{"id":"https://openalex.org/W3039284310","doi":"https://doi.org/10.1109/irps45951.2020.9129068","title":"Advanced methods for CPU product reliability modeling and enhancement","display_name":"Advanced methods for CPU product reliability modeling and enhancement","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3039284310","doi":"https://doi.org/10.1109/irps45951.2020.9129068","mag":"3039284310"},"language":"en","primary_location":{"id":"doi:10.1109/irps45951.2020.9129068","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9129068","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027161079","display_name":"Oren Zonensain","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104622","display_name":"Intel (Israel)","ror":"https://ror.org/027t2s119","country_code":"IL","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210104622"]}],"countries":["IL"],"is_corresponding":true,"raw_author_name":"Oren Zonensain","raw_affiliation_strings":["Intel Israel, Matam Industrial Park, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Intel Israel, Matam Industrial Park, Haifa, Israel","institution_ids":["https://openalex.org/I4210104622"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012314619","display_name":"Roman Rechter","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104622","display_name":"Intel (Israel)","ror":"https://ror.org/027t2s119","country_code":"IL","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210104622"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Roman Rechter","raw_affiliation_strings":["Intel Israel, Matam Industrial Park, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Intel Israel, Matam Industrial Park, Haifa, Israel","institution_ids":["https://openalex.org/I4210104622"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004702308","display_name":"Robert Kwasnick","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104622","display_name":"Intel (Israel)","ror":"https://ror.org/027t2s119","country_code":"IL","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210104622"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Robert Kwasnick","raw_affiliation_strings":["Intel Israel, Matam Industrial Park, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Intel Israel, Matam Industrial Park, Haifa, Israel","institution_ids":["https://openalex.org/I4210104622"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045024481","display_name":"Keun Woo Park","orcid":"https://orcid.org/0000-0001-9658-8440"},"institutions":[{"id":"https://openalex.org/I4210104622","display_name":"Intel (Israel)","ror":"https://ror.org/027t2s119","country_code":"IL","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210104622"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Keun Woo Park","raw_affiliation_strings":["Intel Israel, Matam Industrial Park, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Intel Israel, Matam Industrial Park, Haifa, Israel","institution_ids":["https://openalex.org/I4210104622"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081436241","display_name":"Anisur Rahman","orcid":"https://orcid.org/0000-0002-8444-7648"},"institutions":[{"id":"https://openalex.org/I4210104622","display_name":"Intel (Israel)","ror":"https://ror.org/027t2s119","country_code":"IL","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210104622"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Anisur Rahman","raw_affiliation_strings":["Intel Israel, Matam Industrial Park, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Intel Israel, Matam Industrial Park, Haifa, Israel","institution_ids":["https://openalex.org/I4210104622"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052227301","display_name":"Almog Reshef","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104622","display_name":"Intel (Israel)","ror":"https://ror.org/027t2s119","country_code":"IL","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210104622"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Almog Reshef","raw_affiliation_strings":["Intel Israel, Matam Industrial Park, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Intel Israel, Matam Industrial Park, Haifa, Israel","institution_ids":["https://openalex.org/I4210104622"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028631133","display_name":"Tal Raz","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104622","display_name":"Intel (Israel)","ror":"https://ror.org/027t2s119","country_code":"IL","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210104622"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Tal Raz","raw_affiliation_strings":["Intel Israel, Matam Industrial Park, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Intel Israel, Matam Industrial Park, Haifa, Israel","institution_ids":["https://openalex.org/I4210104622"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5040097458","display_name":"Maxim Levit","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104622","display_name":"Intel (Israel)","ror":"https://ror.org/027t2s119","country_code":"IL","type":"company","lineage":["https://openalex.org/I1343180700","https://openalex.org/I4210104622"]}],"countries":["IL"],"is_corresponding":false,"raw_author_name":"Maxim Levit","raw_affiliation_strings":["Intel Israel, Matam Industrial Park, Haifa, Israel"],"affiliations":[{"raw_affiliation_string":"Intel Israel, Matam Industrial Park, Haifa, Israel","institution_ids":["https://openalex.org/I4210104622"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5027161079"],"corresponding_institution_ids":["https://openalex.org/I4210104622"],"apc_list":null,"apc_paid":null,"fwci":0.1027,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.41422826,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"2016 september","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9925000071525574,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8070077300071716},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6687843799591064},{"id":"https://openalex.org/keywords/product","display_name":"Product (mathematics)","score":0.6669623255729675},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5831572413444519},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.4865104556083679},{"id":"https://openalex.org/keywords/central-processing-unit","display_name":"Central processing unit","score":0.45788872241973877},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4363248348236084},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2012368142604828},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16796502470970154},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08597251772880554}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8070077300071716},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6687843799591064},{"id":"https://openalex.org/C90673727","wikidata":"https://www.wikidata.org/wiki/Q901718","display_name":"Product (mathematics)","level":2,"score":0.6669623255729675},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5831572413444519},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.4865104556083679},{"id":"https://openalex.org/C49154492","wikidata":"https://www.wikidata.org/wiki/Q5300","display_name":"Central processing unit","level":2,"score":0.45788872241973877},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4363248348236084},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2012368142604828},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16796502470970154},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08597251772880554},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps45951.2020.9129068","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9129068","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5,"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1643721902","https://openalex.org/W1876302252","https://openalex.org/W1991300093","https://openalex.org/W1994163260","https://openalex.org/W2066647049","https://openalex.org/W2109687709","https://openalex.org/W2296560911","https://openalex.org/W2525141714","https://openalex.org/W2539625543","https://openalex.org/W2620582681","https://openalex.org/W2946080729","https://openalex.org/W3005661655","https://openalex.org/W6729034271"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"Enabling":[0],"CPU":[1,40],"with":[2,42],"the":[3,31],"highest":[4],"possible":[5],"frequency":[6],"requires":[7],"substantial":[8],"study":[9],"and":[10],"optimizations":[11],"beyond":[12],"traditional":[13],"product":[14,32],"reliability":[15],"methods.":[16],"Extending":[17],"on":[18],"our":[19],"IRPS":[20],"2019":[21],"report":[22],"[1],":[23],"we":[24],"describe":[25],"five":[26],"additional":[27],"enhancements":[28],"from":[29],"throughout":[30],"life":[33],"cycle.":[34],"This":[35],"contributed":[36],"to":[37],"increasing":[38],"client":[39],"performance":[41],"undiminished":[43],"reliability.":[44]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}