{"id":"https://openalex.org/W3039883810","doi":"https://doi.org/10.1109/irps45951.2020.9128357","title":"Large-tilt Heavy Ions Induced SEU in Multiple Radiation Hardened 22 nm FDSOI SRAMs","display_name":"Large-tilt Heavy Ions Induced SEU in Multiple Radiation Hardened 22 nm FDSOI SRAMs","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3039883810","doi":"https://doi.org/10.1109/irps45951.2020.9128357","mag":"3039883810"},"language":"en","primary_location":{"id":"doi:10.1109/irps45951.2020.9128357","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9128357","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004629662","display_name":"Chang Cai","orcid":"https://orcid.org/0000-0001-6624-8998"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210131271","display_name":"Institute of Modern Physics","ror":"https://ror.org/03x8rhq63","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210131271"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chang Cai","raw_affiliation_strings":["Institute of Modern Physics Chinese Academy of Sciences, Lanzhou, China","School of Nuclear Science and Technology University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Modern Physics Chinese Academy of Sciences, Lanzhou, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210131271"]},{"raw_affiliation_string":"School of Nuclear Science and Technology University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100618137","display_name":"Tianqi Liu","orcid":"https://orcid.org/0000-0002-1428-8610"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210131271","display_name":"Institute of Modern Physics","ror":"https://ror.org/03x8rhq63","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210131271"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianqi Liu","raw_affiliation_strings":["Institute of Modern Physics Chinese Academy of Sciences, Lanzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Modern Physics Chinese Academy of Sciences, Lanzhou, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210131271"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100324365","display_name":"Jie Liu","orcid":"https://orcid.org/0000-0002-3644-1540"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210131271","display_name":"Institute of Modern Physics","ror":"https://ror.org/03x8rhq63","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210131271"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jie Liu","raw_affiliation_strings":["Institute of Modern Physics Chinese Academy of Sciences, Lanzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Modern Physics Chinese Academy of Sciences, Lanzhou, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210131271"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006212733","display_name":"Gengsheng Chen","orcid":"https://orcid.org/0000-0003-1879-9415"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Gengsheng Chen","raw_affiliation_strings":["State Key Laboratory of ASIC and System Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037772140","display_name":"Luchang Ding","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Luchang Ding","raw_affiliation_strings":["State Key Laboratory of ASIC and System Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100643410","display_name":"Kai Zhao","orcid":"https://orcid.org/0000-0001-5328-3962"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kai Zhao","raw_affiliation_strings":["State Key Laboratory of ASIC and System Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082650947","display_name":"Bingxu Ning","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bingxu Ning","raw_affiliation_strings":["State Key Laboratory of ASIC and System Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Mingjie Shen","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingjie Shen","raw_affiliation_strings":["State Key Laboratory of ASIC and System Fudan University, Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of ASIC and System Fudan University, Shanghai, China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5004629662","display_name":"Chang Cai","orcid":"https://orcid.org/0000-0001-6624-8998"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210131271","display_name":"Institute of Modern Physics","ror":"https://ror.org/03x8rhq63","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210131271"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chang Cai","raw_affiliation_strings":["Institute of Modern Physics Chinese Academy of Sciences, Lanzhou, China","School of Nuclear Science and Technology University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Modern Physics Chinese Academy of Sciences, Lanzhou, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210131271"]},{"raw_affiliation_string":"School of Nuclear Science and Technology University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7749934196472168},{"id":"https://openalex.org/keywords/dice","display_name":"Dice","score":0.6869829297065735},{"id":"https://openalex.org/keywords/irradiation","display_name":"Irradiation","score":0.6454778909683228},{"id":"https://openalex.org/keywords/ion","display_name":"Ion","score":0.6237088441848755},{"id":"https://openalex.org/keywords/tilt","display_name":"Tilt (camera)","score":0.6138007640838623},{"id":"https://openalex.org/keywords/heavy-ion","display_name":"Heavy