{"id":"https://openalex.org/W2945556561","doi":"https://doi.org/10.1109/irps.2019.8720559","title":"Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects","display_name":"Variation-Aware Physics-Based Electromigration Modeling and Experimental Calibration for VLSI Interconnects","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2945556561","doi":"https://doi.org/10.1109/irps.2019.8720559","mag":"2945556561"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2019.8720559","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720559","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062615676","display_name":"Sarath Mohanachandran Nair","orcid":"https://orcid.org/0000-0003-1177-8291"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Sarath Mohanachandran Nair","raw_affiliation_strings":["Karlsruhe Institute of Technology, Germany"],"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013085797","display_name":"Raiendra Bishnoi","orcid":null},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Raiendra Bishnoi","raw_affiliation_strings":["Karlsruhe Institute of Technology, Germany"],"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064445713","display_name":"Mehdi B. Tahoori","orcid":"https://orcid.org/0000-0002-8829-5610"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Mehdi B. Tahoori","raw_affiliation_strings":["Karlsruhe Institute of Technology, Germany"],"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029225444","display_name":"Houman Zahedmanesh","orcid":"https://orcid.org/0000-0002-0290-691X"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Houman Zahedmanesh","raw_affiliation_strings":["Imec vzw, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080591280","display_name":"Kristof Croes","orcid":"https://orcid.org/0000-0002-3955-0638"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Kristof Croes","raw_affiliation_strings":["Imec vzw, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024595358","display_name":"K\u00e9vin Garello","orcid":"https://orcid.org/0000-0003-0236-322X"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Kevin Garello","raw_affiliation_strings":["Imec vzw, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080181961","display_name":"Gouri Sankar Kar","orcid":"https://orcid.org/0000-0003-3122-4237"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Gouri Sankar Kar","raw_affiliation_strings":["Imec vzw, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033235745","display_name":"Francky Catthoor","orcid":"https://orcid.org/0000-0002-3599-8515"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Francky Catthoor","raw_affiliation_strings":["Imec vzw, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec vzw, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5062615676"],"corresponding_institution_ids":["https://openalex.org/I102335020"],"apc_list":null,"apc_paid":null,"fwci":0.5176,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.58150969,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11661","display_name":"Copper Interconnects and Reliability","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9901999831199646,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10460","display_name":"Electronic Packaging and Soldering Technologies","score":0.9898999929428101,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electromigration","display_name":"Electromigration","score":0.9276495575904846},{"id":"https://openalex.org/keywords/physics-of-failure","display_name":"Physics of failure","score":0.7726199626922607},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7135138511657715},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.590450644493103},{"id":"https://openalex.org/keywords/dimension","display_name":"Dimension (graph theory)","score":0.48924827575683594},{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.4713078439235687},{"id":"https://openalex.org/keywords/copper-interconnect","display_name":"Copper interconnect","score":0.4708138406276703},{"id":"https://openalex.org/keywords/work","display_name":"Work (physics)","score":0.4210503101348877},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41923412680625916},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.38966992497444153},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3895120620727539},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2157609760761261},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10127860307693481},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.10119980573654175},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.08396780490875244}],"concepts":[{"id":"https://openalex.org/C138055206","wikidata":"https://www.wikidata.org/wiki/Q1319010","display_name":"Electromigration","level":2,"score":0.9276495575904846},{"id":"https://openalex.org/C2778306610","wikidata":"https://www.wikidata.org/wiki/Q7189696","display_name":"Physics of failure","level":4,"score":0.7726199626922607},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7135138511657715},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.590450644493103},{"id":"https://openalex.org/C33676613","wikidata":"https://www.wikidata.org/wiki/Q13415176","display_name":"Dimension (graph theory)","level":2,"score":0.48924827575683594},{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.4713078439235687},{"id":"https://openalex.org/C116372231","wikidata":"https://www.wikidata.org/wiki/Q605757","display_name":"Copper interconnect","level":3,"score":0.4708138406276703},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.4210503101348877},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41923412680625916},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.38966992497444153},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3895120620727539},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2157609760761261},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10127860307693481},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.10119980573654175},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.08396780490875244},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.0},{"id":"https://openalex.org/C202444582","wikidata":"https://www.wikidata.org/wiki/Q837863","display_name":"Pure mathematics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2019.8720559","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720559","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320332550","display_name":"University of California, Riverside","ror":"https://ror.org/03nawhv43"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1981346182","https://openalex.org/W2007719944","https://openalex.org/W2077036969","https://openalex.org/W2081786181","https://openalex.org/W2101096828","https://openalex.org/W2129336955","https://openalex.org/W2130830634","https://openalex.org/W2150608324","https://openalex.org/W2162131248","https://openalex.org/W2513391298","https://openalex.org/W2523695793","https://openalex.org/W2766879491","https://openalex.org/W2886599283","https://openalex.org/W6679222915","https://openalex.org/W6727376110"],"related_works":["https://openalex.org/W2012458971","https://openalex.org/W2347521939","https://openalex.org/W1515275251","https://openalex.org/W2000692624","https://openalex.org/W2891709080","https://openalex.org/W2937898963","https://openalex.org/W2104898937","https://openalex.org/W2367688955","https://openalex.org/W2031683742","https://openalex.org/W2137441628"],"abstract_inverted_index":{"Electromigration":[0],"(EM)":[1],"has":[2],"emerged":[3],"as":[4,54],"a":[5,65],"major":[6],"reliability":[7],"concern":[8],"for":[9,106],"interconnects":[10],"in":[11,43,48,57,96,120],"advanced":[12],"technology":[13],"nodes.":[14],"The":[15],"existing":[16,37],"EM":[17,50,67],"models":[18,38],"are":[19],"mostly":[20],"either":[21],"based":[22,28],"on":[23,29],"empirical":[24],"formulation":[25],"or":[26],"calibrated":[27],"simulations":[30],"using":[31,69],"finite":[32],"element":[33],"analysis.":[34],"Moreover,":[35],"the":[36,49,83,87,118,121],"do":[39],"not":[40],"consider":[41],"variations":[42,47,95,119],"material":[44,90,107],"parameters":[45,91],"causing":[46],"induced":[51],"failure":[52,71,97,122],"times,":[53],"typically":[55],"observed":[56,94],"measurements.":[58],"In":[59],"this":[60],"work,":[61],"we":[62],"first":[63],"calibrate":[64],"physics-based":[66],"model":[68,84,115],"measured":[70],"times":[72,123],"of":[73,89],"damascene":[74],"copper":[75],"at":[76,124],"accelerated":[77],"test":[78],"conditions.":[79,127],"We":[80],"then":[81],"extend":[82],"to":[85,93,114],"obtain":[86],"distribution":[88],"leading":[92],"times.":[98],"This":[99],"model,":[100],"being":[101,112],"physics-based,":[102],"can":[103],"be":[104],"used":[105],"and":[108,116],"dimension":[109],"exploration":[110],"while":[111],"able":[113],"predict":[117],"various":[125],"operating":[126]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3}],"updated_date":"2026-03-28T08:17:26.163206","created_date":"2025-10-10T00:00:00"}