{"id":"https://openalex.org/W3040589481","doi":"https://doi.org/10.1109/irps45951.2020.9128961","title":"Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO<sub>2</sub> Memristors","display_name":"Impact of Intrinsic Series Resistance on the Reversible Dielectric Breakdown Kinetics in HfO<sub>2</sub> Memristors","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3040589481","doi":"https://doi.org/10.1109/irps45951.2020.9128961","mag":"3040589481"},"language":"en","primary_location":{"id":"doi:10.1109/irps45951.2020.9128961","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9128961","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049881097","display_name":"Mireia Bargall\u00f3 Gonz\u00e1lez","orcid":"https://orcid.org/0000-0001-6792-4556"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"M. B. Gonzalez","raw_affiliation_strings":["Institut de Microelectr\u00f2nica de Barcelona IMB-CNM (CSIC), Bellaterra, Spain"],"affiliations":[{"raw_affiliation_string":"Institut de Microelectr\u00f2nica de Barcelona IMB-CNM (CSIC), Bellaterra, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5051843409","display_name":"Marcos Maestro-Izquierdo","orcid":"https://orcid.org/0000-0002-8940-9050"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"M. Maestro-Izquierdo","raw_affiliation_strings":["Institut de Microelectr\u00f2nica de Barcelona IMB-CNM (CSIC), Bellaterra, Spain"],"affiliations":[{"raw_affiliation_string":"Institut de Microelectr\u00f2nica de Barcelona IMB-CNM (CSIC), Bellaterra, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089712120","display_name":"F. Campabadal","orcid":"https://orcid.org/0000-0001-7758-4567"},"institutions":[{"id":"https://openalex.org/I4210160312","display_name":"Institut de Microelectr\u00f2nica de Barcelona","ror":"https://ror.org/04pnym676","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210147934","https://openalex.org/I4210160312"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"F. Campabadal","raw_affiliation_strings":["Institut de Microelectr\u00f2nica de Barcelona IMB-CNM (CSIC), Bellaterra, Spain"],"affiliations":[{"raw_affiliation_string":"Institut de Microelectr\u00f2nica de Barcelona IMB-CNM (CSIC), Bellaterra, Spain","institution_ids":["https://openalex.org/I4210160312"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059210826","display_name":"Samuel Aldana","orcid":"https://orcid.org/0000-0002-1719-605X"},"institutions":[{"id":"https://openalex.org/I173304897","display_name":"Universidad de Granada","ror":"https://ror.org/04njjy449","country_code":"ES","type":"education","lineage":["https://openalex.org/I173304897"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"S. Aldana","raw_affiliation_strings":["Departamento de Electr\u00f3nica y Tecnolog\u00eda de Computadores, Universidad de Granada (UGR), Granada, Spain"],"affiliations":[{"raw_affiliation_string":"Departamento de Electr\u00f3nica y Tecnolog\u00eda de Computadores, Universidad de Granada (UGR), Granada, Spain","institution_ids":["https://openalex.org/I173304897"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032801293","display_name":"F. Jim\u00e9nez-Molinos","orcid":"https://orcid.org/0000-0002-8866-7568"},"institutions":[{"id":"https://openalex.org/I173304897","display_name":"Universidad de Granada","ror":"https://ror.org/04njjy449","country_code":"ES","type":"education","lineage":["https://openalex.org/I173304897"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"F. Jimenez-Molinos","raw_affiliation_strings":["Departamento de Electr\u00f3nica y Tecnolog\u00eda de Computadores, Universidad de Granada (UGR), Granada, Spain"],"affiliations":[{"raw_affiliation_string":"Departamento de Electr\u00f3nica y Tecnolog\u00eda de Computadores, Universidad de Granada (UGR), Granada, Spain","institution_ids":["https://openalex.org/I173304897"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009851819","display_name":"J.B. Rold\u00e1n","orcid":"https://orcid.org/0000-0003-1662-6457"},"institutions":[{"id":"https://openalex.org/I173304897","display_name":"Universidad de Granada","ror":"https://ror.org/04njjy449","country_code":"ES","type":"education","lineage":["https://openalex.org/I173304897"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. B. Roldan","raw_affiliation_strings":["Departamento de Electr\u00f3nica y Tecnolog\u00eda de Computadores, Universidad de Granada (UGR), Granada, Spain"],"affiliations":[{"raw_affiliation_string":"Departamento de Electr\u00f3nica y Tecnolog\u00eda de Computadores, Universidad de Granada (UGR), Granada, Spain","institution_ids":["https://openalex.org/I173304897"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5049881097"],"corresponding_institution_ids":["https://openalex.org/I4210160312"],"apc_list":null,"apc_paid":null,"fwci":0.5137,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.64392538,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.6904565691947937},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6386728286743164},{"id":"https://openalex.org/keywords/ultrashort-pulse","display_name":"Ultrashort pulse","score":0.5737497806549072},{"id":"https://openalex.org/keywords/kinetics","display_name":"Kinetics","score":0.5535986423492432},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.5176363587379456},{"id":"https://openalex.org/keywords/dielectric-strength","display_name":"Dielectric strength","score":0.5118531584739685},{"id":"https://openalex.org/keywords/conductance","display_name":"Conductance","score":0.5020842552185059},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.4843381643295288},{"id":"https://openalex.org/keywords/kinetic-monte-carlo","display_name":"Kinetic Monte Carlo","score":0.463156133890152},{"id":"https://openalex.org/keywords/modulation","display_name":"Modulation (music)","score":0.4575890302658081},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.44121330976486206},{"id":"https://openalex.org/keywords/equivalent-series-resistance","display_name":"Equivalent