{"id":"https://openalex.org/W2946341064","doi":"https://doi.org/10.1109/irps.2019.8720582","title":"A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices","display_name":"A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2946341064","doi":"https://doi.org/10.1109/irps.2019.8720582","mag":"2946341064"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2019.8720582","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720582","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023689055","display_name":"G. Pedreira","orcid":"https://orcid.org/0000-0002-7792-6501"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":true,"raw_author_name":"G. Pedreira","raw_affiliation_strings":["Electronic Engineering Department, Universitat Autonoma de Barcelona (UAB), Spain"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department, Universitat Autonoma de Barcelona (UAB), Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004487540","display_name":"J. Mart\u00edn-Mart\u00ednez","orcid":"https://orcid.org/0000-0001-5938-5898"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. Martin-Martinez","raw_affiliation_strings":["Electronic Engineering Department, Universitat Autonoma de Barcelona (UAB), Spain"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department, Universitat Autonoma de Barcelona (UAB), Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056827862","display_name":"J. Diaz-Fortuny","orcid":"https://orcid.org/0000-0002-8186-071X"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"J. Diaz-Fortuny","raw_affiliation_strings":["Electronic Engineering Department, Universitat Autonoma de Barcelona (UAB), Spain"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department, Universitat Autonoma de Barcelona (UAB), Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035904954","display_name":"P. Saraz\u00e1-Canflanca","orcid":"https://orcid.org/0000-0003-2155-8305"},"institutions":[{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]},{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"P. Saraza-Canflanca","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM, CSIC and Universidad de Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM, CSIC and Universidad de Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058670975","display_name":"R. Rodr\u0131\u0301guez","orcid":"https://orcid.org/0000-0002-4565-6703"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"R. Rodriguez","raw_affiliation_strings":["Electronic Engineering Department, Universitat Autonoma de Barcelona (UAB), Spain"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department, Universitat Autonoma de Barcelona (UAB), Spain","institution_ids":["https://openalex.org/I123044942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068422347","display_name":"R. Castro\u2010L\u00f3pez","orcid":"https://orcid.org/0000-0002-6247-3124"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"R. Castro-Lopez","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM, CSIC and Universidad de Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM, CSIC and Universidad de Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011140420","display_name":"E. Roca","orcid":"https://orcid.org/0000-0001-6260-6495"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"E. Roca","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM, CSIC and Universidad de Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM, CSIC and Universidad de Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041853563","display_name":"F.V. Fern\u00e1ndez","orcid":"https://orcid.org/0000-0001-8682-2280"},"institutions":[{"id":"https://openalex.org/I4210104545","display_name":"Instituto de Microelectr\u00f3nica de Sevilla","ror":"https://ror.org/01mqtzm43","country_code":"ES","type":"facility","lineage":["https://openalex.org/I134820265","https://openalex.org/I4210104545","https://openalex.org/I4210147934","https://openalex.org/I79238269"]},{"id":"https://openalex.org/I79238269","display_name":"Universidad de Sevilla","ror":"https://ror.org/03yxnpp24","country_code":"ES","type":"education","lineage":["https://openalex.org/I79238269"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"F. V. Fernandez","raw_affiliation_strings":["Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM, CSIC and Universidad de Sevilla, Spain"],"affiliations":[{"raw_affiliation_string":"Instituto de Microelectr\u00f3nica de Sevilla, IMSE-CNM, CSIC and Universidad de Sevilla, Spain","institution_ids":["https://openalex.org/I4210104545","https://openalex.org/I79238269"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017592638","display_name":"M. Nafr\u0131\u0301a","orcid":"https://orcid.org/0000-0002-9549-2890"},"institutions":[{"id":"https://openalex.org/I123044942","display_name":"Universitat Aut\u00f2noma de Barcelona","ror":"https://ror.org/052g8jq94","country_code":"ES","type":"education","lineage":["https://openalex.org/I123044942"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"M. Nafria","raw_affiliation_strings":["Electronic Engineering Department, Universitat Autonoma de Barcelona (UAB), Spain"],"affiliations":[{"raw_affiliation_string":"Electronic Engineering Department, Universitat Autonoma de Barcelona (UAB), Spain","institution_ids":["https://openalex.org/I123044942"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5023689055"],"corresponding_institution_ids":["https://openalex.org/I123044942"],"apc_list":null,"apc_paid":null,"fwci":0.984,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.73208365,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pmos-logic","display_name":"PMOS