{"id":"https://openalex.org/W3040674199","doi":"https://doi.org/10.1109/irps45951.2020.9128910","title":"Comparing Variation-tolerance and SEU/TID-Resilience of Three SRAM Cells in 28nm FD-SOI Technology: 6T, Quatro, and we-Quatro","display_name":"Comparing Variation-tolerance and SEU/TID-Resilience of Three SRAM Cells in 28nm FD-SOI Technology: 6T, Quatro, and we-Quatro","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3040674199","doi":"https://doi.org/10.1109/irps45951.2020.9128910","mag":"3040674199"},"language":"en","primary_location":{"id":"doi:10.1109/irps45951.2020.9128910","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9128910","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086589662","display_name":"T. Dang","orcid":"https://orcid.org/0000-0002-2559-7566"},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Le Dinh Trang Dang","raw_affiliation_strings":["Kyunghee Univeristy,Electronics,Yongin,Korea","Electronics, Kyunghee Univeristy, Yongin, Korea"],"affiliations":[{"raw_affiliation_string":"Kyunghee Univeristy,Electronics,Yongin,Korea","institution_ids":["https://openalex.org/I35928602"]},{"raw_affiliation_string":"Electronics, Kyunghee Univeristy, Yongin, Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079770113","display_name":"Trinh Dinh Linh","orcid":null},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Trinh Dinh Linh","raw_affiliation_strings":["Kyunghee Univeristy,Electronics,Yongin,Korea","Electronics, Kyunghee Univeristy, Yongin, Korea"],"affiliations":[{"raw_affiliation_string":"Kyunghee Univeristy,Electronics,Yongin,Korea","institution_ids":["https://openalex.org/I35928602"]},{"raw_affiliation_string":"Electronics, Kyunghee Univeristy, Yongin, Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031048089","display_name":"Ngyuen Thanh Dat","orcid":null},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ngyuen Thanh Dat","raw_affiliation_strings":["Kyunghee Univeristy,Electronics,Yongin,Korea","Electronics, Kyunghee Univeristy, Yongin, Korea"],"affiliations":[{"raw_affiliation_string":"Kyunghee Univeristy,Electronics,Yongin,Korea","institution_ids":["https://openalex.org/I35928602"]},{"raw_affiliation_string":"Electronics, Kyunghee Univeristy, Yongin, Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068462353","display_name":"Changhong Min","orcid":null},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Changhong Min","raw_affiliation_strings":["Kyunghee Univeristy,Electronics,Yongin,Korea","Electronics, Kyunghee Univeristy, Yongin, Korea"],"affiliations":[{"raw_affiliation_string":"Kyunghee Univeristy,Electronics,Yongin,Korea","institution_ids":["https://openalex.org/I35928602"]},{"raw_affiliation_string":"Electronics, Kyunghee Univeristy, Yongin, Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065276262","display_name":"Jinsang Kim","orcid":"https://orcid.org/0000-0002-1235-3327"},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jinsang Kim","raw_affiliation_strings":["Kyunghee Univeristy,Electronics,Yongin,Korea","Electronics, Kyunghee Univeristy, Yongin, Korea"],"affiliations":[{"raw_affiliation_string":"Kyunghee Univeristy,Electronics,Yongin,Korea","institution_ids":["https://openalex.org/I35928602"]},{"raw_affiliation_string":"Electronics, Kyunghee Univeristy, Yongin, Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045028723","display_name":"Ik\u2010Joon Chang","orcid":"https://orcid.org/0000-0002-8871-8695"},"institutions":[{"id":"https://openalex.org/I35928602","display_name":"Kyung Hee University","ror":"https://ror.org/01zqcg218","country_code":"KR","type":"education","lineage":["https://openalex.org/I35928602"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ik-Joon Chang","raw_affiliation_strings":["Kyunghee Univeristy,Electronics,Yongin,Korea","Electronics, Kyunghee Univeristy, Yongin, Korea"],"affiliations":[{"raw_affiliation_string":"Kyunghee Univeristy,Electronics,Yongin,Korea","institution_ids":["https://openalex.org/I35928602"]},{"raw_affiliation_string":"Electronics, Kyunghee Univeristy, Yongin, Korea","institution_ids":["https://openalex.org/I35928602"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5030049476","display_name":"Jin\u2010Woo Han","orcid":"https://orcid.org/0000-0002-5118-1310"},"institutions":[{"id":"https://openalex.org/I1280536761","display_name":"Ames Research Center","ror":"https://ror.org/02acart68","country_code":"US","type":"facility","lineage":["https://openalex.org/I1280536761","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jin-woo Han","raw_affiliation_strings":["NASA,Ames Research Center,CA,USA","Ames Research Center, NASA, CA, USA"],"affiliations":[{"raw_affiliation_string":"NASA,Ames