series resistance","score":0.4406246244907379},{"id":"https://openalex.org/keywords/electric-field","display_name":"Electric field","score":0.41706907749176025},{"id":"https://openalex.org/keywords/chemical-physics","display_name":"Chemical physics","score":0.35092389583587646},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.34933850169181824},{"id":"https://openalex.org/keywords/condensed-matter-physics","display_name":"Condensed matter physics","score":0.31967368721961975},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23792904615402222},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23178094625473022},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.09623008966445923},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0830407440662384},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.08018237352371216},{"id":"https://openalex.org/keywords/quantum-mechanics","display_name":"Quantum mechanics","score":0.07741653919219971},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07537615299224854}],"concepts":[{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.6904565691947937},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6386728286743164},{"id":"https://openalex.org/C178596936","wikidata":"https://www.wikidata.org/wiki/Q844471","display_name":"Ultrashort pulse","level":3,"score":0.5737497806549072},{"id":"https://openalex.org/C148898269","wikidata":"https://www.wikidata.org/wiki/Q1108792","display_name":"Kinetics","level":2,"score":0.5535986423492432},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.5176363587379456},{"id":"https://openalex.org/C70401718","wikidata":"https://www.wikidata.org/wiki/Q343241","display_name":"Dielectric strength","level":3,"score":0.5118531584739685},{"id":"https://openalex.org/C121932024","wikidata":"https://www.wikidata.org/wiki/Q5159376","display_name":"Conductance","level":2,"score":0.5020842552185059},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.4843381643295288},{"id":"https://openalex.org/C45786274","wikidata":"https://www.wikidata.org/wiki/Q3333611","display_name":"Kinetic Monte Carlo","level":3,"score":0.463156133890152},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.4575890302658081},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.44121330976486206},{"id":"https://openalex.org/C14485415","wikidata":"https://www.wikidata.org/wiki/Q5384730","display_name":"Equivalent series resistance","level":3,"score":0.4406246244907379},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.41706907749176025},{"id":"https://openalex.org/C159467904","wikidata":"https://www.wikidata.org/wiki/Q2001702","display_name":"Chemical physics","level":1,"score":0.35092389583587646},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34933850169181824},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.31967368721961975},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23792904615402222},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23178094625473022},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.09623008966445923},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0830407440662384},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.08018237352371216},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.07741653919219971},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07537615299224854},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps45951.2020.9128961","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9128961","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W311943763","https://openalex.org/W1885938109","https://openalex.org/W1976838737","https://openalex.org/W1983705067","https://openalex.org/W1996443105","https://openalex.org/W2025535306","https://openalex.org/W2035054741","https://openalex.org/W2035358534","https://openalex.org/W2051209243","https://openalex.org/W2069107104","https://openalex.org/W2100946869","https://openalex.org/W2624898001","https://openalex.org/W2767615815","https://openalex.org/W2783053830","https://openalex.org/W2794684839","https://openalex.org/W2795837079","https://openalex.org/W2802722247","https://openalex.org/W2809150664","https://openalex.org/W2818007000","https://openalex.org/W2905240398","https://openalex.org/W2945899269","https://openalex.org/W2946196850","https://openalex.org/W2947639688"],"related_works":["https://openalex.org/W4312903331","https://openalex.org/W2106296380","https://openalex.org/W2035271760","https://openalex.org/W2144661048","https://openalex.org/W166353894","https://openalex.org/W2030970284","https://openalex.org/W2518138805","https://openalex.org/W2055385333","https://openalex.org/W2061523378","https://openalex.org/W2124181728"],"abstract_inverted_index":{"In":[0],"this":[1,29],"work,":[2],"the":[3,6,11,58],"impact":[4],"of":[5,19,62],"intrinsic":[7],"series":[8],"resistance":[9],"on":[10],"reversible":[12],"dielectric":[13],"breakdown":[14],"dynamics":[15],"and":[16,72,79],"current":[17],"tunability":[18],"HfO":[20],"<sub":[21],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[22],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sub>":[23],"-based":[24],"memristors":[25],"is":[26,40,66],"investigated.":[27],"For":[28],"purpose,":[30],"a":[31,54],"dedicated":[32],"ultrafast":[33],"characterization":[34],"methodology":[35],"through":[36],"sequential":[37],"pulse":[38],"schemes":[39],"presented.":[41],"Furthermore,":[42],"physical":[43],"3D":[44],"kinetic":[45],"Monte":[46],"Carlo":[47],"(kMC)":[48],"simulations":[49],"are":[50],"performed":[51],"to":[52,69],"obtain":[53],"deeper":[55],"insight":[56],"into":[57],"conductance":[59],"modulation":[60],"capability":[61],"these":[63],"devices,":[64],"which":[65],"strongly":[67],"connected":[68],"electric":[70],"field":[71],"temperature":[73],"assisted":[74],"oxygen":[75],"vacancy/ion":[76],"generation,":[77],"migration":[78],"recombination":[80],"processes.":[81]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}