{"id":"https://openalex.org/W3038228071","doi":"https://doi.org/10.1109/irps45951.2020.9128967","title":"ON-state retention of Atom Switch eNVM for IoT/AI Inference Solution","display_name":"ON-state retention of Atom Switch eNVM for IoT/AI Inference Solution","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3038228071","doi":"https://doi.org/10.1109/irps45951.2020.9128967","mag":"3038228071"},"language":"en","primary_location":{"id":"doi:10.1109/irps45951.2020.9128967","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9128967","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100846459","display_name":"Koichiro Okamoto","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Koichiro Okamoto","raw_affiliation_strings":["System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075000622","display_name":"Ryusuke Nebashi","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryusuke Nebashi","raw_affiliation_strings":["System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061572817","display_name":"Naoki Banno","orcid":"https://orcid.org/0000-0003-0052-2434"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Naoki Banno","raw_affiliation_strings":["System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005131373","display_name":"Xu Bai","orcid":"https://orcid.org/0000-0002-7478-8705"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Xu Bai","raw_affiliation_strings":["System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5049101351","display_name":"Hideaki Numata","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hideaki Numata","raw_affiliation_strings":["System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112420175","display_name":"Noriyuki Iguchi","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Noriyuki Iguchi","raw_affiliation_strings":["System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112239308","display_name":"Makoto Miyamura","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Makoto Miyamura","raw_affiliation_strings":["System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045709379","display_name":"H. Hada","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiromitsu Hada","raw_affiliation_strings":["System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014006600","display_name":"Kazunori Funahashi","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazunori Funahashi","raw_affiliation_strings":["System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111921651","display_name":"Tadahiko Sugibayashi","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tadahiko Sugibayashi","raw_affiliation_strings":["System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109333465","display_name":"Toshitsugu Sakamoto","orcid":null},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toshitsugu Sakamoto","raw_affiliation_strings":["System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066870244","display_name":"Munehiro Tada","orcid":"https://orcid.org/0000-0002-1015-2222"},"institutions":[{"id":"https://openalex.org/I118347220","display_name":"NEC (Japan)","ror":"https://ror.org/04jndar25","country_code":"JP","type":"company","lineage":["https://openalex.org/I118347220"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Munehiro Tada","raw_affiliation_strings":["System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan"],"affiliations":[{"raw_affiliation_string":"System Platform Research Laboratories, NEC Corporation, Tsukuba, Japan","institution_ids":["https://openalex.org/I118347220"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":12,"corresponding_author_ids":["https://openalex.org/A5100846459"],"corresponding_institution_ids":["https://openalex.org/I118347220"],"apc_list":null,"apc_paid":null,"fwci":0.411,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.60697098,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11601","display_name":"Neuroscience and Neural Engineering","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2804","display_name":"Cellular and Molecular Neuroscience"},"field":{"id":"https://openalex.org/fields/28","display_name":"Neuroscience"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inference","display_name":"Inference","score":0.5504947900772095},{"id":"https://openalex.org/keywords/state","display_name":"State (computer science)","score":0.5181087851524353},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.46642571687698364},{"id":"https://openalex.org/keywords/atom","display_name":"Atom (system on chip)","score":0.41252878308296204},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3700026273727417},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.35570913553237915},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.14587441086769104}],"concepts":[{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.5504947900772095},{"id":"https://openalex.org/C48103436","wikidata":"https://www.wikidata.org/wiki/Q599031","display_name":"State (computer science)","level":2,"score":0.5181087851524353},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46642571687698364},{"id":"https://openalex.org/C58312451","wikidata":"https://www.wikidata.org/wiki/Q4817200","display_name":"Atom (system on chip)","level":2,"score":0.41252878308296204},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3700026273727417},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.35570913553237915},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.14587441086769104}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps45951.2020.9128967","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9128967","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1520438902","https://openalex.org/W1946849860","https://openalex.org/W1978206624","https://openalex.org/W1995755094","https://openalex.org/W2000335122","https://openalex.org/W2020182369","https://openalex.org/W2114351634","https://openalex.org/W2116396692","https://openalex.org/W2118430498","https://openalex.org/W2119002084","https://openalex.org/W2525696925","https://openalex.org/W2573175764","https://openalex.org/W2591612863","https://openalex.org/W2744530947","https://openalex.org/W2808866625","https://openalex.org/W2896228457","https://openalex.org/W2915431062","https://openalex.org/W2932674265"],"related_works":["https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2053286651","https://openalex.org/W2055243143","https://openalex.org/W2181743346","https://openalex.org/W2187401768","https://openalex.org/W2181413294","https://openalex.org/W2989452537","https://openalex.org/W2052122378","https://openalex.org/W2544423928"],"abstract_inverted_index":{"An":[0],"ON-state":[1,52],"retention":[2,53],"of":[3,30,35,88],"a":[4],"40nm-node":[5],"atom":[6,31],"switch":[7],"embedded":[8],"nonvolatile":[9],"memory":[10],"(eNVM)":[11],"has":[12],"been":[13],"carefully":[14],"investigated":[15],"for":[16],"IoT/AI":[17],"inference":[18],"solution.":[19],"Based":[20],"on":[21,55],"ON-conductance":[22],"(G":[23],"<sub":[24,47,58,90],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[25,48,59,91],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">on</sub>":[26,49,92],")":[27],"tuning":[28],"model":[29],"switch,":[32],"one":[33],"order":[34],"magnitude":[36],"lower":[37],"programming":[38],"power":[39],"is":[40,74],"achieved":[41],"while":[42],"keeping":[43],"the":[44,72],"same":[45],"G":[46,89],".":[50,93],"Smaller":[51],"dependences":[54],"temperature":[56],"(E":[57],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">a</sub>":[60],"=":[61,66],"0.2eV)":[62],"and":[63,71],"time":[64],"(n":[65],"0.11)":[67],"are":[68],"experimentally":[69],"clarified":[70],"lifetime":[73],"predicted":[75],"to":[76],"be":[77],"more":[78],"than":[79],"10":[80],"years":[81],"at":[82],"150\u00b0C":[83],"under":[84],"+20%":[85],"shift":[86],"criteria":[87]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}