Research Center,CA,USA","institution_ids":["https://openalex.org/I1280536761"]},{"raw_affiliation_string":"Ames Research Center, NASA, CA, USA","institution_ids":["https://openalex.org/I1280536761"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5086589662"],"corresponding_institution_ids":["https://openalex.org/I35928602"],"apc_list":null,"apc_paid":null,"fwci":0.1027,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.41505987,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/silicon-on-insulator","display_name":"Silicon on insulator","score":0.8834010362625122},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8575925827026367},{"id":"https://openalex.org/keywords/resilience","display_name":"Resilience (materials science)","score":0.7090805172920227},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.5228196382522583},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4932655692100525},{"id":"https://openalex.org/keywords/macro","display_name":"Macro","score":0.4853045344352722},{"id":"https://openalex.org/keywords/energy","display_name":"Energy (signal processing)","score":0.4585859477519989},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45490819215774536},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.3796083331108093},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.36632806062698364},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2796742022037506},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22711777687072754},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.1396676003932953}],"concepts":[{"id":"https://openalex.org/C53143962","wikidata":"https://www.wikidata.org/wiki/Q1478788","display_name":"Silicon on insulator","level":3,"score":0.8834010362625122},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8575925827026367},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.7090805172920227},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.5228196382522583},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4932655692100525},{"id":"https://openalex.org/C166955791","wikidata":"https://www.wikidata.org/wiki/Q629579","display_name":"Macro","level":2,"score":0.4853045344352722},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.4585859477519989},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45490819215774536},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3796083331108093},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.36632806062698364},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2796742022037506},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22711777687072754},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.1396676003932953},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C44870925","wikidata":"https://www.wikidata.org/wiki/Q37547","display_name":"Astrophysics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps45951.2020.9128910","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9128910","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.6499999761581421}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2119289747","https://openalex.org/W2153751624","https://openalex.org/W2169622577","https://openalex.org/W2323678150","https://openalex.org/W2481976636","https://openalex.org/W2737640031","https://openalex.org/W2893887613","https://openalex.org/W2907583718","https://openalex.org/W2947743212"],"related_works":["https://openalex.org/W2386430105","https://openalex.org/W2104300577","https://openalex.org/W2030816003","https://openalex.org/W4206445530","https://openalex.org/W2356521405","https://openalex.org/W4392590355","https://openalex.org/W2771786520","https://openalex.org/W4239992647","https://openalex.org/W2150013480","https://openalex.org/W2042526628"],"abstract_inverted_index":{"In":[0,14,42],"our":[1,67],"earlier":[2],"study,":[3],"we":[4,17,44],"presented":[5],"a":[6,28],"variation-tolerant":[7],"and":[8,25,33,51,59],"radiation-resilient":[9],"SRAM":[10],"cell,":[11],"namely":[12],"we-Quatro.":[13,68],"this":[15],"work,":[16],"fabricate":[18],"4KB":[19],"macros":[20],"of":[21,66],"6T":[22],"SRAM,":[23],"Quatro,":[24],"we-Quatro":[26],"in":[27],"28nm":[29],"FD-SOI.":[30],"Their":[31],"read":[32],"write":[34],"stabilities":[35],"are":[36],"compared":[37],"through":[38],"actual":[39],"silicon":[40],"measurements.":[41],"addition,":[43],"perform":[45],"low":[46],"energy":[47],"neutron,":[48],"mostly":[49],"thermal,":[50],"gamma":[52],"irradiation":[53],"tests":[54],"to":[55],"evaluate":[56],"their":[57],"SEU":[58],"TID-resilience.":[60],"The":[61],"results":[62],"validate":[63],"the":[64],"efficacy":[65]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}