{"id":"https://openalex.org/W2945692151","doi":"https://doi.org/10.1109/irps.2019.8720541","title":"Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling","display_name":"Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling","publication_year":2019,"publication_date":"2019-03-01","ids":{"openalex":"https://openalex.org/W2945692151","doi":"https://doi.org/10.1109/irps.2019.8720541","mag":"2945692151"},"language":"en","primary_location":{"id":"doi:10.1109/irps.2019.8720541","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720541","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028152513","display_name":"Zhicheng Wu","orcid":"https://orcid.org/0000-0002-0745-9012"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Zhicheng Wu","raw_affiliation_strings":["Imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068577719","display_name":"J. Franco","orcid":"https://orcid.org/0000-0002-7382-8605"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jacopo Franco","raw_affiliation_strings":["Imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027576852","display_name":"D. Claes","orcid":"https://orcid.org/0000-0002-0356-0973"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Dieter Claes","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008613051","display_name":"G. Rzepa","orcid":"https://orcid.org/0000-0002-3711-1957"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Gerhard Rzepa","raw_affiliation_strings":["T.U. Vienna, Institute for microelectronics, Austria"],"affiliations":[{"raw_affiliation_string":"T.U. Vienna, Institute for microelectronics, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069720453","display_name":"Philippe Roussel","orcid":"https://orcid.org/0000-0002-0402-8225"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Philippe J. Roussel","raw_affiliation_strings":["Imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046242688","display_name":"Nadine Collaert","orcid":"https://orcid.org/0000-0002-8062-3165"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Nadine Collaert","raw_affiliation_strings":["Imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020367935","display_name":"G. Groeseneken","orcid":"https://orcid.org/0000-0003-3763-2098"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Guido Groeseneken","raw_affiliation_strings":["ESAT-MICAS, KU Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"ESAT-MICAS, KU Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103956206","display_name":"Dimitri Linten","orcid":null},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Dimitri Linten","raw_affiliation_strings":["Imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062594496","display_name":"Tibor Grasser","orcid":"https://orcid.org/0000-0001-6536-2238"},"institutions":[{"id":"https://openalex.org/I145847075","display_name":"TU Wien","ror":"https://ror.org/04d836q62","country_code":"AT","type":"education","lineage":["https://openalex.org/I145847075"]}],"countries":["AT"],"is_corresponding":false,"raw_author_name":"Tibor Grasser","raw_affiliation_strings":["T.U. Vienna, Institute for microelectronics, Austria"],"affiliations":[{"raw_affiliation_string":"T.U. Vienna, Institute for microelectronics, Austria","institution_ids":["https://openalex.org/I145847075"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058263075","display_name":"B. Kaczer","orcid":"https://orcid.org/0000-0002-1484-4007"},"institutions":[{"id":"https://openalex.org/I4210114974","display_name":"IMEC","ror":"https://ror.org/02kcbn207","country_code":"BE","type":"nonprofit","lineage":["https://openalex.org/I4210114974"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ben Kaczer","raw_affiliation_strings":["Imec, Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Imec, Leuven, Belgium","institution_ids":["https://openalex.org/I4210114974"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":10,"corresponding_author_ids":["https://openalex.org/A5028152513"],"corresponding_institution_ids":["https://openalex.org/I4210114974"],"apc_list":null,"apc_paid":null,"fwci":0.2385,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.53517663,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":93,"max":95},"biblio":{"volume":"449","issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/characterization","display_name":"Characterization (materials science)","score":0.5791138410568237},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4492354989051819},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4003016948699951},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3516884446144104},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1653672754764557},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.1172839105129242}],"concepts":[{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.5791138410568237},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4492354989051819},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4003016948699951},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3516884446144104},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1653672754764557},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.1172839105129242}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/irps.2019.8720541","is_oa":false,"landing_page_url":"https://doi.org/10.1109/irps.2019.8720541","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Reliability Physics Symposium (IRPS)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.5699999928474426,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1986415905","https://openalex.org/W1990785435","https://openalex.org/W1997733082","https://openalex.org/W2019004317","https://openalex.org/W2074734019","https://openalex.org/W2079603154","https://openalex.org/W2086126257","https://openalex.org/W2122520074","https://openalex.org/W2125298814","https://openalex.org/W2157180100","https://openalex.org/W2773913008","https://openalex.org/W2781768675","https://openalex.org/W2802502993","https://openalex.org/W2912961936","https://openalex.org/W2948759523","https://openalex.org/W6672141146","https://openalex.org/W6763430447"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W3107994849","https://openalex.org/W4246450666","https://openalex.org/W4388998267","https://openalex.org/W2898370298","https://openalex.org/W2137437058","https://openalex.org/W4390401159","https://openalex.org/W2744391499","https://openalex.org/W2800070131"],"abstract_inverted_index":{"A":[0],"new":[1,64,110],"gate":[2,49],"pattern":[3,50,65,111],"is":[4,66,79,93],"proposed":[5],"to":[6,60,81],"minimize":[7],"test":[8],"time":[9],"while":[10],"maximizing":[11],"charge":[12],"capture":[13],"and":[14,21,46,74,78,88,112],"emission":[15],"into/from":[16],"oxide":[17],"defects":[18],"for":[19,55],"efficient":[20],"accurate":[22],"BTI":[23,31,56],"modeling.":[24],"In":[25],"conjunction":[26],"with":[27,69,108,119],"the":[28,37,43,70,101,105,109],"imec/T.U.":[29],"Vienna":[30],"simulation":[32],"framework":[33],"\u201cComphy\u201d,":[34],"which":[35],"encapsulates":[36],"microscopic":[38],"behavior":[39],"of":[40,104,115],"individual":[41],"defects,":[42],"Accelerated":[44],"Capture":[45],"Emission":[47],"(ACE)":[48],"streamlines":[51],"a":[52],"bottom-up":[53],"approach":[54],"evaluation":[57],"from":[58],"device":[59],"circuit":[61],"level.":[62],"The":[63,91],"systematically":[67],"compared":[68],"well-established":[71],"Constant-Voltage-Stress":[72],"(CVS)":[73],"Ramped-Voltage-Stress":[75],"(RVS)":[76],"methods":[77],"found":[80],"show":[82],"substantial":[83],"improvements":[84],"regarding":[85],"both":[86],"characterization":[87],"model-calibration":[89],"efficiencies.":[90],"flow":[92],"further":[94],"validated":[95],"by":[96],"showing":[97],"good":[98],"agreement":[99],"between":[100],"direct":[102],"projections":[103],"model":[106],"calibrated":[107],"experimental":[113],"results":[114],"AC":[116],"stress":[117],"tests":[118],"various":[120],"duty":[121],"factors.":[122]},"counts_by_year":[{"year":2021,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}