{"id":"https://openalex.org/W2944948871","doi":"https://doi.org/10.1109/irps.2019.8720596","title":"Wafer-Scale TaO<sub>x</sub> Device Variability and Implications for Neuromorphic Computing Applications","display_name":"Wafer-Scale TaO<sub>x</sub> Device Variability and Implications for Neuromorphic Computing Applications","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2944948871","doi":"https://doi.org/10.1109/irps.2019.8720596","mag":"2944948871"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2019.8720596","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720596","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.osti.gov/servlets/purl/1639197","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5088323080","display_name":"Christopher H. Bennett","orcid":"https://orcid.org/0000-0002-6989-292X"},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Christopher H. Bennett","raw_affiliation_strings":["Sandia National Laboratories, Albuquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I4210104735"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028114880","display_name":"Diana R. Garland","orcid":"https://orcid.org/0000-0001-7742-6796"},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Diana Garland","raw_affiliation_strings":["Sandia National Laboratories, Albuquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I4210104735"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056067427","display_name":"Robin Jacobs-Gedrim","orcid":"https://orcid.org/0000-0002-6614-984X"},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Robin B. Jacobs-Gedrim","raw_affiliation_strings":["Sandia National Laboratories, Albuquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I4210104735"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001046383","display_name":"Sapan Agarwal","orcid":"https://orcid.org/0000-0002-3676-6986"},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sapan Agarwal","raw_affiliation_strings":["Sandia National Laboratories, Albuquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I4210104735"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017426058","display_name":"Matthew Marinella","orcid":"https://orcid.org/0000-0002-6537-1836"},"institutions":[{"id":"https://openalex.org/I4210104735","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I198811213","https://openalex.org/I4210104735"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew J. Marinella","raw_affiliation_strings":["Sandia National Laboratories, Albuquerque, NM, USA"],"affiliations":[{"raw_affiliation_string":"Sandia National Laboratories, Albuquerque, NM, USA","institution_ids":["https://openalex.org/I4210104735"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5088323080"],"corresponding_institution_ids":["https://openalex.org/I4210104735"],"apc_list":null,"apc_paid":null,"fwci":0.8441,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.73779872,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12611","display_name":"Neural Networks and Reservoir Computing","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/neuromorphic-engineering","display_name":"Neuromorphic engineering","score":0.9570326805114746},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6466038227081299},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6312201023101807},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.6190779805183411},{"id":"https://openalex.org/keywords/scale","display_name":"Scale (ratio)","score":0.4956742525100708},{"id":"https://openalex.org/keywords/resistive-touchscreen","display_name":"Resistive touchscreen","score":0.4955509901046753},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.4939914345741272},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.481523334980011},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.45806342363357544},{"id":"https://openalex.org/keywords/wafer","display_name":"Wafer","score":0.449182391166687},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.39590075612068176},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.36125385761260986},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.32845455408096313},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.24915668368339539},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20027679204940796},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1740136444568634},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10171672701835632}],"concepts":[{"id":"https://openalex.org/C151927369","wikidata":"https://www.wikidata.org/wiki/Q1981312","display_name":"Neuromorphic engineering","level":3,"score":0.9570326805114746},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6466038227081299},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6312201023101807},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.6190779805183411},{"id":"https://openalex.org/C2778755073","wikidata":"https://www.wikidata.org/wiki/Q10858537","display_name":"Scale (ratio)","level":2,"score":0.4956742525100708},{"id":"https://openalex.org/C6899612","wikidata":"https://www.wikidata.org/wiki/Q852911","display_name":"Resistive touchscreen","level":2,"score":0.4955509901046753},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.4939914345741272},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.481523334980011},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.45806342363357544},{"id":"https://openalex.org/C160671074","wikidata":"https://www.wikidata.org/wiki/Q267131","display_name":"Wafer","level":2,"score":0.449182391166687},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.39590075612068176},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.36125385761260986},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.32845455408096313},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.24915668368339539},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20027679204940796},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1740136444568634},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10171672701835632},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/irps.2019.8720596","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720596","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:osti.gov:1639197","is_oa":true,"landing_page_url":"https://www.osti.gov/servlets/purl/1639197","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},{"id":"pmh:oai:osti.gov:1639621","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1639621","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"pmh:oai:osti.gov:1639197","is_oa":true,"landing_page_url":"https://www.osti.gov/servlets/purl/1639197","pdf_url":null,"source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"},{"id":"https://openalex.org/F4320332369","display_name":"National Nuclear Security Administration","ror":"https://ror.org/03sk1we31"},{"id":"https://openalex.org/F4320338291","display_name":"Sandia National Laboratories","ror":"https://ror.org/01apwpt12"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1619514554","https://openalex.org/W1981301644","https://openalex.org/W2036899386","https://openalex.org/W2049930603","https://openalex.org/W2056507634","https://openalex.org/W2194117691","https://openalex.org/W2515601391","https://openalex.org/W2554279936","https://openalex.org/W2560615381","https://openalex.org/W2583367948","https://openalex.org/W2740220207","https://openalex.org/W2782046614","https://openalex.org/W2807750997","https://openalex.org/W3104147253","https://openalex.org/W3120740533","https://openalex.org/W6662996049","https://openalex.org/W6730393660"],"related_works":["https://openalex.org/W4386475142","https://openalex.org/W2793181810","https://openalex.org/W2891417865","https://openalex.org/W1967489488","https://openalex.org/W2806638311","https://openalex.org/W2785635065","https://openalex.org/W2893723691","https://openalex.org/W2517651798","https://openalex.org/W4395453639","https://openalex.org/W2616523079"],"abstract_inverted_index":{"Scaling":[0],"arrays":[1],"of":[2,17,28,42,67,74],"non-volatile":[3],"memory":[4,36],"devices":[5],"from":[6],"academic":[7],"demonstrations":[8],"to":[9,54],"reliable,":[10],"manufacturable":[11],"systems":[12],"requires":[13],"a":[14,43,60],"better":[15],"understanding":[16],"variability":[18,41],"at":[19],"array":[20],"and":[21,63],"wafer-scale":[22],"levels.":[23],"CrossSim":[24],"models":[25],"the":[26,39,65,72],"accuracy":[27],"neural":[29],"networks":[30],"implemented":[31],"on":[32],"an":[33],"analog":[34],"resistive":[35],"accelerator":[37],"using":[38],"cycle-to-cycle":[40],"single":[44],"device.":[45],"In":[46],"this":[47,51,68],"work,":[48],"we":[49],"extend":[50],"modeling":[52],"tool":[53],"account":[55],"for":[56],"device-to-device":[57],"variation":[58],"in":[59,71],"realistic":[61],"way,":[62],"evaluate":[64],"impact":[66],"reliability":[69],"issue":[70],"context":[73],"neuromorphic":[75],"online":[76],"learning":[77],"tasks.":[78]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}