{"id":"https://openalex.org/W3040424541","doi":"https://doi.org/10.1109/irps45951.2020.9128347","title":"Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits","display_name":"Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3040424541","doi":"https://doi.org/10.1109/irps45951.2020.9128347","mag":"3040424541"},"language":"en","primary_location":{"id":"doi:10.1109/irps45951.2020.9128347","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9128347","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083178950","display_name":"Ketul B. Sutaria","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Ketul B. Sutaria","raw_affiliation_strings":["Logic Technology Development Quality and Reliability, Hillsboro, Oregon"],"affiliations":[{"raw_affiliation_string":"Logic Technology Development Quality and Reliability, Hillsboro, Oregon","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005213443","display_name":"Jihan Standfest","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jihan Standfest","raw_affiliation_strings":["Logic Technology Development Quality and Reliability, Hillsboro, Oregon"],"affiliations":[{"raw_affiliation_string":"Logic Technology Development Quality and Reliability, Hillsboro, Oregon","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058069344","display_name":"Inanc Meric","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Inanc Meric","raw_affiliation_strings":["Logic Technology Development Quality and Reliability, Hillsboro, Oregon"],"affiliations":[{"raw_affiliation_string":"Logic Technology Development Quality and Reliability, Hillsboro, Oregon","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018467728","display_name":"Amirhossein H. Davoody","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Amirhossein H. Davoody","raw_affiliation_strings":["Logic Technology Development Quality and Reliability, Hillsboro, Oregon"],"affiliations":[{"raw_affiliation_string":"Logic Technology Development Quality and Reliability, Hillsboro, Oregon","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047514572","display_name":"Swaroop Kumar Namalapuri","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Swaroop Kumar Namalapuri","raw_affiliation_strings":["Logic Technology Development Quality and Reliability, Hillsboro, Oregon"],"affiliations":[{"raw_affiliation_string":"Logic Technology Development Quality and Reliability, Hillsboro, Oregon","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082686470","display_name":"T. Mutyala","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"T. Mutyala","raw_affiliation_strings":["Logic Technology Development Quality and Reliability, Hillsboro, Oregon"],"affiliations":[{"raw_affiliation_string":"Logic Technology Development Quality and Reliability, Hillsboro, Oregon","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025428048","display_name":"P. Supriya","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Supriya P.","raw_affiliation_strings":["Logic Technology Development Quality and Reliability, Hillsboro, Oregon"],"affiliations":[{"raw_affiliation_string":"Logic Technology Development Quality and Reliability, Hillsboro, Oregon","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082638823","display_name":"B. Gill","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Balkaran Gill","raw_affiliation_strings":["Logic Technology Development Quality and Reliability, Hillsboro, Oregon"],"affiliations":[{"raw_affiliation_string":"Logic Technology Development Quality and Reliability, Hillsboro, Oregon","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027832758","display_name":"S. Ramey","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Stephen Ramey","raw_affiliation_strings":["Logic Technology Development Quality and Reliability, Hillsboro, Oregon"],"affiliations":[{"raw_affiliation_string":"Logic Technology Development Quality and Reliability, Hillsboro, Oregon","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057484221","display_name":"Jeffery Hicks","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jeffery Hicks","raw_affiliation_strings":["Logic Technology Development Quality and Reliability, Hillsboro, Oregon"],"affiliations":[{"raw_affiliation_string":"Logic Technology Development Quality and Reliability, Hillsboro, Oregon","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5083178950"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3082,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.56203222,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/nmos-logic","display_name":"NMOS logic","score":0.8135311603546143},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6959683895111084},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.63099205493927},{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.6162635087966919},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.592003583908081},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5093134641647339},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.5078209042549133},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5039710402488708},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.45785367488861084},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2909308969974518},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.2132425606250763},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20947062969207764},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11433479189872742},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07740151882171631}],"concepts":[{"id":"https://openalex.org/C197162436","wikidata":"https://www.wikidata.org/wiki/Q83908","display_name":"NMOS logic","level":4,"score":0.8135311603546143},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6959683895111084},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.63099205493927},{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.6162635087966919},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.592003583908081},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5093134641647339},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.5078209042549133},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5039710402488708},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.45785367488861084},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2909308969974518},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.2132425606250763},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20947062969207764},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11433479189872742},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07740151882171631},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps45951.2020.9128347","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9128347","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1488749315","https://openalex.org/W1965229716","https://openalex.org/W2014390999","https://openalex.org/W2086601322","https://openalex.org/W2127904821","https://openalex.org/W2519730952","https://openalex.org/W2620924984","https://openalex.org/W2668005700","https://openalex.org/W2786278916","https://openalex.org/W2800293960","https://openalex.org/W2800680767"],"related_works":["https://openalex.org/W4386261925","https://openalex.org/W2048420745","https://openalex.org/W2082944690","https://openalex.org/W2263373136","https://openalex.org/W1914349328","https://openalex.org/W2160067645","https://openalex.org/W2023334077","https://openalex.org/W2005494397","https://openalex.org/W2104885411","https://openalex.org/W2339836056"],"abstract_inverted_index":{"Circuit":[0],"reliability":[1],"is":[2],"a":[3,110,124,132],"significant":[4],"concern":[5],"in":[6,80],"scaled":[7],"technologies.":[8],"Physical":[9],"aging":[10,88,113,121,142],"models":[11],"derived":[12],"by":[13,29],"DC":[14,66],"stress":[15],"on":[16],"discrete":[17,100],"devices":[18],"are":[19],"accurate":[20],"to":[21,51,58,82,103,139],"an":[22],"extent,":[23],"but":[24],"can":[25,118],"be":[26],"further":[27,69],"improved":[28],"evaluating":[30],"the":[31,62,120,141],"behaviour":[32],"of":[33,54,61,65,94,109,123,131],"simple":[34],"circuits":[35,73],"such":[36],"as":[37],"ring":[38],"oscillators":[39],"(RO).":[40],"In":[41],"this":[42,95],"work,":[43],"we":[44],"establish":[45],"correlation":[46],"between":[47,85],"individual":[48],"device":[49,87,101,126],"degradation":[50,102],"circuit's":[52],"figure":[53],"merit":[55],"(frequency":[56],"degradation)":[57],"refine":[59],"understanding":[60],"predictive":[63],"ability":[64],"models.":[67],"We":[68],"present":[70],"novel":[71,111],"re-configurable":[72,134],"that":[74,136],"enables":[75],"different":[76],"waveform":[77],"scenarios":[78],"seen":[79],"design":[81],"bridge":[83],"gaps":[84],"DC-stressed":[86],"and":[89,128],"complex":[90],"circuits.":[91],"Unique":[92],"features":[93],"work":[96],"include:":[97],"(1)":[98],"Correlating":[99],"circuit":[104,115,135],"performance":[105],"degradation,":[106],"(2)":[107],"development":[108,130],"PMOS/NMOS":[112],"isolator":[114],"(PNI)":[116],"which":[117],"isolate":[119],"contribution":[122,143],"single":[125],"type,":[127],"(3)":[129],"state-of-art":[133],"modulate":[137],"waveforms":[138],"customize":[140],"from":[144],"any":[145],"particular":[146],"physical":[147],"mechanism":[148],"(NBTI,":[149],"PBTI,":[150],"N-HCI":[151],"or":[152],"P-HCI).":[153]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}