{"id":"https://openalex.org/W3039211648","doi":"https://doi.org/10.1109/irps45951.2020.9128339","title":"Aging Challenges in On-chip Voltage Regulator Design","display_name":"Aging Challenges in On-chip Voltage Regulator Design","publication_year":2020,"publication_date":"2020-04-01","ids":{"openalex":"https://openalex.org/W3039211648","doi":"https://doi.org/10.1109/irps45951.2020.9128339","mag":"3039211648"},"language":"en","primary_location":{"id":"doi:10.1109/irps45951.2020.9128339","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9128339","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009406984","display_name":"Venkata Chaitanya Krishna Chekuri","orcid":"https://orcid.org/0000-0002-3175-3350"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Venkata Chaitanya Krishna Chekuri","raw_affiliation_strings":["School of Electronics and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079752672","display_name":"Arvind Singh","orcid":"https://orcid.org/0000-0001-5238-7196"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Arvind Singh","raw_affiliation_strings":["School of Electronics and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083457390","display_name":"Nael Mizanur Rahman","orcid":"https://orcid.org/0000-0002-3556-838X"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nael Mizanur Rahman","raw_affiliation_strings":["School of Electronics and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100670402","display_name":"Edward Lee","orcid":"https://orcid.org/0000-0002-5708-2866"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Edward Lee","raw_affiliation_strings":["School of Electronics and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103714530","display_name":"Saibal Mukhopadhyay","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Saibal Mukhopadhyay","raw_affiliation_strings":["School of Electronics and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronics and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/low-dropout-regulator","display_name":"Low-dropout regulator","score":0.8197818994522095},{"id":"https://openalex.org/keywords/voltage-regulator","display_name":"Voltage regulator","score":0.7173985242843628},{"id":"https://openalex.org/keywords/dropout-voltage","display_name":"Dropout voltage","score":0.7040067315101624},{"id":"https://openalex.org/keywords/regulator","display_name":"Regulator","score":0.7017739415168762},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6826545000076294},{"id":"https://openalex.org/keywords/negative-bias-temperature-instability","display_name":"Negative-bias temperature instability","score":0.6651482582092285},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5745775103569031},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5721294283866882},{"id":"https://openalex.org/keywords/dropout","display_name":"Dropout (neural networks)","score":0.5112080574035645},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.4995436668395996},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4951077997684479},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4664314091205597},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4571085572242737},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.45686835050582886},{"id":"https://openalex.org/keywords/transient-voltage-suppressor","display_name":"Transient voltage suppressor","score":0.44852888584136963},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.4330369234085083},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.36348140239715576},{"id":"https://openalex.org/keywords/threshold-voltage","display_name":"Threshold voltage","score":0.35192030668258667},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3491050601005554},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33780574798583984},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3210276961326599},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.10045748949050903}],"concepts":[{"id":"https://openalex.org/C140501009","wikidata":"https://www.wikidata.org/wiki/Q6692746","display_name":"Low-dropout regulator","level":5,"score":0.8197818994522095},{"id":"https://openalex.org/C110706871","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Voltage regulator","level":3,"score":0.7173985242843628},{"id":"https://openalex.org/C15032970","wikidata":"https://www.wikidata.org/wiki/Q851210","display_name":"Dropout voltage","level":4,"score":0.7040067315101624},{"id":"https://openalex.org/C6929976","wikidata":"https://www.wikidata.org/wiki/Q3771881","display_name":"Regulator","level":3,"score":0.7017739415168762},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6826545000076294},{"id":"https://openalex.org/C557185","wikidata":"https://www.wikidata.org/wiki/Q6987194","display_name":"Negative-bias temperature instability","level":5,"score":0.6651482582092285},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5745775103569031},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5721294283866882},{"id":"https://openalex.org/C2776145597","wikidata":"https://www.wikidata.org/wiki/Q25339462","display_name":"Dropout (neural networks)","level":2,"score":0.5112080574035645},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.4995436668395996},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4951077997684479},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4664314091205597},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4571085572242737},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.45686835050582886},{"id":"https://openalex.org/C14915586","wikidata":"https://www.wikidata.org/wiki/Q1653998","display_name":"Transient voltage suppressor","level":3,"score":0.44852888584136963},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.4330369234085083},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.36348140239715576},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.35192030668258667},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3491050601005554},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33780574798583984},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3210276961326599},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.10045748949050903},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps45951.2020.9128339","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps45951.2020.9128339","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2020 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4399999976158142,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1971466600","https://openalex.org/W1978760319","https://openalex.org/W1989642995","https://openalex.org/W1990884219","https://openalex.org/W1991891926","https://openalex.org/W2012669236","https://openalex.org/W2102913295","https://openalex.org/W2110283673","https://openalex.org/W2122757690","https://openalex.org/W2146410479","https://openalex.org/W2344336685","https://openalex.org/W2519730952","https://openalex.org/W2591632264","https://openalex.org/W2591678100","https://openalex.org/W2593999461","https://openalex.org/W2625793319","https://openalex.org/W2798272635","https://openalex.org/W2798590908","https://openalex.org/W2946609454","https://openalex.org/W2946742597","https://openalex.org/W2964322141","https://openalex.org/W3018614597","https://openalex.org/W6763063543"],"related_works":["https://openalex.org/W1982997428","https://openalex.org/W2044172536","https://openalex.org/W2371498377","https://openalex.org/W2370995213","https://openalex.org/W3185987145","https://openalex.org/W4366165321","https://openalex.org/W3081405802","https://openalex.org/W4287514677","https://openalex.org/W2017190659","https://openalex.org/W2527109428"],"abstract_inverted_index":{"This":[0],"paper":[1],"analyzes":[2],"degradation":[3],"of":[4,7,33],"transient":[5,34],"performance":[6],"on-chip":[8],"voltage":[9,22],"regulators,":[10],"namely,":[11],"a":[12,61],"digital":[13],"low":[14],"dropout":[15],"regulator":[16,23],"(DLDO)":[17],"and":[18,52],"an":[19,58,87],"integrated":[20],"inductive":[21],"(IVR),":[24],"due":[25],"to":[26,64,69],"negative-bias-temperature-instability":[27],"(NBTI)":[28],"induced":[29,84],"aging":[30,67,83],"degradations.":[31],"Improvement":[32],"response":[35,80],"for":[36,82],"the":[37,72],"aged":[38],"systems":[39],"using":[40,86],"post":[41],"silicon":[42],"tuning":[43],"is":[44],"also":[45],"explored.":[46],"The":[47],"measurement":[48,73],"results":[49,74],"from":[50],"130nm":[51],"65nm":[53],"CMOS":[54],"test-chips":[55],"demonstrate":[56],"that":[57],"IVR":[59],"exhibits":[60],"higher":[62],"tolerance":[63],"power":[65],"stage":[66],"compared":[68],"DLDO.":[70],"Furthermore,":[71],"indicate":[75],"upto":[76],"25%":[77],"improvement":[78],"in":[79],"time":[81],"degradations":[85],"auto-tuning":[88],"algorithm.":[89]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}