],"insulator,":[63],"devices":[64],"dielectric":[67],"have":[68],"(i)":[69],"two-orders":[70],"magnitude":[72],"lower":[73],"leakage,":[75],"(ii)":[76],"11":[77],"V":[78,93,100],"higher":[79],"average":[80],"breakdown":[81],"voltage,":[82],"(iii)":[83],"steeper":[85],"Weibull":[86],"distribution,":[87],"and":[88],"10-year":[89],"lifetime":[90,95],"at":[91,98],"17.8":[92],"(same":[94],"is":[96,107,119],"obtained":[97,120],"3.4":[99],"insulator).":[103],"Extended":[104],"testing":[106],"carried":[108],"out":[109],"investigate":[111],"degradation":[113],"process;":[114],"evidence":[115],"for":[116,136],"hot-spot":[117],"generation":[118],"by":[121],"electroluminescence":[122],"microscopy.":[123],"With":[124],"regard":[125],"dc":[127],"performance,":[128],"insulator":[131],"ensures":[132],"comparable":[133],"drain":[134],"current":[135],"same":[138],"bias":[139],"point.":[140]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}