ion","score":0.5958113670349121},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.5897786617279053},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.48641252517700195},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.46709033846855164},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.43717387318611145},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4130690097808838},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3513447642326355},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24424239993095398},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.2341921031475067},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.23222631216049194},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.08194851875305176}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7749934196472168},{"id":"https://openalex.org/C22029948","wikidata":"https://www.wikidata.org/wiki/Q45089","display_name":"Dice","level":2,"score":0.6869829297065735},{"id":"https://openalex.org/C111337013","wikidata":"https://www.wikidata.org/wiki/Q2737837","display_name":"Irradiation","level":2,"score":0.6454778909683228},{"id":"https://openalex.org/C145148216","wikidata":"https://www.wikidata.org/wiki/Q36496","display_name":"Ion","level":2,"score":0.6237088441848755},{"id":"https://openalex.org/C2779844322","wikidata":"https://www.wikidata.org/wiki/Q2919140","display_name":"Tilt (camera)","level":2,"score":0.6138007640838623},{"id":"https://openalex.org/C2988362075","wikidata":"https://www.wikidata.org/wiki/Q12416032","display_name":"Heavy ion","level":3,"score":0.5958113670349121},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.5897786617279053},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.48641252517700195},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.46709033846855164},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.43717387318611145},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4130690097808838},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3513447642326355},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24424239993095398},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2341921031475067},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.23222631216049194},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.08194851875305176},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps45951.2020.9128357","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9128357","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:ir.lzu.edu.cn/:262010/441931","is_oa":false,"landing_page_url":"http://ir.lzu.edu.cn/handle/262010/441931","pdf_url":null,"source":{"id":"https://openalex.org/S4406923049","display_name":"Lanzhou University Institutional Repository","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"\u4f1a\u8bae\u8bba\u6587"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8799999952316284}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1999021083","https://openalex.org/W2018408080","https://openalex.org/W2018918975","https://openalex.org/W2103902557","https://openalex.org/W2108194946","https://openalex.org/W2122954231","https://openalex.org/W2129040085","https://openalex.org/W2185214480","https://openalex.org/W2553657511","https://openalex.org/W2553836930","https://openalex.org/W2587340685","https://openalex.org/W2613938152","https://openalex.org/W2617585808","https://openalex.org/W2888696243","https://openalex.org/W2895583453"],"related_works":["https://openalex.org/W2467125137","https://openalex.org/W3208260600","https://openalex.org/W2065552285","https://openalex.org/W3003557214","https://openalex.org/W1493283943","https://openalex.org/W4381549462","https://openalex.org/W3156329500","https://openalex.org/W2387824216","https://openalex.org/W19802766","https://openalex.org/W3024449993"],"abstract_inverted_index":{"Four":[0],"kinds":[1],"of":[2,94],"radiation":[3],"hardened":[4,62],"SRAM":[5],"were":[6,35,68],"fabricated":[7],"based":[8],"on":[9],"a":[10],"22":[11],"nm":[12],"UTBB":[13,80],"FDSOI":[14,81],"process":[15,82],"and":[16,26,55,60],"irradiated":[17],"by":[18],"high-energy":[19],"heavy":[20,97],"ions.":[21],"The":[22,79],"high":[23,87,113],"SEU":[24,28,48,88],"tolerance":[25],"even":[27],"immunity":[29],"for":[30,51,111],"the":[31,42,47,52,56,74,92,101,112],"three":[32],"DICE":[33],"SRAMs":[34,63],"investigated":[36],"in":[37,58,64,99,107],"vertical":[38],"heavy-ion":[39],"irradiation.":[40],"However,":[41],"large-tilt-incidence":[43],"(75\u00b0-85\u00b0)":[44],"significantly":[45],"increased":[46],"cross":[49],"sections":[50],"8-T":[53],"SRAMs,":[54],"errors":[57],"M-DICE":[59],"C-DICE":[61],"large":[65],"tilt":[66],"incidence":[67],"observed":[69],"as":[70],"well,":[71],"indicating":[72],"that":[73],"layout":[75],"placement":[76],"is":[77,104],"essential.":[78],"contributes":[83],"substantially":[84],"to":[85],"realize":[86],"tolerance.":[89],"While":[90],"considering":[91],"existence":[93],"4\u03c0-distributed":[95],"relativistic":[96],"ions":[98],"space,":[100],"large-tilt":[102],"irradiation":[103],"also":[105],"indispensable":[106],"ground":[108],"evaluation":[109],"especially":[110],"reliable":[114],"systems.":[115]},"counts_by_year":[{"year":2023,"cited_by_count":5},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}