logic","score":0.9143701791763306},{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.765934944152832},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7249965667724609},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5923007130622864},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5757138133049011},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5663729310035706},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.560808002948761},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5248154401779175},{"id":"https://openalex.org/keywords/semiconductor-device-modeling","display_name":"Semiconductor device modeling","score":0.44027185440063477},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.4174210727214813},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3823992908000946},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3625289797782898},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.22481092810630798},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22300240397453308},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1997750699520111},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.10028406977653503},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09066498279571533}],"concepts":[{"id":"https://openalex.org/C27050352","wikidata":"https://www.wikidata.org/wiki/Q173605","display_name":"PMOS logic","level":4,"score":0.9143701791763306},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.765934944152832},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7249965667724609},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5923007130622864},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5757138133049011},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5663729310035706},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.560808002948761},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5248154401779175},{"id":"https://openalex.org/C4775677","wikidata":"https://www.wikidata.org/wiki/Q7449393","display_name":"Semiconductor device modeling","level":3,"score":0.44027185440063477},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.4174210727214813},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3823992908000946},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3625289797782898},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.22481092810630798},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22300240397453308},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1997750699520111},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.10028406977653503},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09066498279571533},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/irps.2019.8720582","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720582","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},{"id":"pmh:oai:digital.csic.es:10261/354693","is_oa":false,"landing_page_url":"http://hdl.handle.net/10261/354693","pdf_url":null,"source":{"id":"https://openalex.org/S4306400616","display_name":"DIGITAL.CSIC (Spanish National Research Council (CSIC))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I134820265","host_organization_name":"Consejo Superior de Investigaciones Cient\u00edficas","host_organization_lineage":["https://openalex.org/I134820265"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference Paper"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6499999761581421}],"awards":[],"funders":[{"id":"https://openalex.org/F4320335322","display_name":"European Regional Development Fund","ror":"https://ror.org/00k4n6c32"},{"id":"https://openalex.org/F4320335598","display_name":"Agencia Estatal de Investigaci\u00f3n","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1979217496","https://openalex.org/W1988922865","https://openalex.org/W2001309624","https://openalex.org/W2003119618","https://openalex.org/W2025695811","https://openalex.org/W2036892459","https://openalex.org/W2039426183","https://openalex.org/W2141899849","https://openalex.org/W2163026485","https://openalex.org/W2163494715","https://openalex.org/W2289327135","https://openalex.org/W2608709362","https://openalex.org/W2904664224","https://openalex.org/W3149249597","https://openalex.org/W6640183753","https://openalex.org/W6647561237"],"related_works":["https://openalex.org/W2730314563","https://openalex.org/W2147978085","https://openalex.org/W1985584924","https://openalex.org/W2142481737","https://openalex.org/W2061181929","https://openalex.org/W3211653297","https://openalex.org/W1500216205","https://openalex.org/W2119950599","https://openalex.org/W2006886358","https://openalex.org/W2133389615"],"abstract_inverted_index":{"In":[0],"this":[1],"work":[2],"a":[3,13],"new":[4,45],"method":[5,21],"to":[6,24],"characterize":[7],"Random":[8],"Telegraph":[9],"Noise":[10],"(RTN)":[11],"in":[12,55],"large":[14],"number":[15],"of":[16,28,51,69],"devices":[17],"is":[18,22],"presented.":[19],"The":[20,38],"applied":[23],"the":[25,44,49,61,66],"RTN":[26],"characterization":[27,68],"nearly":[29],"800":[30],"pMOS":[31],"transistors":[32],"and":[33],"compared":[34],"with":[35],"conventional":[36],"approaches.":[37],"results":[39],"presented":[40],"here":[41],"show":[42],"that":[43],"method,":[46],"which":[47],"requires":[48],"measurement":[50,62],"each":[52],"device":[53],"only":[54],"two":[56],"instants,":[57],"can":[58],"hugely":[59],"reduce":[60],"time":[63],"needed":[64],"for":[65],"statistical":[67],"RTN.":[70]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2026-03-20T23:20:44.827607","created_date":"2025-10-10T00:00:00"}